scholarly journals Mechanical Properties and Interface Microstructure of SAC305 Solder Joints Made to an Ag-Pd-Pt Thick Film Metallization: Part 1—Processing Effects

2021 ◽  
Vol 18 (3) ◽  
pp. 81-96
Author(s):  
Paul T. Vianco ◽  
Alice C. Kilgo ◽  
Bonnie B. McKenzie ◽  
Shelley Williams ◽  
Robert Ferrizz ◽  
...  
Keyword(s):  
Thick Film ◽  
Solder Joints ◽  
High Reliability ◽  
Process Window ◽  
Sac305 Solder ◽  
Film Conductor ◽  
Processing Effects ◽  
Free Solder ◽  
Hybrid Microcircuit ◽  
Mechanical Strengths

Abstract The processibility was document for interconnections made between the 96.5Sn-3.0Ag-0.5Cu (wt.%, abbreviated SAC305) Pb-free solder and an Ag-Pd-Pt thick film conductor on an alumina substrate. The Sheppard’s hook pull test was used to assess the solder joint strength. Microanalysis techniques documented the corresponding microstructures. Excellent solderability was observed across the process parameters defined by the soldering temperatures of 240–290°C and soldering times of 15–120 s. Molten SAC305 solder dissolved the Ag-Pd-Pt thick film, leading to the precipitation of Ag (trace of Pd) and (Pd, Pt)xSny intermetallic compound (IMC) particles upon solidification. The mechanical strengths of the solder joints were excellent (10–15 N) and remained largely insensitive to the processing conditions. The failure mode was ductile fracture in the solder. These findings confirmed that the SAC305 solder/Ag-Pd-Pt thick film interconnection system had the necessary process window for use in high reliability, hybrid microcircuit (HMC) applications.

scholarly journals Mechanical Properties and Interface Microstructure of SAC305 Solder Joints Made to a Ag-Pd-Pt Thick Film Metallization: Part 2—Isothermal Aging Effects

2021 ◽  
Vol 18 (3) ◽  
pp. 97-112
Author(s):  
Paul. T. Vianco ◽  
Alice. C. Kilgo ◽  
Bonnie. B. McKenzie ◽  
Shelley Williams ◽  
Robert Ferrizz ◽  
...  
Keyword(s):  
Solder Joint ◽  
Thick Film ◽  
Precipitation Hardening ◽  
Failure Modes ◽  
Solder Joints ◽  
Accelerated Aging ◽  
Process Window ◽  
Aging Effects ◽  
Sac305 Solder ◽  
Hardening Mechanism

Abstract The performance and reliability were documented for solder joints made between the 96.5Sn-3.0Ag-0.5Cu (wt.%, abbreviated SAC305) Pb-free solder and a Ag-Pd-Pt thick film conductor on an alumina substrate. The Sheppard’s hook pull test was used to assess the solder joint strength. The Part 1 study confirmed that the solder joint fabrication process had a wide process window. The current study determined that the SAC305 solder joints maintained that robustness after accelerated aging at temperatures of 70–205°C and time durations of 5–200 d. Short-term aging of 5–10 d caused a peak in the pull strength peak that resulted from precipitation hardening by Ag-Pd and (Pd, Pt)xSny intermetallic compound (IMC) particles. The pull strengths did not decrease significantly after longer aging times at 70°C and 100°C; those conditions were accelerations of typical service lifetimes. Longer aging times at temperatures of 135–205°C resulted in a gradual, albeit not catastrophic, strength decrease when the precipitation hardening mechanism was lost to dissolution of the particle phases and their reprecipitation at the solder/alumina interface. The failure modes were ductile fracture in the solder except for the most severe aging conditions. These findings confirmed that the SAC305 solder/Ag-Pd-Pt thick film interconnections have excellent long-term reliability for hybrid microcircuit and high-temperature electronics applications.

Effect of Aging on the Properties of Intermetallic Layers in SAC+Bi Solder Joints

2021 ◽  
Author(s):  
Mohammad Ashraful Haq ◽  
Mohd Aminul Hoque ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Solder Joints ◽  
Lead Free ◽  
Lead Free Solder ◽  
Aging Condition ◽  
Sac305 Solder ◽  
The Poor ◽  
Free Solder ◽  
Lead Free Solders ◽  
Overall Reliability ◽  
Intermetallic Layers

Abstract A major problem faced by electronic packaging industries is the poor reliability of lead free solder joints. One of the most common methods utilized to tackle this problem is by doping the alloy with other elements, especially bismuth. Researches have shown Bismuth doped solder joints to mostly fail near the Intermetallic (IMC) layer rather than the bulk of the solder joint as commonly observed in traditional SAC305 solder joints. An understanding of the properties of this IMC layer would thus provide better solutions on improving the reliability of bismuth doped solder joints. In this study, the authors have used three different lead free solders doped with 1%, 2% and 3% bismuth. Joints of these alloys were created on copper substrates. The joints were then polished to clearly expose the IMC layers. These joints were then aged at 125 °C for 0, 1, 2, 5 and 10 days. For each aging condition, the elastic modulus and the hardness of the IMC layers were evaluated using a nanoindenter. The IMC layer thickness and the chemical composition of the IMC layers were also determined for each alloy at every aging condition using Scanning Electron Microscopy (SEM) and EDS. The results from this study will give a better idea on how the percentage of bismuth content in lead free solder affects the IMC layer properties and the overall reliability of the solder joints.

Performance Assessment of a Low Temperature Polymer Conductor for Lead-Free Soldering Processes

2014 ◽  
Vol 2014 (1) ◽  
pp. 000251-000257
Author(s):  
Steven Grabey ◽  
Samson Shahbazi ◽  
Sarah Groman ◽  
Catherine Munoz
Keyword(s):  
Low Temperature ◽  
Thick Film ◽  
Elevated Temperatures ◽  
Printed Electronics ◽  
High Reliability ◽  
Sem Analysis ◽  
Lead Free ◽  
Sac305 Solder ◽  
Soldering Process ◽  
Lead Free Solders

An increased interest in low temperature polymer thick film products has become apparent due to the rise of the printed electronics market. The specifications for these products are becoming more demanding with expectations that the low temperature products should perform at a level that is typically reserved for their high temperature counterparts; including solderability with lead free solders, high reliability and strong adhesion. Traditionally, it has only been possible to use leaded solders for soldering to polymer based thick film conductors. Over the last 15 years environmental concerns and legislation have pushed the industry towards a lead free approach. The shift to lead free solders, while beneficial, provides new challenges during processing. The high temperatures required for a lead-free soldering process yield a naturally harsher environment for polymer thick film pastes. In the past these conditions have proven too harsh for the pastes to survive. The polymer thick film discussed in this document aims to address some of these concerns for a highly reliable and easy to process polymer thick film paste. Due to the poor leaching characteristics of polymer thick films, at elevated temperatures, the predecessors of this paste typically soldered at low temperatures with leaded solders. The goal of this paper is to present a low temperature paste that is compatible with a variety of substrates and readily accepts lead-free solder. This paper will discuss a newly formulated low temperature curing (150°C – 200°C) RoHS and REACH compliant paste that shows excellent solderability with SAC305 solder. The paste was evaluated using a dip soldering method at 235°C–250°C on a variety of substrates. The data presented includes solder acceptance, adhesion data, thermal analysis and SEM analysis.

Damage Evolution in Lead Free Solder Joints in Isothermal Fatigue

2015 ◽  
Vol 137 (2) ◽  
Author(s):  
Awni Qasaimeh ◽  
Sa’d Hamasha ◽  
Younis Jaradat ◽  
Peter Borgesen
Keyword(s):  
Crack Initiation ◽  
Mechanical Response ◽  
Solder Joints ◽  
Fatigue Testing ◽  
Hysteresis Loops ◽  
Damage Function ◽  
Lead Free ◽  
Lead Free Solder ◽  
Sac305 Solder ◽  
Free Solder

The extrapolation and generalization of accelerated test results for lead free solder joints require the identification of a damage function that can be counted on to apply beyond the region of the test. Individual ball grid array (BGA) scale Sn3Ag0.5Cu (SAC305) solder joints were subjected to isothermal shear fatigue testing at room temperature and 65 °C. The resulting mechanical response degradation and crack behavior, including strain hardening, crack initiation, and propagation, were correlated with the inelastic work and effective stiffness derived from load–displacement hysteresis loops. Crack initiation was found to scale with the accumulated work, independently of cycling amplitude and strain rate. The subsequent damage rate varied slightly with amplitude.

Research SMT Technology Parameter Optimize Based on NiPdAu PCB

2012 ◽  
Vol 472-475 ◽  
pp. 1240-1244
Author(s):  
Jin Wei Yu
Keyword(s):  
Economic Benefit ◽  
Solder Joints ◽  
High Reliability ◽  
Lead Free ◽  
Lead Free Solder ◽  
Quality Factors ◽  
Gold Plating ◽  
Designed Experiment ◽  
Free Solder ◽  
Experimental Data Analysis

In the era of lead-free solder joints, nickel palladium gold PCB for its superior reliability and economy, more and more favored by the market , because the coating is added to palladium , SMT technology parameters have to be changed , to get solder joints of high reliability , therefore, analyzed quality factors of affecting solder joint formation of SMT process , rationally designed experiment program , obtained relative experimental data , analysis of larger speciality signal noise ratios and means , obtained optimizing SMT technology parameter for new nickel palladium gold plating , according to optimize results, improving SMT technology parameter, successfully applied nickel palladium gold PCB to SMT process ,reduce cost, improve product quality, and achieved good economic benefit .

Influence of assembly parameters on lead-free solder joints reliability in Package-on-Package (PoP) technology

2015 ◽  
Vol 27 (3) ◽  
pp. 98-102 ◽  
Author(s):  
Janusz Sitek ◽  
Wojciech Stęplewski ◽  
Kamil Janeczek ◽  
Marek Kościelski ◽  
Krzysztof Lipiec ◽  
...  
Keyword(s):  
Solder Joints ◽  
Accelerated Aging ◽  
Lead Free ◽  
Process Window ◽  
Lead Free Solder ◽  
Solder Paste ◽  
Materials Selection ◽  
Content Type ◽  
Free Solder ◽  
Component Assembly

Purpose – The purpose of this paper is to evaluate the influence of assembly parameters on lead-free solder joints reliability in Package-on-Package (PoP) Technology and demonstrate factors important for this issue. Design/methodology/approach – Two types of soldering materials and three different assembly procedures were used for assembly of PoP system. The reliability properties of assembled PoP systems were investigated using accelerated aging and periodic resistance measurements of daisy-chain solder joints systems. The purpose of such approach was to determine which soldering material (flux or solder paste) as well as which assembly process parameter (dipping depth of upper component in soldering material), would provide better reliability properties of the solder joints in the PoP system. Findings – It was stated that both selected flux and solder paste dedicated to assembly of PoP systems can be utilized in soldering of PoP applications. More reliable PoP systems applications require larger attention regarding materials selection and assembly parameters. It is recommended 50 per cent dipping depth of ball’s height into soldering material during upper PoP component assembly for more reliable applications. For less demanding PoP systems, the process window from 30 up to 70 per cent is acceptable. All observed failures after thermal shocks occurred in upper PoP components. Originality/value – This paper explains how materials and assembly parameters have influence on lead-free solder joints reliability in PoP systems. Especially, influence of process window for dipping procedure of upper components balls into soldering material was presented.

How Silver Powder Metallurgy Affects the Physical Properties of Low Temperature Firing Silver Conductor

2011 ◽  
Vol 2011 (1) ◽  
pp. 000099-000106 ◽  
Author(s):  
Samson Shahbazi ◽  
Mark Challingsworth
Keyword(s):  
Powder Metallurgy ◽  
Thick Film ◽  
Silver Powder ◽  
Lead Free ◽  
Lead Free Solder ◽  
Pure Silver ◽  
Solder Alloys ◽  
Film Conductor ◽  
Free Solder ◽  
Lead Free Solders

With the implementation of RoHS (the Restriction of Hazardous Substance) Directive banning the use of Lead, Cadmium, Mercury and Hexavalent Chromium, hybrid microelectronic manufacturers are globally embracing the lead free movement. These manufacturers must not only understand the implications of their material choice but must be aware of the interaction between lead free solder alloys and their RoHS compliant thick film materials. It is commonly known that lead free solder alloys process at much higher reflow temperatures than lead containing solder which can directly impact the fired film leach resistance and the loss of adhesion. There are also other concerns; lead free solders alloys generally require a different organic flux system to promote wetting and reflow, but this change may cause a fired film conductor to leach more easily than the flux used in the lead containing solders. The use of lead free solders such as SAC305, SAC405 or 95/5 on a low firing (550–570 °C) pure silver conductor has the tendency of leaching the fired film more readily than conductors containing small amounts of palladium or platinum. Many of these situations provide new challenges for the hybrid circuit manufacturer. There is little information available regarding the effects of the lead free solders on low firing silver thick film conductors. This paper discusses the results of a newly developed Pb and Cd free silver thick film conductor paste with a modified silver powder metallurgy to improve the leach resistance, solder acceptance and adhesion using lead free solder. In addition, the pure silver conductor was fired on top of a low temperature dielectric paste. This conductor was evaluated by comparing lead free solder alloys to traditional tin-lead-silver solder alloys. This study included evaluations based on SEM photos, solderability, leach resistance, and initial and long term adhesions. Results are published describing the difference in behavior between the different solder alloys in conjunction with the different silver powder metallurgy.

Investigation of the Effects of High Temperature Aging on Mechanical Behavior and Microstructural Changes in Lead Free Solders

2019 ◽  
Author(s):  
Jing Wu ◽  
Mohammad S. Alam ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Ostwald Ripening ◽  
Solder Joints ◽  
Particle Diameter ◽  
Lead Free ◽  
Average Particle ◽  
Lead Free Solder ◽  
Aging Effects ◽  
Sac305 Solder ◽  
Free Solder

Abstract Aging effects are common in lead free solder joints within electronic assemblies that are exposed to isothermal environments for extended periods. Such exposures lead to evolution of the solder microstructure, which results in changes in the mechanical properties and creep behavior of the solder joints. In our recent investigations, we have been utilizing Scanning Electron Microscopy (SEM) to better understand aging induced degradations. The microstructural evolutions were observed in SAC305 and SAC_Q (SAC+Bi) alloys exposed to isothermal conditions at T = 125 °C for several different regions from several different joints. The microstructures in several fixed regions of interest were recorded after predetermined time intervals of aging, which were 1 hour (up to 24 hours) and 10 hours (up to 150 hours) for the short term aging samples; and 250 hours (up to 2500 hours) for the long term aging samples. Using the recorded images and imaging processing software, the area and diameter of each IMC particle was tracked during the aging process. As expected, the quantitative analysis of the evolving SAC_Q microstructure showed that the particles coalesced during aging leading to a decrease in the number of particles. This caused an increase in the average diameter of the particles of slightly more than 100% for long term aging of 2500 hours. For SAC305, the average particle diameter was found to increase at three times the rate (increase of 200% after 2500 hours of aging). Thus, coarsening of IMC particles was greatly mitigated in the SAC_Q alloy relative to that observed in SAC305. Immediately after reflow solidification, Bismuth rich phases were present in the SAC_Q joints. During aging at T = 125 °C, the bismuth was observed to quickly go into solution both within the beta-Sn dendrites and in the intermetallic rich regions between dendrites. This resulted in solid solution strengthening of the lead free solder. It was also found that the aging-induced presence of bismuth in solution within the beta-Sn matrix provided an increased resistance to the Ostwald ripening diffusion process that coarsens the Ag3Sn IMC particles. The combination of these two effects in the SAC+Bi alloy lead to greatly improved resistance to aging induced effects relative to the SAC305 solder alloy. Finally, we have compared the time dependent evolution of microstructure with the degradation in strength during aging for of the two solder alloys, and good correlations were observed.

Study of Lead Free Solder Joints Subjected to Isothermal Mechanical Shear Cycling

2020 ◽  
Author(s):  
Mohd Aminul Hoque ◽  
Mohammad Ashraful Haq ◽  
Jeffrey C. Suhling ◽  
Pradeep Lall
Keyword(s):  
Printed Circuit Boards ◽  
Solder Joints ◽  
Polarized Light ◽  
Lead Free ◽  
Lead Free Solder ◽  
Circuit Boards ◽  
Sac305 Solder ◽  
Mechanical Cycling ◽  
Before And After ◽  
Free Solder

Abstract Electronic packages are usually subjected to varying temperature conditions, thus subjecting the package to thermal cyclic loadings. As the different components of the package are made up of materials of different Coefficients of Thermal Expansion (CTE), the thermal cyclic loading brings about fluctuating shear stress to arise within the package, ultimately leading to its failure. It has been seen in previous literature that the recrystallization assisted cracking is a major factor that leads to the failure of solder joints when subjected to thermomechanical cycles. In this study, the authors have tried to determine whether the mechanical shear cycling of aged and non-aged samples of SAC305 lead free solder joints undergo a recrystallization phase before its ultimate failure. Arrays (3 × 3) of SAC305 solder joints of roughly 750μm in diameter were reflowed in between two FR-4 printed circuit boards to create a sandwiched structural sample. The samples were then polished to expose the solder joints. A polarized light microscope was utilized to capture the images of the joints before and after the mechanical cycling and analyzed to observe any changes in the microstructure in the form of recrystallization of the tin grains.

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