scholarly journals Nanoscale Cell Surface Topography Imaging using Scanning Ion Conductance Microscopy

2014 ◽  
Vol 82 (5) ◽  
pp. 331-334 ◽  
Author(s):  
Yasufumi TAKAHASHI ◽  
Komachi ITO ◽  
Xiongwei WANG ◽  
Yoshiharu MATSUMAE ◽  
Hirokazu KOMAKI ◽  
...  
Keyword(s):  
Cell Surface ◽  
Surface Topography ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy

scholarly journals Nano-Scale Topography Imaging of Live Cell Surface Using Scanning Ion Conductance Microscopy

Hyomen Kagaku ◽  
2015 ◽  
Vol 36 (6) ◽  
pp. 313-318 ◽  
Author(s):  
Hiroki IDA ◽  
Yasufumi TAKAHASHI ◽  
Hitoshi SHIKU ◽  
Tomokazu MATSUE
Keyword(s):  
Cell Surface ◽  
Live Cell ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy ◽  
Nano Scale

scholarly journals Time-Resolved Scanning Ion Conductance Microscopy for Three-Dimensional Tracking of Nanoscale Cell Surface Dynamics

ACS Nano ◽  
2021 ◽  
Author(s):  
Samuel M. Leitao ◽  
Barney Drake ◽  
Katarina Pinjusic ◽  
Xavier Pierrat ◽  
Vytautas Navikas ◽  
...  
Keyword(s):  
Cell Surface ◽  
Three Dimensional ◽  
Surface Dynamics ◽  
Ion Conductance ◽  
Time Resolved ◽  
Scanning Ion Conductance Microscopy

Recent developments in scanning ion conductance microscopy

1995 ◽  
Vol 53 ◽  
pp. 202-203
Author(s):  
Roger Proksch ◽  
Ratnesh Lai ◽  
Paul K. Hansma
Keyword(s):  
Magnetic Field ◽  
Surface Topography ◽  
Small Diameter ◽  
Scanning Probe ◽  
Schematic Diagram ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy ◽  
Atomic Force ◽  
Recent Developments ◽  
Conductance Probe

Scanning probe microscopes sensitive to two or more localized physical or chemical interactions are finding increased application in science and technology. These microscopes usually measure surface topography and another property such as electric field, magnetic field or optical propeties such as fluorescence. These simultaneously imaged properties can be correlated to provide a multimodal perspective of the sample. In order to measure ion transport through membranes and surface topography, we have developed a combination Scanning Ion Conductance Microscope (SICM) and Atomic Force Microscope (ARM). A schematic diagram of this microscope is shown in Figure 1. The SICM/AFM uses a flexible micropipette which has been pulled to a very small diameter (c.a. 50-100 nm). The end of the pipette is bent at 90° and a small gold covered piece of mica is glued to the top of the bend allowing it to function as a cantilever for AFM. The pipette is filled with an electrolyte and an Ag/AgCl electrode is inserted, allowing it to serve as a conductance probe.

scholarly journals Cell stiffness and ROS level alterations in living neurons mediated by β-amyloid oligomers measured by scanning ion-conductance microscopy.

2021 ◽  
Vol 27 (S1) ◽  
pp. 500-502
Author(s):  
Oleg Suchalko ◽  
Roman Timoshenko ◽  
Alexander Vaneev ◽  
Vasilii Kolmogorov ◽  
Nikita Savin ◽  
...  
Keyword(s):  
Cell Stiffness ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy ◽  
Amyloid Oligomers ◽  
Β Amyloid ◽  
Living Neurons

scholarly journals Nanoscale Cell Membrane Fluctuations Measured by Scanning Ion Conductance Microscopy

2013 ◽  
Vol 104 (2) ◽  
pp. 317a
Author(s):  
Yusuke Mizutani ◽  
Zen Ishikura ◽  
Myung-Hoon Choi ◽  
Sang-Joon Cho ◽  
Takaharu Okajima
Keyword(s):  
Cell Membrane ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy ◽  
Membrane Fluctuations
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