scholarly journals Design Issues and Challenges of File Systems for Flash Memories

10.5772/22976 ◽  
2011 ◽  
Author(s):  
Stefano Di ◽  
Michele Fabiano ◽  
Paolo Prinetto ◽  
Maurizio Carami
Keyword(s):  
File Systems ◽  
Design Issues ◽  
Flash Memories

scholarly journals Large-scale File System Design and Architecture

10.14311/300 ◽  
2002 ◽  
Vol 42 (1) ◽  
Author(s):  
V. Dynda ◽  
P. Rydlo
Keyword(s):  
System Design ◽  
System Architecture ◽  
Large Scale ◽  
File System ◽  
File Systems ◽  
Data Availability ◽  
Data Consistency ◽  
Design Issues ◽  
File Replication

This paper deals with design issues of a global file system, aiming to provide transparent data availability, security against loss and disclosure, and support for mobile and disconnected clients.First, the paper surveys general challenges and requirements for large-scale file systems, and then the design of particular elementary parts of the proposed file system is presented. This includes the design of the raw system architecture, the design of dynamic file replication with appropriate data consistency, file location and data security.Our proposed system is called Gaston, and will be referred further in the text under this name or its abbreviation GFS (Gaston File System).

Analyzing the Impact of X-Ray Tomography on the Reliability of Integrated Circuits

2015 ◽  
Author(s):  
Halit Dogan ◽  
Md Mahbub Alam ◽  
Navid Asadizanjani ◽  
Sina Shahbazmohamadi ◽  
Domenic Forte ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Integrated Circuit ◽  
3D Imaging ◽  
Three Dimensional ◽  
Serial Sectioning ◽  
Promising Technique ◽  
Flash Memories ◽  
X Ray ◽  
3D Information ◽  
The Impact

Abstract X-ray tomography is a promising technique that can provide micron level, internal structure, and three dimensional (3D) information of an integrated circuit (IC) component without the need for serial sectioning or decapsulation. This is especially useful for counterfeit IC detection as demonstrated by recent work. Although the components remain physically intact during tomography, the effect of radiation on the electrical functionality is not yet fully investigated. In this paper we analyze the impact of X-ray tomography on the reliability of ICs with different fabrication technologies. We perform a 3D imaging using an advanced X-ray machine on Intel flash memories, Macronix flash memories, Xilinx Spartan 3 and Spartan 6 FPGAs. Electrical functionalities are then tested in a systematic procedure after each round of tomography to estimate the impact of X-ray on Flash erase time, read margin, and program operation, and the frequencies of ring oscillators in the FPGAs. A major finding is that erase times for flash memories of older technology are significantly degraded when exposed to tomography, eventually resulting in failure. However, the flash and Xilinx FPGAs of newer technologies seem less sensitive to tomography, as only minor degradations are observed. Further, we did not identify permanent failures for any chips in the time needed to perform tomography for counterfeit detection (approximately 2 hours).

Humidity reliability of commercial flash memories for long-term storage

2020 ◽  
Vol 59 (SL) ◽  
pp. SLLC01 ◽  
Author(s):  
Tomoki Murota ◽  
Toshiki Mimura ◽  
Ploybussara Gomasang ◽  
Shinji Yokogawa ◽  
Kazuyoshi Ueno
Keyword(s):  
Flash Memories ◽  
Long Term Storage ◽  
Term Storage

Design Issues for Helmet-Mounted Display Systems for Rotary-Wing Aviation.

1998 ◽  
Author(s):  
Clarence E. Rash ◽  
William E. McLean ◽  
John C. Mora ◽  
Melissa H. Ledford ◽  
Ben T. Mozo
Keyword(s):  
Design Issues ◽  
Rotary Wing ◽  
Display Systems
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