scholarly journals Determination of the Bulk and Local Diffusion-Length Values of Charge Carriers in MCT Films and in the Absorber Layers of MCT-Based Photovoltaic IR FPA Detectors

10.5772/60717 ◽  
2015 ◽  
Author(s):  
S.A. Dvoretsky ◽  
V.V. Vasilev ◽  
A.V. Predein ◽  
A.V. Vishnyakov ◽  
V.A. Stuchinsky ◽  
...  
Keyword(s):  
Diffusion Length ◽  
Charge Carriers ◽  
Local Diffusion

A-Si:H Ambipolar Diffusion Length and Effective Lifetime Measured by Flying Spot Technique (FST)

1991 ◽  
Vol 219 ◽  
Author(s):  
M. Vieira ◽  
R. Martins ◽  
E. Fortunato ◽  
F. Soares ◽  
L. Guimaraes
Keyword(s):  
Laser Beam ◽  
Transient Analysis ◽  
Diffusion Length ◽  
Transport Equations ◽  
Ambipolar Diffusion ◽  
Schottky Barriers ◽  
Effective Lifetime ◽  
Asymmetrical Distribution ◽  
Flying Spot

ABSTRACTThe determination of the ambipolar diffusion length, L*, and the effective lifetime, τ*, in p/i and a-Si:H Schottky barriers (ITO/p/a-Si:H/Al-Si; Cr/a-Si:H/Cr/Ag) have been determined by Flying Spot Technique, FST. This technique consists in the transient analysis of the photocurrent/photopotential induced by a laser beam that moves perpendicularly to the structure with a constant motion ratio, at different velocities. Taking into account the competition between the diffusion/drift velocities of the excess carriers and the velocity of the flying spot, it is possible to solve the transport equations and to compute separately L* and τ*, from the asymmetrical distribution responses.

Determination of the type of charge carriers in carbon fiber/polymer composite

1998 ◽  
Vol 17 (1) ◽  
pp. 35-42 ◽  
Author(s):  
Y Ramadin ◽  
M Ahmad ◽  
A Zihlif ◽  
R Al-Haddad ◽  
M Makadsi ◽  
...  
Keyword(s):  
Carbon Fiber ◽  
Polymer Composite ◽  
Charge Carriers ◽  
Carbon Fiber Polymer

scholarly journals Self-consistent determination of spin Hall angle and spin diffusion length in Pt and Pd: The role of the interface spin loss

2018 ◽  
Vol 4 (6) ◽  
pp. eaat1670 ◽  
Author(s):  
Xinde Tao ◽  
Qi Liu ◽  
Bingfeng Miao ◽  
Rui Yu ◽  
Zheng Feng ◽  
...  
Keyword(s):  
Spin Diffusion ◽  
Diffusion Length ◽  
Self Consistent ◽  
Hall Angle ◽  
Spin Diffusion Length

scholarly journals Mobility of charge carriers in self-assembled monolayers

2019 ◽  
Vol 10 ◽  
pp. 2449-2458
Author(s):  
Zhihua Fu ◽  
Tatjana Ladnorg ◽  
Hartmut Gliemann ◽  
Alexander Welle ◽  
Asif Bashir ◽  
...  
Keyword(s):  
Charge Transport ◽  
Charge Carrier Mobility ◽  
Charge Carriers ◽  
Self Assembled Monolayers ◽  
Force Microscopy ◽  
Atomic Force ◽  
Mobility Of Charge Carriers ◽  
Assembled Monolayers ◽  
Self Assembled

We present a new approach to study charge transport within 2D layers of organic semi-conductors (OSCs) using atomic force microscopy (AFM)-based lithography applied to self-assembled monolayers (SAMs), fabricated from appropriate organothiols. The extent of lateral charge transport was investigated by insulating pre-defined patches within OSC-based SAMs with regions of insulating SAM made from large band gap alkanethiolates. The new method is demonstrated using a phenyl-linked anthracenethiolate (PAT), 4-(anthracene-2-ylethynyl)benzyl thiolate. I–V characteristics of differently shaped PAT-islands were measured using the AFM tip as a top electrode. We were able to determine a relationship between island size and electrical conductivity, and from this dependence, we could obtain information on the lateral charge transport and charge carrier mobility within the thin OSC layers. Our study demonstrates that AFM nanografting of appropriately functionalized OSC molecules provides a suitable method to determine intrinsic mobilities of charge carriers in OSC thin films. In particular, this method is rather insensitive with regard to influence of grain boundaries and other defects, which hamper the application of conventional methods for the determination of mobilities in macroscopic samples.

Determination of the diffusion length of the minority carriers in electron-beam-excited n-type GaAs

1971 ◽  
Vol 4 (1) ◽  
pp. 249-255 ◽  
Author(s):  
S. Rakshit ◽  
S. N. Biswas ◽  
A. N. Chakravarti
Keyword(s):  
Electron Beam ◽  
Diffusion Length ◽  
Minority Carriers
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