Scanning ion conductance microscopy for visualizing the three-dimensional surface topography of cells and tissues

2018 ◽  
Vol 73 ◽  
pp. 125-131 ◽  
Author(s):  
Masato Nakajima ◽  
Yusuke Mizutani ◽  
Futoshi Iwata ◽  
Tatsuo Ushiki
Keyword(s):  
Surface Topography ◽  
Three Dimensional ◽  
Ion Conductance ◽  
Scanning Ion Conductance Microscopy ◽  
Dimensional Surface

Three-dimensional surface topography segmentation through clustering

Wear ◽  
2007 ◽  
Vol 262 (3-4) ◽  
pp. 395-410 ◽  
Author(s):  
N. Senin ◽  
M. Ziliotti ◽  
R. Groppetti
Keyword(s):  
Surface Topography ◽  
Three Dimensional ◽  
Dimensional Surface

An investigation of influence of cutting parameters on three-dimensional surface topography in micromilling SiCp/Al composites

2020 ◽  
pp. 095440542097109
Author(s):  
Junwei Liu ◽  
Kai Cheng ◽  
Hui Ding ◽  
Shijin Chen
Keyword(s):  
Surface Topography ◽  
Orthogonal Experiment ◽  
Three Dimensional ◽  
Cutting Parameters ◽  
Micro Milling ◽  
Influence Of Process Parameters ◽  
Good Surface ◽  
Weak Negative Correlation ◽  
Single Factor Experiment ◽  
Dimensional Surface

Surface topography is an important characteristic of the surface integrity, and influences the performance and mechanical properties of the workpiece to a great extent in micro milling SiCp/Al composites. It is evaluated by three-dimensional surface roughness ( Sq) and fractal dimension ( Ds) in this paper. Based on the single factor experiment and the orthogonal experiment, the influence of process parameters (feed per tooth, spindle speed, milling depth, and milling width) on surface topography is studied. The results show that Sq is mainly affected by milling width and milling depth and optimal results for minimum Sq are: ae = 1.5 mm, ap = 0.08 mm, n = 12000 r/min, and fz=1 μm/z. While Ds is mainly affected by milling width and optimal parameters for maximum Ds are: ae=1 mm, n = 14000 r/min, fz = 1.5 μm/z and ap = 0.12 mm. There is a weak negative correlation between Sq and Ds. In addition, Ds is more sensitive to the main defects and in general a large Ds corresponds to a good surface.

Multistack Close Range Photogrammetry for Low Cost Submillimeter Metrology

2013 ◽  
Vol 13 (4) ◽  
Author(s):  
L. M. Galantucci ◽  
F. Lavecchia ◽  
G. Percoco
Keyword(s):  
Surface Topography ◽  
Research Effort ◽  
Low Cost ◽  
Three Dimensional ◽  
Robotic Systems ◽  
Image Composition ◽  
Close Range Photogrammetry ◽  
Considerable Research ◽  
Close Range ◽  
Dimensional Surface

Considerable research effort has been focused on evaluating the accuracy of meso- and macroscale digital close range photogrammetry. However, evaluations of accuracy and applications in the submillimeter scale are rare. In this paper the authors propose the development of a three-dimensional (3D) photogrammetric scanner, based on macrolens cameras, able to reconstruct the three-dimensional surface topography of objects with submillimeter features. The system exploits multifocal image composition and has been designed for installation on all types of Numerical Controlled or Robotic systems. The approach is exploitable for digitizing submillimeter features at mesoscale as well as macroscale objects.

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