scholarly journals Development of NIST Standard Reference Material 2082, a Pathlength Standard for Measurements in the Ultraviolet Spectrum

Author(s):  
Brian Lang ◽  
Aaron Urbas ◽  
Paul DeRose ◽  
Hung-Kung Liu ◽  
John Travis ◽  
...  

New spectrophotometers and cuvettes have been designed to allow the measurement of absorbance values from samples using microliter volume sizes. These measurements are done using short pathlengths to decrease the sample volumes required. The major applications for these spectrophotometers and cuvettes are samples that are difficult to obtain in large amounts, such as proteins and nucleic acids that absorb light in the ultraviolet range. Existing ultraviolet absorbance standards have been designed for longer pathlength measurements. Standard Reference Material (SRM) 2082 was developed to validate the pathlengths of short-pathlength cuvettes and instruments using materials with absorbance spectra that are similar to the most commonly used samples. SRM 2082 consists of three individual components: a blank buffer solution, a solution of the amino acid tryptophan in the buffer, and a solution of the nucleobase uracil in the buffer. The tryptophan solution has an absorbance spectrum (peak at 280 nm) similar to proteins, and the uracil has an absorbance spectrum (peak at 260 nm) similar to nucleic acids. The absorbance values of these solutions were determined using a series of cuvettes with pathlengths from 0.1 mm to 2 mm. The pathlengths of the cuvettes used for the absorbance measurements were determined at the National Institute of Standards and Technology by physical and optical measurements. The effects of temperature and spectral bandwidth variations on the absorbance values of SRM 2082 were also investigated.

2009 ◽  
Vol 394 (4) ◽  
pp. 1183-1192 ◽  
Author(s):  
Margaret C. Kline ◽  
David L. Duewer ◽  
John C. Travis ◽  
Melody V. Smith ◽  
Janette W. Redman ◽  
...  

2017 ◽  
Vol 50 (2) ◽  
pp. 462-474 ◽  
Author(s):  
Andrew J. Allen ◽  
Fan Zhang ◽  
R. Joseph Kline ◽  
William F. Guthrie ◽  
Jan Ilavsky

The certification of a new standard reference material for small-angle scattering [NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering (SAXS)], based on glassy carbon, is presented. Creation of this SRM relies on the intrinsic primary calibration capabilities of the ultra-small-angle X-ray scattering technique. This article describes how the intensity calibration has been achieved and validated in the certifiedQrange,Q= 0.008–0.25 Å−1, together with the purpose, use and availability of the SRM. The intensity calibration afforded by this robust and stable SRM should be applicable universally to all SAXS instruments that employ a transmission measurement geometry, working with a wide range of X-ray energies or wavelengths. The validation of the SRM SAXS intensity calibration using small-angle neutron scattering (SANS) is discussed, together with the prospects for including SANS in a future renewal certification.


2021 ◽  
Author(s):  
Seshi R. Sompuram ◽  
Emina E. Torlakovic ◽  
Nils A. ‘t Hart ◽  
Kodela Vani ◽  
Steven A. Bogen

2014 ◽  
Vol 84 ◽  
pp. 332-338 ◽  
Author(s):  
Donatella Pomata ◽  
Patrizia Di Filippo ◽  
Carmela Riccardi ◽  
Francesca Buiarelli ◽  
Valentina Gallo

2007 ◽  
Vol 40 (2) ◽  
pp. 232-240 ◽  
Author(s):  
C. T. Chantler ◽  
N. A. Rae ◽  
C. Q. Tran

X-ray powder diffraction and synchrotron radiation have been used to determine the lattice parameter of the NIST standard reference material (SRM 660) LaB6as 4.156468 Å with an accuracy of 12 parts per million (p.p.m.), calibrated relative to the lattice parameter of the Si powder standard [a0= 5.430940 (11) Å, Si 640b]. A discrepancy of 0.00048 (5) Å, or nine standard deviations from the NIST reference, is observed between the currently accepted lattice spacing of LaB6and the measured value. Twelve different measurements of the lattice parameter were made at beam energies between 10 and 20 keV. The observed discrepancy in the lattice parameter is consistent for the different energies used. The absolute values of the mean difference between the measured and calculated 2θ centroids, \overline{\left| \delta 2 \theta \right|}, are highly consistent, between 0.0002 and 0.0004° for energies from 5 to 14 keV, and between 0.0005 and 0.0008° for energies from 15 to 20 keV. In order to determine the peak positions with high precision, account must be taken of the observed peak asymmetry. It is shown that significant asymmetry is due to peak broadening and must be taken into account in order to determine accurate peak locations and lattice spacings. The approach shows significant advantages over conventional analysis. The analysis of peak broadening is compared with models used in Rietveld analysis.


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