scholarly journals Letter to the Editor: New values for silicon reference materials, certified for isotope abundance ratios

1994 ◽  
Vol 99 (2) ◽  
pp. 201 ◽  
Author(s):  
P. De Bievre ◽  
S. Valkiers ◽  
H.S. Peiser
Keyword(s):  
Reference Materials ◽  
Isotope Abundance ◽  
Letter To The Editor

Silicon isotope abundance ratios and atomic weights of NBS-28 and other reference materials

2005 ◽  
Vol 69 (23) ◽  
pp. 5487-5494 ◽  
Author(s):  
T. Ding ◽  
D. Wan ◽  
R. Bai ◽  
Z. Zhang ◽  
Y. Shen ◽  
...  
Keyword(s):  
Reference Materials ◽  
Silicon Isotope ◽  
Isotope Abundance

Calibrated sulfur isotope abundance ratios of three IAEA sulfur isotope reference materials and V-CDT with a reassessment of the atomic weight of sulfur

2001 ◽  
Vol 65 (15) ◽  
pp. 2433-2437 ◽  
Author(s):  
T. Ding ◽  
S. Valkiers ◽  
H. Kipphardt ◽  
P. De Bièvre ◽  
P.D.P. Taylor ◽  
...  
Keyword(s):  
Reference Materials ◽  
Sulfur Isotope ◽  
Atomic Weight ◽  
Isotope Abundance

Layered and ion implantation specimens as possible reference materials for the electron-probe microanalysis

1992 ◽  
Vol 50 (2) ◽  
pp. 1652-1653
Author(s):  
G. Remond ◽  
R.H. Packwood ◽  
C. Gilles ◽  
S. Chryssoulis
Keyword(s):  
Ion Implantation ◽  
Reference Materials ◽  
Analytical Techniques ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
X Ray ◽  
Spatially Resolved ◽  
Analytical Expressions ◽  
Original Approach ◽  
Depth Concentration

Merits and limitations of layered and ion implanted specimens as possible reference materials to calibrate spatially resolved analytical techniques are discussed and illustrated for the case of gold analysis in minerals by means of x-ray spectrometry with the EPMA. To overcome the random heterogeneities of minerals, thin film deposition and ion implantation may offer an original approach to the manufacture of controlled concentration/ distribution reference materials for quantification of trace elements with the same matrix as the unknown.In order to evaluate the accuracy of data obtained by EPMA we have compared measured and calculated x-ray intensities for homogeneous and heterogeneous specimens. Au Lα and Au Mα x-ray intensities were recorded at various electron beam energies, and hence at various sampling depths, for gold coated and gold implanted specimens. X-ray intensity calculations are based on the use of analytical expressions for both the depth ionization Φ (ρz) and the depth concentration C (ρz) distributions respectively.

Letter to the Editor

1978 ◽  
Vol 9 (3) ◽  
pp. 197-200
Author(s):  
Peter B. Smith
Keyword(s):  
Letter To The Editor

Letter to the Editor

1994 ◽  
Vol 3 (1) ◽  
pp. 89-89
Author(s):  
Lawrence I. Shotland
Keyword(s):  
Letter To The Editor

Letter to the Editor

1994 ◽  
Vol 3 (1) ◽  
pp. 87-87
Author(s):  
David Cieliczka
Keyword(s):  
Letter To The Editor

Letter to the Editor

1994 ◽  
Vol 3 (1) ◽  
pp. 92-93
Author(s):  
Larry Engelmann
Keyword(s):  
Letter To The Editor

Letter to the Editor

1994 ◽  
Vol 3 (1) ◽  
pp. 92-92
Author(s):  
Gregory Frazer
Keyword(s):  
Letter To The Editor

Letter to the Editor

1994 ◽  
Vol 3 (1) ◽  
pp. 92-92
Author(s):  
Edwin L. Harless
Keyword(s):  
Letter To The Editor
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