scholarly journals Effects of nuclear reactions between protons and metal interconnect overlayers on single event effects of micro/nano scaled static random access memory

2015 ◽  
Vol 64 (17) ◽  
pp. 178501
Author(s):  
Zhao Wen ◽  
Guo Xiao-Qiang ◽  
Chen Wei ◽  
Qiu Meng-Tong ◽  
Luo Yin-Hong ◽  
...  
Keyword(s):  
Nuclear Reactions ◽  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Single Event Effects

scholarly journals Single-Event Effects in the Peripheral Circuitry of a Commercial Ferroelectric Random Access Memory

2018 ◽  
Vol 65 (8) ◽  
pp. 1708-1714 ◽  
Author(s):  
A. L. Bosser ◽  
V. Gupta ◽  
A. Javanainen ◽  
G. Tsiligiannis ◽  
S. D. LaLumondiere ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Single Event ◽  
Access Memory ◽  
Single Event Effects ◽  
Ferroelectric Random Access Memory

scholarly journals Comparison of neutron induced single event upsets in 14 nm FinFET and 65 nm planar static random access memory devices

2020 ◽  
Vol 69 (5) ◽  
pp. 056101
Author(s):  
Zhan-Gang Zhang ◽  
Zhi-Feng Lei ◽  
Teng Tong ◽  
Xiao-Hui Li ◽  
Song-Lin Wang ◽  
...  
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Static Random Access Memory ◽  
Memory Devices ◽  
Single Event ◽  
Access Memory ◽  
Single Event Upsets

SINGLE EVENT EFFECTS IN AVIONICS AND ON THE GROUND

2004 ◽  
Vol 14 (02) ◽  
pp. 285-298 ◽  
Author(s):  
EUGENE NORMAND
Keyword(s):  
Fault Tolerant ◽  
Random Access ◽  
Random Access Memory ◽  
Ground Level ◽  
Alpha Particles ◽  
Packaging Materials ◽  
Single Event ◽  
Access Memory ◽  
Single Event Effects ◽  
Negligible Contribution

Single event effects in electronics caused by the atmospheric neutrons have been an issue for systems using large blocks of random access memory (RAM) in avionics applications as well as those on the ground. At ground level there are two main sources of single event effects, alpha particles from the packaging materials as well as the neutrons, but at aircraft altitudes, where the neutron flux is about 300 times higher than the ground, the alpha particles make a negligible contribution. We review the trends over the last 5-10 years in the response of COTS computer systems to single event effects, taking into the response of devices as well as fault tolerant measures incorporated into the systems.

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