scholarly journals A Thru-Only De-Embedding Method Foron-Wafer Characterization of Multiport Networks

10.5772/8422 ◽  
2010 ◽  
Author(s):  
Shuhei Amakawa ◽  
Noboru Ishihara ◽  
Kazuya Masu
Keyword(s):  
Embedding Method

De-Embedding Method Using an Electromagnetic Simulator for Characterization of Transistors in the Millimeter-Wave Band

2010 ◽  
Vol 58 (10) ◽  
pp. 2663-2672 ◽  
Author(s):  
Takuichi Hirano ◽  
Hiroshi Nakano ◽  
Yasutake Hirachi ◽  
Jiro Hirokawa ◽  
Makoto Ando
Keyword(s):  
Millimeter Wave ◽  
Wave Band ◽  
Embedding Method ◽  
Millimeter Wave Band

A New 12-Term Open–Short–Load De-Embedding Method for Accurate On-Wafer Characterization of RF MOSFET Structures

2010 ◽  
Vol 58 (2) ◽  
pp. 419-433 ◽  
Author(s):  
L.F. Tiemeijer ◽  
R.M.T. Pijper ◽  
J.A. van Steenwijk ◽  
E. van der Heijden
Keyword(s):  
Embedding Method

A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs

2005 ◽  
Vol 53 (9) ◽  
pp. 2926-2934 ◽  
Author(s):  
Ming-Hsiang Cho ◽  
Guo-Wei Huang ◽  
Lin-Kun Wu ◽  
Chia-Sung Chiu ◽  
Yueh-Hua Wang ◽  
...  
Keyword(s):  
Embedding Method ◽  
Deep Submicrometer

CHARACTERIZATION OF CHAOTIC ATTRACTORS IN EXTENDED SYSTEMS

1996 ◽  
Vol 06 (07) ◽  
pp. 1375-1382 ◽  
Author(s):  
CHIEN-CHONG CHEN ◽  
CHYI HWANG ◽  
EDUARDO E. WOLF ◽  
HSUEH-CHIA CHANG
Keyword(s):  
Chaotic Dynamics ◽  
Complex Dynamics ◽  
Chaotic Behavior ◽  
Chaotic Attractors ◽  
Extended System ◽  
Embedding Method ◽  
Spatial Point ◽  
Spatially Distributed ◽  
Spatially Extended

It is shown that the traditional delayed embedding method, which is often applied to measurements at a single spatial point, could only account for partial chaotic dynamics of an extended system. To catch the whole dynamics of an extended system, we apply in this letter the Karhunen-Loeve (K-L) procedure to construct a series of tangent maps from spatially distributed measurements. The tangent maps obtained are then used for computing certain ergodic invariants. The procedure is illustrated with the experimental data obtained from a catalytic wafer, which is a spatially extended system exhibiting complex dynamics. The computed results show clearly that the K-L procedure is more suitable than the delayed embedding method for deciphering the full chaotic behavior of an extended system.

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