Straining Effects in Silica-Filled Elastomers Investigated by Atomic Force Microscopy: From Macroscopic Stretching to Nanoscale Strainfield

2003 ◽  
Vol 76 (1) ◽  
pp. 60-81 ◽  
Author(s):  
A. Lapra ◽  
F. Clément ◽  
L. Bokobza ◽  
L. Monnerie
Keyword(s):  
Atomic Force Microscopy ◽  
Strain Field ◽  
Local Concentration ◽  
Macroscopic Strain ◽  
Precise Description ◽  
Force Microscopy ◽  
Filled Elastomers ◽  
Atomic Force ◽  
Different Strains ◽  
Very High

Abstract Understanding the way fillers can reinforce elastomers requires, among other things, requires a precise description of the behavior of filler aggregates when a macroscopic strain is applied. In this study, Atomic Force Microscopy was used to investigate samples of SBR and PDMS filled with silica. The samples were stretched uniaxially at different strain values (up to 145%) and imaged by Atomic Force Microscopy. The distances between aggregates were followed at the different strains, which allowed calculation of the local strains and comparison of the values obtained with the macroscopic strain value. The main results are (i) that the strain field is highly heterogeneous, depending on the local concentration of filler and (ii) that the strain undergone by elastomer chains can be very high locally, in the regions where distances between aggregates are very short.

In situ microscopic surface characterization studies of polymeric thin films during tensile deformation using atomic force microscopy

2001 ◽  
Vol 16 (3) ◽  
pp. 844-855 ◽  
Author(s):  
M. S. Bobji ◽  
Bharat Bhushan
Keyword(s):  
Atomic Force Microscopy ◽  
Surface Characterization ◽  
Tensile Deformation ◽  
Tensile Tests ◽  
Control Area ◽  
Polymeric Thin Films ◽  
Force Microscopy ◽  
Atomic Force ◽  
Different Strains

Atomic force microscopy (AFM) has been used to study the cracks developed on thin-film coatings on a polymer substrate subjected to external tension. To conduct in situ tensile tests in AFM, a special stage has been built. A new technique to image the same control area at different strains was developed and used to study the propagation of a crack with increasing strain in magnetic tapes. Metal particulate tapes developed numerous cracks of shorter length, perpendicular to the loading direction. In contrast, metal-evaporated tapes developed cracks that extend edge to edge. The variation of the crack width and the spacing with strain were measured and explained with the help of models based on elasticity.

scholarly journals A Comparison of Uric Acid Optical Detection Using as Sensitive Materials an Amino-Substituted Porphyrin and Its Nanomaterials with CuNPs, PtNPs and Pt@CuNPs

Processes ◽  
2021 ◽  
Vol 9 (11) ◽  
pp. 2072
Author(s):  
Camelia Epuran ◽  
Ion Fratilescu ◽  
Diana Anghel ◽  
Mihaela Birdeanu ◽  
Corina Orha ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Uric Acid ◽  
Copper Nanoparticles ◽  
Hybrid Material ◽  
Human Environment ◽  
Detection Range ◽  
Force Microscopy ◽  
Atomic Force ◽  
High Concentrations ◽  
Very High

Hybrid nanomaterials consisting in 5,10,15,20-tetrakis(4-amino-phenyl)-porphyrin (TAmPP) and copper nanoparticles (CuNPs), platinum nanoparticles (PtNPs), or both types (Pt@CuNPs) were obtained and tested for their capacity to optically detect uric acid from solutions. The introduction of diverse metal nanoparticles into the hybrid material proved their capacity to improve the detection range. The detection was monitored by using UV-Vis spectrophotometry, and differences between morphology of the materials were performed using atomic force microscopy (AFM). The hybrid material formed between porphyrin and PtNPs hasthe best and most stable response for uric acid detection in the range of 6.1958 × 10−6–1.5763 × 10−5 M, even in the presence of very high concentrations of the interference species present in human environment.

Surface Morphology of Nanoscale TiSi2 Epitaxial Islands on Si(00l)

1996 ◽  
Vol 448 ◽  
Author(s):  
Woochul Yang ◽  
F.J. Jedema ◽  
H. Ade ◽  
R.J Nemanich
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Strain Field ◽  
Island Size ◽  
Island Formation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Before And After ◽  
Size Uniformity ◽  
Rough Substrate

AbstractThe morphologies of nanoscale epitaxial islands of TISi2 are studied. The islands are prepared by deposition of ultrathin Ti (3-20Å) on both smooth and roughened.Si(001) substrates. The island formation is initiated by annealing to 800-1000°C. The roughened substrates are prepared by etching with atomic H produced in a plasma. The morphologies of the substrate before and after island formation are examined by atomic force microscopy (AFM). In particular, the influence of surface-roughness on both the formation of islands and the size distribution of islands is investigated. On a rough substrate islands with a lateral dimension of ~350Å and a vertical dimension of ~25Å were observed with size uniformity of ~20%. Also it was observed that the roughness of the surface reduced the island size and affected the island distribution. The results are discussed in terms of surface energy and the strain field around the islands.

Atomic Force Microscopy and Scanning Electron Microscopy Reveal Genome–dependent Ultrastructure of Seed Surface

2001 ◽  
Vol 7 (6) ◽  
pp. 526-529
Author(s):  
T. Guha ◽  
R. Bhar ◽  
V. Ganesan ◽  
A. Sen ◽  
R.L. Brahmachary
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
Contact Mode ◽  
Surface Ultrastructure ◽  
Force Microscopy ◽  
Seed Surface ◽  
Atomic Force ◽  
Different Strains ◽  
Scanning Electron

AbstractBoth scanning electron microscopy (SEM) and contact mode imaging via atomic force microscopy (AFM) have been utilized to elucidate the ultrastructure of mung bean seed surfaces. The results indicate: 1) that AFM is useful in the examination of seed surface ultrastructure ex-vaccuo without the need for additional complex preparative procedures; and 2) that both the cotyledon and seed coat of different strains of mung beans bear specific ultrastructural details unique to each strain. To our knowledge, these are the first AFM images of seed surfaces.

scholarly journals Direct visualization of translational GTPase factor-pool formed around the archaeal ribosomal P-stalk by high-speed atomic force microscopy

2020 ◽  
Author(s):  
Hirotatsu Imai ◽  
Toshio Uchiumi ◽  
Noriyuki Kodera
Keyword(s):  
Atomic Force Microscopy ◽  
High Speed ◽  
Ribosomal Subunit ◽  
Local Concentration ◽  
Translation Elongation ◽  
Force Microscopy ◽  
Atomic Force ◽  
Canonical State ◽  
Ribosomal Stalk ◽  
Ribosomal P

AbstractThe ribosomal stalk protein plays an essential role in the recruitment of translational GTPase factors EF1A and EF2 to the ribosome and their GTP hydrolysis for efficient translation elongation. However, due to the flexible nature of the ribosomal stalk, its structural dynamics and mechanism of action remain unclear. Here, we applied high-speed atomic force microscopy (HS-AFM) to directly visualize the action of the archaeal ribosomal stalk (P-stalk). HS-AFM movies clearly demonstrated the wobbling motion of the P-stalk on the large ribosomal subunit, where the stalk base adopted two conformational states, a predicted canonical state, and a newly identified flipped state. Intriguingly, archaeal aEF1A and aEF2 molecules spontaneously assembled around the ribosomal P-stalk up to the maximum number of available binding sites. These results provide the first visual evidence for the factor-pooling mechanism and reveal that the ribosomal P-stalk promotes translation elongation by increasing the local concentration of translational GTPase factors.

An Algorithm for Tailoring of Nanoparticles by Double Angle Resolved Nanosphere Lithography

2015 ◽  
Vol 1748 ◽  
Author(s):  
Christoph Brodehl ◽  
Siegmund Greulich-Weber ◽  
Jörg K. N. Lindner
Keyword(s):  
Atomic Force Microscopy ◽  
Ray Tracing ◽  
Vapor Deposition ◽  
Physical Vapor Deposition ◽  
Nanosphere Lithography ◽  
Major Influence ◽  
Large Area ◽  
Precise Description ◽  
Force Microscopy ◽  
Atomic Force

ABSTRACTNanosphere lithography (NSL) is a technique capable of creating large-area arrays of small objects with tailor-made shapes. Here we present an algorithm, which simulates the shape and morphology of nanoparticles produced via NSL in combination with physical vapor deposition from variable angles. The key idea is based on a ray-tracing technique. Mask clogging effects have a major influence on the shape of resulting nanoobjects and are therefore taken into account. In addition, we implemented a metaball concept for the precise description of thermally modified masks. The calculated results are compared exemplarily with atomic force microscopy (AFM) data of experimentally fabricated nanostructures.

On the Mullins Effect in Silica-Filled Polydimethylsiloxane Networks

2001 ◽  
Vol 74 (5) ◽  
pp. 847-870 ◽  
Author(s):  
F. Clément ◽  
L. Bokobza ◽  
L. Monnerie
Keyword(s):  
Atomic Force Microscopy ◽  
Molecular Orientation ◽  
Variable Temperature ◽  
Local Concentration ◽  
Mullins Effect ◽  
Force Microscopy ◽  
Filler Surface ◽  
Atomic Force ◽  
Filled Rubbers ◽  
Molecular Origin

Abstract Silica-filled polydimethylsiloxane networks are submitted to successive stretching cycles, in order to get the stabilized stretching curve, at variable temperature. This study explains the peculiar temperature dependence of the first stretching curve of filled rubbers, and highlights the molecular origin of the stress-softening phenomenon, known as Mullins effect. Thanks to the comparison between the strain dependence of stress and the molecular orientation, this effect is attributed to the detachment from the filler surface or slippage on the filler surface, of chains having reached their limit of extensibility. Moreover, by taking advantage of Atomic Force Microscopy observations on stretched samples, the Mullins effect is shown to take place mainly in regions of high local concentration of silica. The experimental results are also compared to Bueche's model for the Mullins effect.

Mapping the 3D-surface strain field of patterned tensile stainless steels using atomic force microscopy

2005 ◽  
Vol 103 (3) ◽  
pp. 183-189 ◽  
Author(s):  
Vincent Vignal ◽  
Eric Finot ◽  
Roland Oltra ◽  
Yvon Lacroute ◽  
Eric Bourillot ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Stainless Steels ◽  
Strain Field ◽  
Surface Strain ◽  
Force Microscopy ◽  
Atomic Force ◽  
3D Surface
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