scholarly journals Low‐Frequency Noise and Resistance as Reliability Indicators of Mechanically and Electrically Strained Thick‐Film Resistors

2017 ◽  
Author(s):  
Zdravko Stanimirović
Keyword(s):  
Thick Film ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Reliability Indicators

Measurements of low-frequency noise in thick film resistors

1971 ◽  
Vol 8 (3) ◽  
pp. 193-197 ◽  
Author(s):  
R.J. Hawkins ◽  
G.G. Bloodworth
Keyword(s):  
Thick Film ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

Low-frequency noise in thick-film structures caused by traps in glass barriers

1998 ◽  
Vol 38 (10) ◽  
pp. 1569-1576 ◽  
Author(s):  
I. Mrak ◽  
M.M. Jevtić ◽  
Z. Stanimirović
Keyword(s):  
Thick Film ◽  
Low Frequency ◽  
Frequency Noise ◽  
Low Frequency Noise

scholarly journals Virtual instruments in low-frequency noise spectroscopy experiments

2015 ◽  
Vol 28 (1) ◽  
pp. 17-28
Author(s):  
Adam Stadler ◽  
Andrzej Dziedzic
Keyword(s):  
Thick Film ◽  
Virtual Instrument ◽  
Low Frequency ◽  
Low Noise ◽  
Frequency Noise ◽  
Low Frequency Noise ◽  
Noise Sources ◽  
Noise Component ◽  
Noise Spectroscopy ◽  
Noise Map

Low-frequency noise spectroscopy (LFNS) is an experimental technique to study noise spectra, typically below 10 kHz, as a function of temperature. Results of LFNS may be presented as the ?so-called? noise maps, giving a detailed insight into fluctuating phenomena in electronic devices and materials. The authors show the usefulness of virtual instrument concept in developing and controlling the measurement setup for LFNS experiments. An example of a noise map obtained for polymer thick-film resistors (PTFRs), made of commercial compositions, for temperature range 77 K - 300 K has been shown. The experiments proved that 1/f noise caused by resistance fluctuations is the dominant noise component in the studied samples. However, the obtained noise map revealed also thermally activated noise sources. Furthermore, parameters describing noise properties of resistive materials and components have been introduced and calculated using data from LFNS. The results of the work may be useful for comparison of noise properties of different resistive materials, giving also directions for improvement of thick-film technology in order to manufacture reliable, low-noise and stable PTFRs.

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