The Fine Structure of Crystallized Rubber

1937 ◽  
Vol 10 (2) ◽  
pp. 242-248 ◽  
Author(s):  
W. Lotmar ◽  
K. H. Meyer

Abstract Whereas in the unstretched state rubber gives on examination by x-rays the diagram of a liquid, in the stretched state it gives a well-defined fiber diagram. This was first described by Katz in 1925. Since that time the crystalline interferences of rubber have been studied by several investigators. The first classification of these interferences was undertaken by Hauser and Mark, who arranged them in the form of a rhombic lattice. Later, working with a thin film of highly stretched rubber, Mark and von Susich succeeded in obtaining preparations with a higher degree of orientation. According to whether it was irradiated parallel or perpendicular to the surface of the film, such a preparation showed different intensities of the reflections. In this way Mark and von Susich succeeded in obtaining a different and more reliable indication of the reflections than did Hauser and Mark. Mark and von Susich found a rhombic elementary cell with axes of 8.3 ± 0.1 A. U., 8.1 ± 0.1 A. U. (fiber axis), and 12.3 ± 0.1. A. U. On the basis of their better established elementary cell, Mark and von Susich developed a space model of rubber which agreed fairly well with the largest intensity effects. In constructing this model they relied on the assumption expressed by Meyer and Mark that primary valence chains of the formula:

Author(s):  
B.D. Lygdenov ◽  
A.M. Guriev ◽  
S. Mei ◽  
V.I. Mosorov ◽  
Q. Zheng

The article reveals methods of electronic diffraction and raster microscopy and a method of X-rays analysis, which study gradient structure of steels 45 and 5ХНВ borated with saturated coatings. The quantitative assessment of the fine structure of steels and phase analysis of distancing from the borated surface are worked out. The classification of the layers of the gradient structure and the mechanism of formation of phases are given in the article.


Author(s):  
K. Ogura ◽  
H. Nishioka ◽  
N. Ikeo ◽  
T. Kanazawa ◽  
J. Teshima

Structural appraisal of thin film magnetic media is very important because their magnetic characters such as magnetic hysteresis and recording behaviors are drastically altered by the grain structure of the film. However, in general, the surface of thin film magnetic media of magnetic recording disk which is process completed is protected by several-nm thick sputtered carbon. Therefore, high-resolution observation of a cross-sectional plane of a disk is strongly required to see the fine structure of the thin film magnetic media. Additionally, observation of the top protection film is also very important in this field.Recently, several different process-completed magnetic disks were examined with a UHR-SEM, the JEOL JSM 890, which consisted of a field emission gun and a high-performance immerse lens. The disks were cut into approximately 10-mm squares, the bottom of these pieces were carved into more than half of the total thickness of the disks, and they were bent. There were many cracks on the bent disks. When these disks were observed with the UHR-SEM, it was very difficult to observe the fine structure of thin film magnetic media which appeared on the cracks, because of a very heavy contamination on the observing area.


Author(s):  
J N Chapman ◽  
W A P Nicholson

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.


2020 ◽  
Vol 2 (4) ◽  
Author(s):  
Masoud Gharahi ◽  
Stefano Mancini ◽  
Giorgio Ottaviani

Minerals ◽  
2021 ◽  
Vol 11 (6) ◽  
pp. 598
Author(s):  
Jose R. A. Godinho ◽  
Gabriel Westaway-Heaven ◽  
Marijn A. Boone ◽  
Axel D. Renno

This paper demonstrates the potential of a new 3D imaging technique, Spectral Computed Tomography (sp-CT), to identify heavy elements inside materials, which can be used to classify mineral phases. The method combines the total X-ray transmission measured by a normal polychromatic X-ray detector, and the transmitted X-ray energy spectrum measured by a detector that discriminates between X-rays with energies of about 1.1 keV resolution. An analysis of the energy spectrum allows to identify sudden changes of transmission at K-edge energies that are specific of each element. The additional information about the elements in a phase improves the classification of mineral phases from grey-scale 3D images that would be otherwise difficult due to artefacts or the lack of contrast between phases. The ability to identify the elements inside the minerals that compose ore particles and rocks is crucial to broaden the application of 3D imaging in Earth sciences research and mineral process engineering, which will represent an important complement to traditional 2D imaging mineral characterization methods. In this paper, the first applications of sp-CT to classify mineral phases are showcased and the limitations and further developments are discussed.


2010 ◽  
Vol 17 (05n06) ◽  
pp. 445-449 ◽  
Author(s):  
SUHUA FAN ◽  
QUANDE CHE ◽  
FENGQING ZHANG

The (100)-oriented Ca0.4Sr0.6Bi4Ti4O15(C0.4S0.6BTi ) thin film was successfully prepared by a sol-gel method on Pt/Ti/SiO2/Si substrate. The orientation and formation of thin films under different annealing schedules were studied using XRD and SEM. XRD analysis indicated that (100)-oriented C0.4S0.6BTi thin film with degree of orientation of I(200)/I(119) = 1.60 was prepared by preannealing the film at 400°C for 3 min followed by rapid thermal annealing at 800°C for 5 min. SEM analysis further indicated that the (100)-oriented C0.4S0.6BTi thin film with a thickness of about 800 nm was mainly composed of equiaxed grains. The remanent polarization and coercive field of the film were 16.1 μC/cm2 and 85 kV/cm, respectively.


1988 ◽  
Vol 13 (4) ◽  
pp. 458-462
Author(s):  
H. TEISEN ◽  
J. HJARBAEK
Keyword(s):  
X Rays ◽  

The X-rays of 17 patients with fresh fractures of the lunate bone have been reviewed. The fractures were classified according to their radiological appearances and according to the vascular anatomy of the lunate. A long term X-ray follow-up examination was performed.


2018 ◽  
Vol 89 (10) ◽  
pp. 103112 ◽  
Author(s):  
Qingyuan Hu ◽  
Jiamin Ning ◽  
Fan Ye ◽  
Shijian Meng ◽  
Yi Qin ◽  
...  

1999 ◽  
Vol 54 (1) ◽  
pp. 215-222 ◽  
Author(s):  
Jun Kawai ◽  
Shinjiro Hayakawa ◽  
Yoshinori Kitajima ◽  
Yohichi Gohshi

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