Total dose dependence of hot carrier injection effect in the n-channel metal oxide semiconductor devices

He Yu-Juan;  Zhang Xiao-Wen;  Liu Yuan

doi:10.7498/aps.65.246101

Total dose dependence of hot carrier injection effect in the n-channel metal oxide semiconductor devices

Acta Physica Sinica ◽

10.7498/aps.65.246101 ◽

2016 ◽

Vol 65 (24) ◽

pp. 246101

Author(s):

He Yu-Juan ◽

Zhang Xiao-Wen ◽

Liu Yuan

Keyword(s):

Metal Oxide ◽

Total Dose ◽

Semiconductor Devices ◽

Dose Dependence ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Injection Effect

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Total dose dependence of hot carrier injection effect in the NMOS devices

2014 IEEE International Conference on Electron Devices and Solid-State Circuits ◽

10.1109/edssc.2014.7061213 ◽

2014 ◽

Author(s):

Yujuan He ◽

Xiaowen Zhang

Keyword(s):

Total Dose ◽

Dose Dependence ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection ◽

Injection Effect

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The Generation Process of Interface Traps by Hot-Carrier Injection in Nanoscale Metal–Oxide–Semiconductor Field-Effect Transistors

Japanese Journal of Applied Physics ◽

10.1143/jjap.51.02bc09 ◽

2012 ◽

Vol 51 (2) ◽

pp. 02BC09 ◽

Cited By ~ 2

Author(s):

Ming Hu ◽

Takuya Yamane ◽

Toshiaki Tsuchiya

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Generation Process ◽

Interface Traps ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Influence of ionizing radiation and hot carrier injection on metal-oxide-semiconductor transistors

Journal of Physics D Applied Physics ◽

10.1088/0022-3727/41/2/023001 ◽

2008 ◽

Vol 41 (2) ◽

pp. 023001 ◽

Cited By ~ 17

Author(s):

Goran S Ristic

Keyword(s):

Ionizing Radiation ◽

Metal Oxide ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Influence of Ionizing Radiation and Hot Carrier Injection on Metal-Oxide-Semiconductor Transistors

Current Topics in Ionizing Radiation Research ◽

10.5772/39263 ◽

2012 ◽

Cited By ~ 4

Author(s):

Momilo Pejovi ◽

Predrag Osmokrovi ◽

Milica Pejovi ◽

Koviljka Stankovi

Keyword(s):

Ionizing Radiation ◽

Metal Oxide ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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The Generation Process of Interface Traps by Hot-Carrier Injection in Nanoscale Metal–Oxide–Semiconductor Field-Effect Transistors

Japanese Journal of Applied Physics ◽

10.7567/jjap.51.02bc09 ◽

2012 ◽

Vol 51 (2S) ◽

pp. 02BC09 ◽

Cited By ~ 4

Author(s):

Ming Hu ◽

Takuya Yamane ◽

Toshiaki Tsuchiya

Keyword(s):

Metal Oxide ◽

Field Effect ◽

Field Effect Transistors ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Generation Process ◽

Interface Traps ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Mismatches after Hot-Carrier Injection in Advanced Complementary Metal–Oxide–Semiconductor Technology Particularly for Analog Applications

Japanese Journal of Applied Physics ◽

10.1143/jjap.45.3266 ◽

2006 ◽

Vol 45 (4B) ◽

pp. 3266-3271 ◽

Cited By ~ 3

Author(s):

Shuang-Yuan Chen ◽

Jung-Chun Lin ◽

Hung-Wen Chen ◽

Hung-Chuan Lin ◽

Ze-Wei Jhou ◽

...

Keyword(s):

Metal Oxide ◽

Complementary Metal Oxide Semiconductor ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Carrier Injection ◽

Semiconductor Technology ◽

Hot Carrier ◽

Hot Carrier Injection

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Spontaneous hot-carrier photon emission rates in silicon: Improved modeling and applications to metal oxide semiconductor devices

Physical Review B ◽

10.1103/physrevb.65.195209 ◽

2002 ◽

Vol 65 (19) ◽

Cited By ~ 9

Author(s):

M. Pavesi ◽

P. L. Rigolli ◽

M. Manfredi ◽

P. Palestri ◽

L. Selmi

Keyword(s):

Metal Oxide ◽

Semiconductor Devices ◽

Photon Emission ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Emission Rates ◽

Hot Carrier

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Channel Length and Time Dependent Interface Trap Generation near the Source Due to Hot-Carrier Injection in Metal–Oxide–Semiconductor Field-Effect Transistors

Japanese Journal of Applied Physics ◽

10.7567/jjap.51.074001 ◽

2012 ◽

Vol 51 (7R) ◽

pp. 074001

Author(s):

Ming Hu ◽

Toshiaki Tsuchiya

Keyword(s):

Field Effect ◽

Field Effect Transistors ◽

Channel Length ◽

Metal Oxide Semiconductor ◽

Time Dependent ◽

Oxide Semiconductor ◽

Interface Trap ◽

Carrier Injection ◽

Hot Carrier ◽

Hot Carrier Injection

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Metal–Oxide–Nitride–Oxide–Semiconductor Memory Device with One-Side Halo Implantation to Enable Low-Voltage Operation Using Hot-Carrier Injection

Japanese Journal of Applied Physics ◽

10.1143/jjap.44.6441 ◽

2005 ◽

Vol 44 (9A) ◽

pp. 6441-6445

Author(s):

Hideto Tomiye ◽

Kazumasa Nomoto ◽

Kazuhide Koyama ◽

Toshio Kobayashi

Keyword(s):

Metal Oxide ◽

Low Voltage ◽

Memory Device ◽

Oxide Semiconductor ◽

Carrier Injection ◽

Semiconductor Memory ◽

Hot Carrier ◽

Low Voltage Operation ◽

Hot Carrier Injection ◽

Nitride Oxide

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Hot‐carrier light emission from silicon metal‐oxide‐semiconductor devices

Applied Physics Letters ◽

10.1063/1.100177 ◽

1988 ◽

Vol 53 (26) ◽

pp. 2620-2622 ◽

Cited By ~ 53

Author(s):

M. Herzog ◽

F. Koch

Keyword(s):

Metal Oxide ◽

Light Emission ◽

Semiconductor Devices ◽

Metal Oxide Semiconductor ◽

Oxide Semiconductor ◽

Hot Carrier

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