scholarly journals Automation and Emerging Technology Development of 2d Seed Sowing Robo

2009 ◽  
Vol 1 (1) ◽  
Author(s):  
S.Chandika ME AMIE ◽  
T. Mohanraj
Keyword(s):  
Technology Development ◽  
Emerging Technology ◽  
Seed Sowing

Divers-augmented vision display (DAVD) emerging technology development

2018 ◽  
Author(s):  
Allie M. Pilcher ◽  
Dennis Gallagher ◽  
Richard Manley ◽  
William W. Hughes
Keyword(s):  
Technology Development ◽  
Emerging Technology

scholarly journals Techniques, Models and Challenges of Data Mining in Internet of Things (IOT)

2019 ◽  
Vol 8 (4) ◽  
pp. 7077-7080
Keyword(s):  
Data Mining ◽  
Internet Of Things ◽  
Technology Development ◽  
Human Life ◽  
Emerging Technology ◽  
Social Value ◽  
Future Trends ◽  
Huge Amount ◽  
Advantages And Disadvantages ◽  
Business Data

Due to many achievements in the field of communication and sensor networks, Internet of Things becomes an emerging technology which makes the human life easier and comfortable. This technology development paves the way to work and live in a comfortable manner. In internet, interfacing of any object is very difficult, but IoT makes the process very easier that too in a short span of time. In IoT, a huge of amount of data has been captured that is considered as huge business and social value data’s’. So, IoT needs a model which is used to extract those high business data. Thus, data mining is a process which extracts high business data from huge amount of data easily. In this paper, a systematic review has been carried out on various data mining techniques and models that have been applied in IoT. Also its advantages and disadvantages have been discussed along with the challenges and future trends of IoT..

Bringing a life cycle perspective to emerging technology development

2020 ◽  
Vol 24 (1) ◽  
pp. 6-10
Author(s):  
Joule Bergerson ◽  
Stefano Cucurachi ◽  
Thomas P. Seager
Keyword(s):  
Life Cycle ◽  
Technology Development ◽  
Emerging Technology ◽  
Life Cycle Perspective

Some applications of electron beam microanalysis techniques in VLSI process evaluation

1983 ◽  
Vol 41 ◽  
pp. 160-161
Author(s):  
Simon Thomas
Keyword(s):  
Integrated Circuits ◽  
Process Evaluation ◽  
Large Scale ◽  
Technology Development ◽  
Analytical Techniques ◽  
Successful Implementation ◽  
Analysis Of Failures ◽  
Characterization Of Materials ◽  
Circuits Vlsi

Trends in the technology development of very large scale integrated circuits (VLSI) have been in the direction of higher density of components with smaller dimensions. The scaling down of device dimensions has been not only laterally but also in depth. Such efforts in miniaturization bring with them new developments in materials and processing. Successful implementation of these efforts is, to a large extent, dependent on the proper understanding of the material properties, process technologies and reliability issues, through adequate analytical studies. The analytical instrumentation technology has, fortunately, kept pace with the basic requirements of devices with lateral dimensions in the micron/ submicron range and depths of the order of nonometers. Often, newer analytical techniques have emerged or the more conventional techniques have been adapted to meet the more stringent requirements. As such, a variety of analytical techniques are available today to aid an analyst in the efforts of VLSI process evaluation. Generally such analytical efforts are divided into the characterization of materials, evaluation of processing steps and the analysis of failures.

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