Applications of thin film plastic scintillator in measurement of soft x rays generated from Z-pinch implosion

2018 ◽  
Vol 89 (10) ◽  
pp. 103112 ◽  
Author(s):  
Qingyuan Hu ◽  
Jiamin Ning ◽  
Fan Ye ◽  
Shijian Meng ◽  
Yi Qin ◽  
...  
Keyword(s):  
Thin Film ◽  
Plastic Scintillator ◽  
X Rays ◽  
Z Pinch

Problems in Thin-Film X-ray Quantification

1990 ◽  
Vol 48 (2) ◽  
pp. 458-459
Author(s):  
J N Chapman ◽  
W A P Nicholson
Keyword(s):  
Thin Film ◽  
Specimen Thickness ◽  
X Rays ◽  
Characteristic Peak ◽  
Local Composition ◽  
X Ray ◽  
Measured Ratio ◽  
Path Lengths ◽  
Composition Changes

Energy dispersive x-ray microanalysis (EDX) is widely used for the quantitative determination of local composition in thin film specimens. Extraction of quantitative data is usually accomplished by relating the ratio of the number of atoms of two species A and B in the volume excited by the electron beam (nA/nB) to the corresponding ratio of detected characteristic photons (NA/NB) through the use of a k-factor. This leads to an expression of the form nA/nB = kAB NA/NB where kAB is a measure of the relative efficiency with which x-rays are generated and detected from the two species.Errors in thin film x-ray quantification can arise from uncertainties in both NA/NB and kAB. In addition to the inevitable statistical errors, particularly severe problems arise in accurately determining the former if (i) mass loss occurs during spectrum acquisition so that the composition changes as irradiation proceeds, (ii) the characteristic peak from one of the minority components of interest is overlapped by the much larger peak from a majority component, (iii) the measured ratio varies significantly with specimen thickness as a result of electron channeling, or (iv) varying absorption corrections are required due to photons generated at different points having to traverse different path lengths through specimens of irregular and unknown topography on their way to the detector.

Development of thin-film plastic scintillator detectors for use in in-beam fission studies

1974 ◽  
Vol 121 (2) ◽  
pp. 353-358 ◽  
Author(s):  
P.D. Goldstone ◽  
R.E. Malmin ◽  
F. Hopkins ◽  
P. Paul
Keyword(s):  
Thin Film ◽  
Plastic Scintillator ◽  
Scintillator Detectors

scholarly journals Synchrotron X-ray Microdiffraction Images of Polarization Switching in Epitaxial PZT Capacitors with Pt and SrRuO3 Top Electrodes

2003 ◽  
Vol 784 ◽  
Author(s):  
Dal-Hyun Do ◽  
Dong Min Kim ◽  
Chang-Beom Eom ◽  
Eric M. Dufresne ◽  
Eric D. Isaacs ◽  
...  
Keyword(s):  
Thin Film ◽  
Bottom Electrode ◽  
Sputter Deposition ◽  
Ferroelectric Polarization ◽  
X Rays ◽  
X Ray ◽  
Pzt Film ◽  
Thin Film Capacitors ◽  
Pzt Thin Film ◽  
Switchable Polarization

ABSTRACTThe evolution of stored ferroelectric polarization in PZT thin film capacitors was imaged using synchrotron x-ray microdiffraction with a submicron-diameter focused incident x-ray beam. To form the capacitors, an epitaxial Pb(Zr,Ti)O3 (PZT) thin film was deposited on an epitaxially-grown conductive SrRuO3 (SRO) bottom electrode on a SrTiO3 (STO) (001) substrate. Polycrystalline SRO or Pt top electrodes were prepared by sputter deposition through a shadow mask and subsequent annealing. The intensity of x-ray reflections from the PZT film depended on the local ferroelectric polarization. With 10 keV x-rays, regions of opposite polarization differed in intensity by 26% in our PZT capacitor with an SRO top electrode. Devices with SRO electrodes showed just a 25% decrease in the remnant polarization after 107 switching cycles. In devices with Pt top electrodes, however, the switchable polarization decreased a by 70% after only 5×104 cycles.

Energy distribution of μd1s muonic atom and its spin states effecting on muonic X-Ray transfer yield in solid thin film method

2014 ◽  
Vol 23 (02) ◽  
pp. 1450006 ◽  
Author(s):  
R. Gheisari ◽  
M. Afshari ◽  
K. Khorshidian
Keyword(s):  
Thin Film ◽  
Energy Distribution ◽  
Muonic Atom ◽  
Rate Equations ◽  
Spin States ◽  
X Rays ◽  
X Ray ◽  
Solid Deuterium ◽  
Molecular Formation ◽  
Film Method

We have investigated the energy distribution of [Formula: see text] and its spin states (F) effecting on muonic X-ray transfer yield in the solid thin film method. Argon ( Ar ) ion has been considered as the implanted ion in solid deuterium (s D 2) layer at a temperature of T = 3 K. A kinetics model has been used, the corresponding rate equations have been constructed and our results of X-ray yield have been compared with recent measured data. The μd1s muonic atoms, which can take part in resonant molecular formation, have been separated from atoms participating in nonresonant reactions. On this basis, the integrated number of X-rays has been calculated. The results show that the effect of μd1s energy distribution on the number of X-photons is not serious, while its spin states strongly affect the muonic X-ray yield.

scholarly journals The diffraction of cathode rays by thin celluloid films

1928 ◽  
Vol 119 (783) ◽  
pp. 663-667 ◽  
Keyword(s):  
Thin Film ◽  
Phase Velocity ◽  
Multiple Scattering ◽  
Photographic Plate ◽  
Wave Length ◽  
Normal Incidence ◽  
X Rays ◽  
Series Of Experiments ◽  
Diffraction Patterns ◽  
Moving Particle

In the de Broglie theory of mechanics a moving particle behaves as a group of waves of wave-length = h √¯1 — v 2 / c 2 / m 0 v and phase velocity V = c 2 / v , where m 0 is the mass of the particle, v its speed and c the velocity of light. In the case of electrons of energy 10,000 to 40,000 volts, the corresponding wave­ lengths would be from 1·22 X 10 -9 to 0·66 X 10 -9 cms. These waves, there­ fore, should behave in many ways like hard X-rays, and, in particular, should show similar diffraction patterns when passed through crystals. Thus, accord­ing to the Bragg formula, if the rays are incident at an angle θ on a set of parallel planes, we should get reflection provided that 2 d sin θ = nλ,d being the spacing between the planes. To investigate these effects, a series of experiments, suggested and super­vised by Prof. G. P. Thomson, was begun in October, 1926. An account of these has already been published in ‘ Nature,’ but since then much more accurate work has been done. The experiments consisted in sending a beam of homogeneous cathode rays through a thin film at normal incidence and receiving them on a photographic plate. As shown below, the resultant pattern should be of the Hull-Debye-Scherrer type. Celluloid was chosen because it is comparatively easy to get films of the order of 500 Ă. U. thick. These were pre­pared by dissolving celluloid in amyl acetate. A little of the solution was dropped on water and the amyl allowed to evaporate. The celluloid which remained was removed on cardboard frames. It is essential that the films be thin enough to prevent blurring of the pattern by multiple scattering.

Determination of the Mechanical Response of Thin Films with X-Rays

1993 ◽  
Vol 308 ◽  
Author(s):  
I. C. Noyan ◽  
G. Sheikh
Keyword(s):  
Thin Film ◽  
Thin Films ◽  
Mechanical Response ◽  
Strain Analysis ◽  
Local Strain ◽  
X Rays ◽  
Stress Strain ◽  
X Ray ◽  
The Individual

ABSTRACTThe mechanical response of a specimen incorporating thin films is dictated by a combination of fundamental mechanical parameters such as Young's moduli of the individual layers, and by configurational parameters such as adhesion strength at the interface(s), residual stress distribution and other process dependent factors. In most systems, the overall response will be dominated by the properties of the (much thicker) substrate. Failure within the individual layers, on the other hand, is dependent on the local strain distributions and can not be predicted from the substrate values alone. To better understand the mechanical response of these systems, the strain within the individual layers of the thin film system must be measured and correlated with applied stresses. Phase selectivity of X-ray stress/strain analysis techniques is well suited for this purpose. In this paper, we will review the use of the traditional x-ray stress/strain analysis methods for the determination of the mechanical properties of thin film systems.

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