Deformation Index—Concept for Hysteretic Energy-Loss Process

1991 ◽  
Vol 64 (1) ◽  
pp. 57-64 ◽  
Author(s):  
Shingo Futamura

Abstract The concept of deformation index can be effectively used to determine the relevant dynamic viscoelastic property which best correlates with the performance of the rubbery material. The concept also indicates the type of deformation that may govern a complex energy loss process, although, in this study, the underlying physical process was not experimentally identified.

1997 ◽  
Vol 5 (6) ◽  
pp. 6-7
Author(s):  
William Tivol

When an electron passes through matter, the energy of the electron is transferred to the material in the form of ionizations and excitations. Almost all of this transfer is the result of the Coulomb interaction of the beam electrons with the electrons in the specimen; that is, scattering of beam electrons by nuclei is not an important energy-transfer process.On average, about 30 eV is transferred for each ion pair (the electron and the parent atom) produced, and most of the energy transferred goes into primary or secondary ionizations. In a typical energy-loss process, an electron can be removed from an inner shell (it can leave the atom with a velocity comparable to that of the incident electron).


Author(s):  
Jaehyung Ju ◽  
Joshua D. Summers ◽  
John Ziegert ◽  
George Fadel

In an effort to develop an elastomer-like material with low hysteretic energy loss associated with an energy efficient structural design, a cyclic energy loss model of honeycombs is investigated. In-plane viscoelastic constitutive relations of a honeycomb are developed based on honeycomb geometries and a base material’s viscoelastic properties. Using Prony series parameters for the stress-relaxation of a material, a numerical study on hysteretic energy dissipation is conducted for regular and auxetic honeycombs. Finite element (FE) simulation is carried out to validate the numerical study. Preferred cell geometries of honeycombs are also discussed in terms of minimizing the hysteretic energy loss.


1989 ◽  
Vol 157 ◽  
Author(s):  
X.L. Xu ◽  
Zhou Zuyao ◽  
Chen Lizhi ◽  
Zou Shichang

ABSTRACTThree types of ions with different atomic masses (B , Ar and As ) were chosen to irradiate polyimide films in similar conditions in order to check mechanisms of the formation of ion beam induced damage in polyimide. A four-point probe technique was used to measure sheet resistivities of implanted films. An ion mass effect on conductivity of ion irradiated polyimide film was discovered. The ion mass effect on ion beam induced change of conductivity and on the energy loss process of the ions in polyimide suggest that the electronic energy loss of incident ions is an important factor for the increase of conductivity of implanted polyimide, and the contributions of recoil ionization are restricted by the grave damages as a result of nuclear energy loss process of ions in targets. Our hypothesis is supported by automatic spreading resistance measurement of B implanted polyimide film coated on silicon substrate. The results of this work have been compared with the hypothesis of degradation through direct knock on of atoms in polyimide, proposed by D.Fink et al [Nucl. Instr. and Meths B32 (1988) 125]


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