scholarly journals The Electrical Characterization of Magnetic Tunneling Junction Cells Using Conductive Atomic Force Microscopy with an External Magnetic Field Generator

2010 ◽  
Vol 11 (6) ◽  
pp. 271-274 ◽  
Author(s):  
Jin-Hee Heo
Keyword(s):  
Magnetic Field ◽  
Electrical Characterization ◽  
Tunneling Junction ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Magnetic Tunneling Junction ◽  
Magnetic Field Generator ◽  
Magnetic Tunneling

Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

2008 ◽  
Vol 112 (49) ◽  
pp. 19680-19685 ◽  
Author(s):  
Pavels Birjukovs ◽  
Nikolay Petkov ◽  
Ju Xu ◽  
Janis Svirksts ◽  
John J. Boland ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanowire Arrays ◽  
Bismuth Sulfide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Nanoscale electrical characterization of organic photovoltaic blends by conductive atomic force microscopy

2006 ◽  
Vol 89 (3) ◽  
pp. 032107 ◽  
Author(s):  
Olivier Douhéret ◽  
Laurence Lutsen ◽  
Ann Swinnen ◽  
Martin Breselge ◽  
Koen Vandewal ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Organic Photovoltaic ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Conductive Atomic Force Microscopy and Scanning Impedance Microscopy for the Imaging of Electrical Domain in CaCu3Ti4O12 Perovskite Oxide

2009 ◽  
Vol 1232 ◽  
Author(s):  
Raffaella Lo Nigro ◽  
Patrick Fiorenza ◽  
Vito Raineri
Keyword(s):  
Atomic Force Microscopy ◽  
Grain Boundaries ◽  
Electrical Characterization ◽  
Scanning Probe ◽  
Perovskite Oxide ◽  
Electrical Characteristics ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

AbstractElectrical characterization of CaCu3Ti4O12 (CCTO) ceramics with scanning probe based techniques has been carried out. In particular, conductive atomic force microscopy (C-AFM) and scanning impedance microscopy (SIM) have been used to demonstrate the presence, shape and size in CCTO ceramics of the different electrically domains, both at the grain boundaries and within the grains. The electrical characteristics of single grains and of single domains have been evaluated and it has been observed that the conductive grains are surrounded by insulating grain boundaries.

Sign in / Sign up

Export Citation Format

Share Document