scholarly journals Dependence of the DC stress negative bias temperature instability effect on basic device parameters in pMOSFET

2012 ◽  
Vol 61 (21) ◽  
pp. 217305
Author(s):  
Cao Jian-Min ◽  
He Wei ◽  
Huang Si-Wen ◽  
Zhang Xu-Lin
Keyword(s):  
Negative Bias ◽  
Negative Bias Temperature Instability ◽  
Temperature Instability ◽  
Bias Temperature Instability ◽  
Instability Effect ◽  
Dc Stress

scholarly journals Investigation of Negative Bias Temperature Instability Effect in Partially Depleted SOI pMOSFET

IEEE Access ◽  
2020 ◽  
Vol 8 ◽  
pp. 99037-99046
Author(s):  
Chao Peng ◽  
Zhifeng Lei ◽  
Rui Gao ◽  
Zhangang Zhang ◽  
Yiqiang Chen ◽  
...  
Keyword(s):  
Negative Bias ◽  
Negative Bias Temperature Instability ◽  
Temperature Instability ◽  
Bias Temperature Instability ◽  
Instability Effect
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