Comments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs"

T. Kaija; P. Heino

doi:10.1109/tmtt.2006.869701

Comments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs"

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2006.869701 ◽

2006 ◽

Vol 54 (3) ◽

pp. 1295-1296 ◽

Cited By ~ 2

Author(s):

T. Kaija ◽

P. Heino

Keyword(s):

Embedding Method ◽

Deep Submicrometer

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A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2005.854245 ◽

2005 ◽

Vol 53 (9) ◽

pp. 2926-2934 ◽

Cited By ~ 22

Author(s):

Ming-Hsiang Cho ◽

Guo-Wei Huang ◽

Lin-Kun Wu ◽

Chia-Sung Chiu ◽

Yueh-Hua Wang ◽

...

Keyword(s):

Embedding Method ◽

Deep Submicrometer

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Author's reply [to comments on "A shield-based three-port de-embedding method for microwave on-wafer characterization of deep-submicrometer silicon MOSFETs"

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2006.869699 ◽

2006 ◽

Vol 54 (3) ◽

pp. 1296-1297

Author(s):

Ming-Hsiang Cho

Keyword(s):

Embedding Method ◽

Deep Submicrometer

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A Thru-Only De-Embedding Method Foron-Wafer Characterization of Multiport Networks

Advanced Microwave Circuits and Systems ◽

10.5772/8422 ◽

2010 ◽

Cited By ~ 5

Author(s):

Shuhei Amakawa ◽

Noboru Ishihara ◽

Kazuya Masu

Keyword(s):

Embedding Method

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Novel de-embedding method with Look-Up Table for characterization of interconnects

2015 IEEE 24th Electrical Performance of Electronic Packaging and Systems (EPEPS) ◽

10.1109/epeps.2015.7347135 ◽

2015 ◽

Author(s):

Shaowu Huang ◽

Beomtaek Lee

Keyword(s):

Embedding Method ◽

Look Up Table

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De-Embedding Method Using an Electromagnetic Simulator for Characterization of Transistors in the Millimeter-Wave Band

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2010.2065330 ◽

2010 ◽

Vol 58 (10) ◽

pp. 2663-2672 ◽

Cited By ~ 7

Author(s):

Takuichi Hirano ◽

Hiroshi Nakano ◽

Yasutake Hirachi ◽

Jiro Hirokawa ◽

Makoto Ando

Keyword(s):

Millimeter Wave ◽

Wave Band ◽

Embedding Method ◽

Millimeter Wave Band

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Characterization of on-wafer RF passive components for RFIC devices using three-steps de-embedding method

2009 IEEE 9th Malaysia International Conference on Communications (MICC) ◽

10.1109/micc.2009.5431531 ◽

2009 ◽

Cited By ~ 1

Author(s):

Maisurah M.H. Siti ◽

Nizam O. Mohd ◽

A. Marzuki ◽

A.I. Abdul Rahim ◽

Razman Y Mohamed

Keyword(s):

Passive Components ◽

Embedding Method

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A New 12-Term Open–Short–Load De-Embedding Method for Accurate On-Wafer Characterization of RF MOSFET Structures

IEEE Transactions on Microwave Theory and Techniques ◽

10.1109/tmtt.2009.2038453 ◽

2010 ◽

Vol 58 (2) ◽

pp. 419-433 ◽

Cited By ~ 14

Author(s):

L.F. Tiemeijer ◽

R.M.T. Pijper ◽

J.A. van Steenwijk ◽

E. van der Heijden

Keyword(s):

Embedding Method

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Analytical modeling and characterization of deep-submicrometer interconnect

Proceedings of the IEEE ◽

10.1109/5.929648 ◽

2001 ◽

Vol 89 (5) ◽

pp. 634-664 ◽

Cited By ~ 127

Author(s):

D. Sylvester ◽

Chenming Wu

Keyword(s):

Analytical Modeling ◽

Deep Submicrometer

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Some aspects on modeling and characterization of deep submicrometer CMOS gates driving lossless transmission lines

27th International Spring Seminar on Electronics Technology: Meeting the Challenges of Electronics Technology Progress, 2004. ◽

10.1109/isse.2004.1490416 ◽

2005 ◽

Author(s):

D. Burdia ◽

R.-G. Bozomitu ◽

C.-R. Comsa

Keyword(s):

Transmission Lines ◽

Deep Submicrometer

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CHARACTERIZATION OF CHAOTIC ATTRACTORS IN EXTENDED SYSTEMS

International Journal of Bifurcation and Chaos ◽

10.1142/s0218127496000795 ◽

1996 ◽

Vol 06 (07) ◽

pp. 1375-1382 ◽

Cited By ~ 2

Author(s):

CHIEN-CHONG CHEN ◽

CHYI HWANG ◽

EDUARDO E. WOLF ◽

HSUEH-CHIA CHANG

Keyword(s):

Chaotic Dynamics ◽

Complex Dynamics ◽

Chaotic Behavior ◽

Chaotic Attractors ◽

Extended System ◽

Embedding Method ◽

Spatial Point ◽

Spatially Distributed ◽

Spatially Extended

It is shown that the traditional delayed embedding method, which is often applied to measurements at a single spatial point, could only account for partial chaotic dynamics of an extended system. To catch the whole dynamics of an extended system, we apply in this letter the Karhunen-Loeve (K-L) procedure to construct a series of tangent maps from spatially distributed measurements. The tangent maps obtained are then used for computing certain ergodic invariants. The procedure is illustrated with the experimental data obtained from a catalytic wafer, which is a spatially extended system exhibiting complex dynamics. The computed results show clearly that the K-L procedure is more suitable than the delayed embedding method for deciphering the full chaotic behavior of an extended system.

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