scholarly journals Investigation of Elevated Temperature Effects on Multiple Layer Piezoelectric Ultrasonic Transducers with Adhesive Bondlines by Self-Heating

Author(s):  
Zhengbin Wu ◽  
Sandy Cochran ◽  
Bo Wu
Author(s):  
Jeffrey L. Walters

Wide ranging viscosities in ultrasonic flow measurement for liquids is a common pipeline scenario. With ever maturing oil fields and the growth in oilsands production, the trend appears to be towards the higher end viscosities and/or novel approaches towards reducing the viscosities for transportation such as heating. The variable viscosities of the fluids provide some unique challenges to ultrasonic flowmeters not only in terms of flow profile modeling, but also in acoustic signal propagation and application to elevated temperature fluids which likewise affect the accuracy or performance of the measurement. The flow profile interrogation techniques will be discussed with an emphasis on a distributed chord model together with the use of a waveguide technology that minimizes acoustic and fluid temperature effects. A combination of R&D, calibration and field testing data will both demonstrate these challenges as well as show the increased performance that results from the application of these approaches.


2019 ◽  
Vol 168 ◽  
pp. 291-301 ◽  
Author(s):  
Shamsad Ahmad ◽  
Mehboob Rasul ◽  
Saheed Kolawole Adekunle ◽  
Salah U. Al-Dulaijan ◽  
Mohammed Maslehuddin ◽  
...  

Author(s):  
Ivo Vogt ◽  
Christian Boit ◽  
Tomonori Nakamura ◽  
Babak Motamedi

Abstract This paper provides a detailed analysis on the optical detection of temperature effects in FinFETs via (spectral) photon emission microscopy (SPEM/PEM) with InGaAs detector and electro-optical frequency mapping (EOFM, similar to LVI) for 14/16 nm Qualcomm Inc. FinFETs. It analyzes physical parameters of the FinFETs such as electron temperature and the relation between signal curve and operating condition of the device by photon emission slopes and spectra. The paper also traces device self-heating effects within the FinFETs by means of EOFM signal courses. With EOFM it was possible to detect self-heating effects of the FinFETs providing a further method to estimate device and substrate heating. Results showed that it is possible to obtain valuable device parameter information (for example, electron temperatures and self-heating) via optical investigations (PEM/ EOFM), which are not accessible electrically in modern integrated circuits. This information adds further details to device reliability and functionality approximations.


2010 ◽  
Vol 5 (4) ◽  
pp. 609-618 ◽  
Author(s):  
T. Luangwilai ◽  
H. S. Sidhu ◽  
M. I. Nelson ◽  
X. D. Chen

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