Design and Implementation of FSM Based MBIST using March Algorithm

2020 ◽  
pp. 18-21
Author(s):  
P Aishwarya , Dr. K Deepti
Keyword(s):  
Integrated Circuits ◽  
Finite State Machine ◽  
Random Access ◽  
Automatic Test Equipment ◽  
Access Memory ◽  
Machine Model ◽  
Research Article ◽  
Finite State ◽  
Self Test ◽  
Built In Self Test

The research article aims at identifying memory testing in static random access memory which is significant in deep sub micron era. Built in self test provides a best solution replacing the external Automatic test equipment. Built in Self Test is a technique of designing additional hardware and software feature into Integrated circuits to allow them to perform testing. BIST works in the background checking memories for faults without interfering with actual functionality of the memory. The objective of the proposed work is to identify faults associated with the memory, perform test algorithms to detect the faults in memory BIST architecture.The implementation of Memory BIST is done using Finite state machine model. The design of memory BIST is accomplished using Xilinx Vivado IDE for 32X8 memory.

scholarly journals A Built-in Self-Test System for External DRAM

2020 ◽  
pp. 80-87
Author(s):  
Gor Abgaryan
Keyword(s):  
Integrated Circuits ◽  
High Speed ◽  
High Efficiency ◽  
Random Access ◽  
Test System ◽  
Mass Storage ◽  
Access Memory ◽  
Yield And Quality ◽  
Self Test ◽  
Built In Self Test

In the fast-growing Integrated Circuits (IC) industry, memory is one of the few keys to have systems with improved and fast performance. Only one transistor and a capacitor are required for Dynamic Random-Access Memory (DRAM) bit. It is widely used for mass storage. Although the high-efficiency tests are performed to provide the reliability of the memories, maintaining acceptable yield and quality is still the most critical task. To perform a high-speed effective test of DRAM memories, a built-in self-test (BIST) mechanism is proposed.

scholarly journals BIST Architecture for Magnetic Memories

2020 ◽  
pp. 88-95
Author(s):  
Armen Babayan
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Test Solution ◽  
Access Memory ◽  
Magnetic Random Access Memory ◽  
Emerging Memory ◽  
Self Test ◽  
Built In Self Test

Magnetic random-access memory (MRAM) is one of the emerging memory technologies, which can be considered as the next universal memory because of its good parameters. Nevertheless, this type of memory is not guaranteed from defects and it is very important to understand the fault typology and develop a test solution that addresses these faults. In this paper a Built-in Self-Test (BIST) solution is presented, which is specifically tailored for MRAMs and efficiently deals with MRAM specific faults.

scholarly journals BIST Architecture for Magnetic Memories

2020 ◽  
pp. 88-95
Author(s):  
Armen Babayan
Keyword(s):  
Random Access ◽  
Random Access Memory ◽  
Test Solution ◽  
Access Memory ◽  
Magnetic Random Access Memory ◽  
Emerging Memory ◽  
Self Test ◽  
Built In Self Test

Magnetic random-access memory (MRAM) is one of the emerging memory technologies, which can be considered as the next universal memory because of its good parameters. Nevertheless, this type of memory is not guaranteed from defects and it is very important to understand the fault typology and develop a test solution that addresses these faults. In this paper a Built-in Self-Test (BIST) solution is presented,which is specifically tailored for MRAMs and efficiently deals with MRAM specific faults.

scholarly journals Improving the Timing of Extended Finite State Machines Via Catalyst

VLSI Design ◽  
2002 ◽  
Vol 15 (3) ◽  
pp. 629-635
Author(s):  
Shi-Yu Huang
Keyword(s):  
Finite State Machine ◽  
Critical Path ◽  
Optimization Technique ◽  
Clock Cycle ◽  
Random Access ◽  
Finite State ◽  
Static Random Access Memories ◽  
Extended Finite State Machines ◽  
Self Test ◽  
Critical Paths

We propose a timing optimization technique for a complex finite state machine that consists of not only random logic but also data operators. In such a design, the timing critical path often forms a cycle and thus cannot be cut down easily by popular techniques such as pipelining or retiming. The proposed technique, based on the concept of catalyst, adds a functionally redundant block—which includes a piece of combinational logic and several other registers—to the circuits under consideration so that the timing critical paths are divided into stages. During this transformation, the circuit's functionality is not affected, while the speed is improved significantly. This technique has been successfully applied to an industrial application—a Built-In Self-Test (BIST) circuit for static random access memories (SRAMs). The synthesis result indicates a 47% clock cycle time reduction.

scholarly journals Finite State Machine based Programmable Memory Built-in Self-Test

2021 ◽  
Vol 9 (VI) ◽  
pp. 3805-3809
Author(s):  
B V S Sai Praneeth
Keyword(s):  
Finite State Machine ◽  
State Machine ◽  
March Test ◽  
Multiple Test ◽  
Memory Modules ◽  
Finite State ◽  
Self Test ◽  
Built In Self Test ◽  
On Chip ◽  
Test Algorithm

We propose a methodology to design a Finite State Machine(FSM)-based Programmable Memory Built-In Self Test (PMBIST) which includes a planned procedure for Memory BIST which has a controller to select a test algorithm from a fixed set of algorithms that are built in the memory BIST. In general, it is not possible to test all the different memory modules present in System-on-Chip (SoC) with a single Test algorithm. Subsequently it is desirable to have a programmable Memory BIST controller which can execute multiple test algorithms. The proposed Memory BIST controller is designed as a FSM (Finite State Machine) written in Verilog HDL and this scheme greatly simplifies the testing process and it achieves a good flexibility with smaller circuit size compared with Individual Testing designs. We have used March test algorithms like MATS+, March X, March C- to build the project.

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