scholarly journals A Study of Scanning Electron Microscope of Vancomycin Resistant <i>Enterococcus faecalis</i> from Clinical Isolates

2012 ◽  
Vol 02 (02) ◽  
pp. 93-97 ◽  
Author(s):  
Ajay Kumar Oli ◽  
Raju Sungar ◽  
Nagaveni Shivshetty ◽  
Rajeshwari Hosamani ◽  
Kelmani Chandrakanth Revansiddappa
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Enterococcus Faecalis ◽  
Clinical Isolates ◽  
Vancomycin Resistant ◽  
Scanning Electron

Bacteriocin plasmid pMB1 of Enterococcus faecalis: identification of the cell aggregation substance after induction by sex pheromone

1994 ◽  
Vol 40 (6) ◽  
pp. 500-503 ◽  
Author(s):  
R. Quirantes ◽  
I. Martín ◽  
E. Valdivia ◽  
A. Gálvez ◽  
M. Martínez-Bueno ◽  
...  
Keyword(s):  
Surface Layer ◽  
Electron Microscope ◽  
Sex Pheromone ◽  
Scanning Electron Microscope ◽  
Enterococcus Faecalis ◽  
Cell Aggregation ◽  
Surface Proteins ◽  
Aggregation Substance ◽  
Culture Supernatants ◽  
Scanning Electron

Strains of Enterococcus faecalis carrying the bacteriocinogenic plasmids pMB1 or pMB 1.1 exhibit a clumping response to culture supernatants of different enterococcal strains. Antibodies raised against cells induced by a homologous pheromone recognize two surface proteins of 152 and 72.5 kDa (the second one is possibly the degradation product of the first), respectively. These antigens are very similar to those found in induced cells of E. faecalis OGIRF(pAM211) as shown by the cross-reaction of the immune sera obtained in this work. We propose that the 152-kDa protein corresponds to the aggregation substance coded by plasmids pMB1 and pMB1.1. Moreover, antibodies raised against induced cells are able to block the pheromone-induced clumping response. When the cells induced to form aggregates by pheromones were examined under a scanning electron microscope they showed a surface layer of hairlike structures.Key words: pMB1 plasmid, sex pheromone, aggregation substance, Enterococcus faecalis.

scholarly journals Comparison of Antifungal Properties of Gold, Silver, and Selenium Nanoparticles Against Amphotericin B-Resistant Candida glabrata Clinical Isolates

2020 ◽  
Author(s):  
Ensieh Lotfali ◽  
Hossein Toreyhi ◽  
Kamyab Makhdoomi Sharabiani ◽  
Azam Fattahi ◽  
Amirali Soheili ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Antifungal Activity ◽  
Scanning Electron Microscope ◽  
Amphotericin B ◽  
Candida Glabrata ◽  
Morphological Changes ◽  
Clinical Isolates ◽  
Ag Nps ◽  
Gold Silver ◽  
Scanning Electron

Background: The present study aimed to investigate the antifungal activity of  Nanoparticles (NPs) against amphotericin B-resistant Candida glabrata (C. glabrata) strains. Methods: Twelve resistant (C. glabrata) strains were isolated from archived clinical isolates. Antifungal activity was conducted according to Clinical and Laboratory Standards Institute’s (CLSI) guidelines, document M27-A3/S4. The Scanning Electron Microscope (SEM) was used to observe the morphological changes of strains exposed to each nanoparticle. Results: Minimum Inhibitory Concentration (MIC) of nanoparticles of all strains was in the concentration range of 0.125 to 0.5 µg/Ml. The synthesized Ag-NPs showed superior antifungal activity against (C. glabrata) compared to Se-NPs and Au-NPs. The scanning electron microscope images revealed the difference in the fungal morphology between the untreated and treated fungi with nanoparticles. Conclusion: The Ag-NPs, followed by Se-NPs synthesized, revealed significant antifungal activity against resistance regardless of their antifungal-resistant mechanisms.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

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