scholarly journals Resonant transmission of the terahertz pulse through a subwavelength metallic slit

2008 ◽  
Vol 57 (5) ◽  
pp. 3198
Author(s):  
Meng Kuo ◽  
Wang Yan-Hua ◽  
Chen Long-Wang ◽  
Zhang Yan
2005 ◽  
Vol 7 ◽  
pp. 250-250 ◽  
Author(s):  
J R Suckling ◽  
A P Hibbins ◽  
J R Sambles ◽  
C R Lawrence

2020 ◽  
Vol 10 (2) ◽  
pp. 660
Author(s):  
Jong-Eon Park ◽  
Hosung Choo ◽  
Young-Ki Cho

This article investigates resonant transmission phenomena through a single metallic subwavelength slit when the permittivity of a real metal varies. The single metallic slit is utilized as a metal–insulator–metal waveguide, and a mode-matching technique is employed to obtain the transmitted power. The periodic resonant transmission phenomena (in terms of the metallic plate thickness) are solved, and the resonances can be understood by their guide wavelengths. Even when the permittivity of the real metal includes imaginary parts (i.e., metal with loss), the resonant transmittances are obtained. However, the peaks of the transmittances decrease, as the plate thickness increases. The orthogonal relationship of an incomplete orthogonal set is maintained despite metallic loss (given a relatively small amount of loss), due to the complex permittivity of the real metal.


2005 ◽  
Vol 22 (7) ◽  
pp. 1784-1786 ◽  
Author(s):  
Liu Cheng ◽  
Yan Chang-Chun ◽  
Liu Ying ◽  
Chen Hao

Author(s):  
Lihong Cao ◽  
Manasa Venkata ◽  
Meng Yeow Tay ◽  
Wen Qiu ◽  
J. Alton ◽  
...  

Abstract Electro-optical terahertz pulse reflectometry (EOTPR) was introduced last year to isolate faults in advanced IC packages. The EOTPR system provides 10μm accuracy that can be used to non-destructively localize a package-level failure. In this paper, an EOTPR system is used for non-destructive fault isolation and identification for both 2D and 2.5D with TSV structure of flip-chip packages. The experimental results demonstrate higher accuracy of the EOTPR system in determining the distance to defect compared to the traditional time-domain reflectometry (TDR) systems.


2015 ◽  
Vol 23 (13) ◽  
pp. 17560 ◽  
Author(s):  
Yousef I. Salamin ◽  
Jian-Xing Li ◽  
Benjamin J. Galow ◽  
Christoph H. Keitel

1990 ◽  
Vol 57 (25) ◽  
pp. 2675-2677 ◽  
Author(s):  
E. T. Yu ◽  
D. A. Collins ◽  
D. Z.‐Y. Ting ◽  
D. H. Chow ◽  
T. C. McGill

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