A NIST Standard Reference Material (SRM) to Support the Detection of Trace Explosives

2009 ◽  
Vol 81 (17) ◽  
pp. 7189-7196 ◽  
Author(s):  
William A. MacCrehan
Keyword(s):  
Reference Material ◽  
Standard Reference Material ◽  
Nist Standard Reference Material ◽  
Trace Explosives

Production and certification of NIST Standard Reference Material 2372 Human DNA Quantitation Standard

2009 ◽  
Vol 394 (4) ◽  
pp. 1183-1192 ◽  
Author(s):  
Margaret C. Kline ◽  
David L. Duewer ◽  
John C. Travis ◽  
Melody V. Smith ◽  
Janette W. Redman ◽  
...  
Keyword(s):  
Reference Material ◽  
Standard Reference Material ◽  
Dna Quantitation ◽  
Human Dna ◽  
Nist Standard Reference Material

scholarly journals NIST Standard Reference Material 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering

2017 ◽  
Vol 50 (2) ◽  
pp. 462-474 ◽  
Author(s):  
Andrew J. Allen ◽  
Fan Zhang ◽  
R. Joseph Kline ◽  
William F. Guthrie ◽  
Jan Ilavsky
Keyword(s):  
Reference Material ◽  
Small Angle ◽  
Standard Reference Material ◽  
Absolute Intensity ◽  
Calibration Standard ◽  
X Ray ◽  
X Ray Scattering ◽  
Nist Standard Reference Material ◽  
Intensity Calibration ◽  
Ray Scattering

The certification of a new standard reference material for small-angle scattering [NIST Standard Reference Material (SRM) 3600: Absolute Intensity Calibration Standard for Small-Angle X-ray Scattering (SAXS)], based on glassy carbon, is presented. Creation of this SRM relies on the intrinsic primary calibration capabilities of the ultra-small-angle X-ray scattering technique. This article describes how the intensity calibration has been achieved and validated in the certifiedQrange,Q= 0.008–0.25 Å−1, together with the purpose, use and availability of the SRM. The intensity calibration afforded by this robust and stable SRM should be applicable universally to all SAXS instruments that employ a transmission measurement geometry, working with a wide range of X-ray energies or wavelengths. The validation of the SRM SAXS intensity calibration using small-angle neutron scattering (SANS) is discussed, together with the prospects for including SANS in a future renewal certification.

scholarly journals Quantitative comparison of PD-L1 IHC assays against NIST standard reference material 1934

2021 ◽  
Author(s):  
Seshi R. Sompuram ◽  
Emina E. Torlakovic ◽  
Nils A. ‘t Hart ◽  
Kodela Vani ◽  
Steven A. Bogen
Keyword(s):  
Reference Material ◽  
Standard Reference Material ◽  
Quantitative Comparison ◽  
Nist Standard Reference Material

Determination of non-certified levoglucosan, sugar polyols and ergosterol in NIST Standard Reference Material 1649a

2014 ◽  
Vol 84 ◽  
pp. 332-338 ◽  
Author(s):  
Donatella Pomata ◽  
Patrizia Di Filippo ◽  
Carmela Riccardi ◽  
Francesca Buiarelli ◽  
Valentina Gallo
Keyword(s):  
Reference Material ◽  
Standard Reference Material ◽  
Nist Standard Reference Material

Accurate determination and correction of the lattice parameter of LaB6(standard reference material 660) relative to that of Si (640b)

2007 ◽  
Vol 40 (2) ◽  
pp. 232-240 ◽  
Author(s):  
C. T. Chantler ◽  
N. A. Rae ◽  
C. Q. Tran
Keyword(s):  
Reference Material ◽  
Standard Reference Material ◽  
Accurate Determination ◽  
Rietveld Analysis ◽  
Lattice Parameter ◽  
Conventional Analysis ◽  
Peak Broadening ◽  
Peak Asymmetry ◽  
Nist Standard Reference Material ◽  
The Mean

X-ray powder diffraction and synchrotron radiation have been used to determine the lattice parameter of the NIST standard reference material (SRM 660) LaB6as 4.156468 Å with an accuracy of 12 parts per million (p.p.m.), calibrated relative to the lattice parameter of the Si powder standard [a0= 5.430940 (11) Å, Si 640b]. A discrepancy of 0.00048 (5) Å, or nine standard deviations from the NIST reference, is observed between the currently accepted lattice spacing of LaB6and the measured value. Twelve different measurements of the lattice parameter were made at beam energies between 10 and 20 keV. The observed discrepancy in the lattice parameter is consistent for the different energies used. The absolute values of the mean difference between the measured and calculated 2θ centroids, \overline{\left| \delta 2 \theta \right|}, are highly consistent, between 0.0002 and 0.0004° for energies from 5 to 14 keV, and between 0.0005 and 0.0008° for energies from 15 to 20 keV. In order to determine the peak positions with high precision, account must be taken of the observed peak asymmetry. It is shown that significant asymmetry is due to peak broadening and must be taken into account in order to determine accurate peak locations and lattice spacings. The approach shows significant advantages over conventional analysis. The analysis of peak broadening is compared with models used in Rietveld analysis.

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