scholarly journals Domain Wall Width in Different Ferroelectrics via Perturbation Route

2012 ◽  
Vol 02 (02) ◽  
pp. 91-95
Author(s):  
Anik Bandyopadhyay ◽  
Arnab Sengupta ◽  
Kamal Choudhary ◽  
Asis K. Bandyopadhyay ◽  
Pratap C. Ray
Keyword(s):  
Domain Wall ◽  
Wall Width ◽  
Domain Wall Width

Domain wall width and velocity behaviors in notched magnetic devices

2007 ◽  
Vol 101 (9) ◽  
pp. 09F504 ◽  
Author(s):  
Se Dong Kim ◽  
Byong Sun Chun ◽  
Young Keun Kim
Keyword(s):  
Domain Wall ◽  
Wall Width ◽  
Magnetic Devices ◽  
Domain Wall Width

Influence of step edges and strain on the domain wall width

2005 ◽  
Vol 72 (10) ◽  
Author(s):  
S. Bodea ◽  
W. Wulfhekel ◽  
J. Kirschner
Keyword(s):  
Domain Wall ◽  
Wall Width ◽  
Domain Wall Width ◽  
Step Edges

Influence of magnetic domain-wall width and shape on magnetoresistance measurements

2001 ◽  
Vol 89 (11) ◽  
pp. 7203-7205
Author(s):  
S. Mangin ◽  
C. Bellouard ◽  
P. Turban ◽  
S. Andrieu ◽  
F. Canet ◽  
...  
Keyword(s):  
Domain Wall ◽  
Magnetic Domain ◽  
Magnetic Domain Wall ◽  
Wall Width ◽  
Domain Wall Width

Quantitative lorentz microscopy of NdFeB magnets

1988 ◽  
Vol 46 ◽  
pp. 552-553
Author(s):  
Raja K. Mishra
Keyword(s):  
Domain Wall ◽  
Detection System ◽  
Wall Width ◽  
Simple Method ◽  
Lorentz Microscopy ◽  
Transmission Electron ◽  
Optical Effects ◽  
Scanning Transmission ◽  
Image Computation ◽  
Domain Wall Width

It is now well established that quantitative measurement of domain wall width using Lorentz electron microscopy is nontrivial. The usual technique of extrapolating divergent wall image widths of over-focussed or under-focussed Fresnel images suffers from serious errors since it is based on geometrical considerations and does not take into account the wave optical effects of electron scattering in the microscope. These errors are overcome if one supplements the measurements with image computation for the specific electron optical system and the specimen configuration. Another way of circumventing the errors is by using Differential Phase Contrast Microscopy in a Scanning Transmission Microscope which unfortunately requires instrumentation changes in the electron source and the electron detection system. In this paper we describe a simple method of calculating quantitative values of domain wall energy and domain wall width from Fresnel images obtainable in any standard transmission electron microscope.

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