Letter to the editor

S. Valkiers; P. Debievre; G. Lenaers; H.S. Peiser

doi:10.6028/jres.096.038

Letter to the editor - Silicon reference materials certified for isotope abundances

Journal of Research of the National Institute of Standards and Technology ◽

10.6028/jres.096.038 ◽

1991 ◽

Vol 96 (5) ◽

pp. 617 ◽

Cited By ~ 2

Author(s):

S. Valkiers ◽

P. Debievre ◽

G. Lenaers ◽

H.S. Peiser

Keyword(s):

Reference Materials ◽

Letter To The Editor

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Letter to the Editor: New values for silicon reference materials, certified for isotope abundance ratios

Journal of Research of the National Institute of Standards and Technology ◽

10.6028/jres.099.016 ◽

1994 ◽

Vol 99 (2) ◽

pp. 201 ◽

Cited By ~ 8

Author(s):

P. De Bievre ◽

S. Valkiers ◽

H.S. Peiser

Keyword(s):

Reference Materials ◽

Isotope Abundance ◽

Letter To The Editor

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Layered and ion implantation specimens as possible reference materials for the electron-probe microanalysis

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100132893 ◽

1992 ◽

Vol 50 (2) ◽

pp. 1652-1653

Author(s):

G. Remond ◽

R.H. Packwood ◽

C. Gilles ◽

S. Chryssoulis

Keyword(s):

Ion Implantation ◽

Reference Materials ◽

Analytical Techniques ◽

Thin Film Deposition ◽

Film Deposition ◽

X Ray ◽

Spatially Resolved ◽

Analytical Expressions ◽

Original Approach ◽

Depth Concentration

Merits and limitations of layered and ion implanted specimens as possible reference materials to calibrate spatially resolved analytical techniques are discussed and illustrated for the case of gold analysis in minerals by means of x-ray spectrometry with the EPMA. To overcome the random heterogeneities of minerals, thin film deposition and ion implantation may offer an original approach to the manufacture of controlled concentration/ distribution reference materials for quantification of trace elements with the same matrix as the unknown.In order to evaluate the accuracy of data obtained by EPMA we have compared measured and calculated x-ray intensities for homogeneous and heterogeneous specimens. Au Lα and Au Mα x-ray intensities were recorded at various electron beam energies, and hence at various sampling depths, for gold coated and gold implanted specimens. X-ray intensity calculations are based on the use of analytical expressions for both the depth ionization Φ (ρz) and the depth concentration C (ρz) distributions respectively.

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