scholarly journals Structural and Magnetic Depth Profile Analysis of L10 FeNi Film by Polarized Neutron Reflectometry

2015 ◽  
Author(s):  
Tetsuro Ueno ◽  
Kotaro Saito ◽  
Nobuhito Inami ◽  
Takayuki Kojima ◽  
Masaki Mizuguchi ◽  
...  
Keyword(s):  
Depth Profile ◽  
Profile Analysis ◽  
Neutron Reflectometry ◽  
Depth Profile Analysis ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry

Magnetic Order of Co0.1Pt0.9 in Proximity of CoPt3

1998 ◽  
Vol 517 ◽  
Author(s):  
A.L. Shapiro ◽  
F. Hellman ◽  
M.R. Fitzsimmons
Keyword(s):  
Depth Profile ◽  
Magnetic Order ◽  
Neutron Reflectometry ◽  
Bilayer Film ◽  
Ferromagnetic Order ◽  
Magnetization Density ◽  
Close Proximity ◽  
Polarized Neutron ◽  
The Moment ◽  
Polarized Neutron Reflectometry

AbstractA polarized neutron reflectometry study of the magnetization density depth profile of a Co0.1Pt0.9-CoPt3 bilayer film found evidence for an induced moment in the Co0.1Pt0.9 overlayer in close proximity to the CoPt3 underlayer. If the moment of Co in these films is that of the bulk, then the μpt = 0.09(1)μB in the overlayer, and μpt = 0.04(1)μB, in the underlayer. In addition, ferromagnetic order of the Co0.1Pt0.9 overlayer was observed 8K above Tc for the material in the bulk.

Measurement of magnetic-field depth profile in superconducting niobium film by polarized neutron reflectometry

1992 ◽  
Author(s):  
Daniel A. Korneev ◽  
L. P. Chernenko ◽  
A. V. Petrenko ◽  
N. I. Balalykin ◽  
A. V. Skripnik
Keyword(s):  
Magnetic Field ◽  
Depth Profile ◽  
Neutron Reflectometry ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry

Sputter depth profile analysis of marker layers

1990 ◽  
Vol 15 (8) ◽  
pp. 463-465 ◽  
Author(s):  
J. A. Peinador ◽  
I. Abril ◽  
J. J. Jiménez-Rodríguez ◽  
A. Gras-Marti
Keyword(s):  
Depth Profile ◽  
Profile Analysis ◽  
Depth Profile Analysis

(Anti-)ferromagnetic coupling in Fe/Si multilayers from polarized neutron reflectometry

1997 ◽  
Vol 234-236 ◽  
pp. 498-499
Author(s):  
H. Fredrikze ◽  
A. van der Graaf ◽  
M. Valkier ◽  
J. Kohlhepp ◽  
F.J.A. den Broeder
Keyword(s):  
Neutron Reflectometry ◽  
Ferromagnetic Coupling ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry

Measurements of magnetic screening lengths in superconducting Nb thin films by polarized neutron reflectometry

1995 ◽  
Vol 52 (14) ◽  
pp. 10395-10404 ◽  
Author(s):  
Huai Zhang ◽  
J. W. Lynn ◽  
C. F. Majkrzak ◽  
S. K. Satija ◽  
J. H. Kang ◽  
...  
Keyword(s):  
Thin Films ◽  
Neutron Reflectometry ◽  
Magnetic Screening ◽  
Polarized Neutron ◽  
Polarized Neutron Reflectometry

Depth profile analysis of solar cell silicon by GD-MS

2014 ◽  
Vol 29 (11) ◽  
pp. 2072-2077 ◽  
Author(s):  
M. Di Sabatino ◽  
C. Modanese ◽  
L. Arnberg
Keyword(s):  
Solar Cell ◽  
Depth Profile ◽  
Profile Analysis ◽  
Depth Resolution ◽  
Impurity Distribution ◽  
Concentration Profiles ◽  
Good Sensitivity ◽  
Transition Elements ◽  
Depth Profile Analysis

Comparison of SIMS (top) and GD-MS (bottom) analyses on sample R6-2b (implanted B). dc HR-GD-MS can be used for depth profile analysis of impurities in PV Si with good sensitivity and a depth resolution of 0.5 μm. Concentration profiles of samples contaminated with B, P and Ti agreed well with implanted levels. For fast diffusing transition elements, e.g. Fe and Cu, different impurity distribution mechanisms occur. This should be taken into account when analysing these impurities.

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