The Integration of 3D Seismic With the Ultrahigh Resolution Data From the Marine Survey: Recognizing and Quantifying Several Challenging Features for Subsea Production Installations in Complex Environment Offshore Brazil

2015 ◽  
Author(s):  
Federico D. Martin ◽  
Luis F. Batalla ◽  
Rafaela L. De Oliveira Pinheiro ◽  
Luis G. Escalona ◽  
Seif El Mistikawi ◽  
...  
2007 ◽  
Vol 34 (5) ◽  
pp. 1712-1723 ◽  
Author(s):  
T. G. Flohr ◽  
K. Stierstorfer ◽  
C. Süß ◽  
B. Schmidt ◽  
A. N. Primak ◽  
...  

2016 ◽  
Vol 35 (7) ◽  
pp. 594-599 ◽  
Author(s):  
Brian N. Brookshire ◽  
Craig Lippus ◽  
Abby Parish ◽  
Brandon Mattox ◽  
Allen Burks

Author(s):  
T. Kaneyama ◽  
M. Naruse ◽  
Y. Ishida ◽  
M. Kersker

In the field of materials science, the importance of the ultrahigh resolution analytical electron microscope (UHRAEM) is increasing. A new UHRAEM which provides a resolution of better than 0.2 nm and allows analysis of a few nm areas has been developed. [Fig. 1 shows the external view] The followings are some characteristic features of the UHRAEM.Objective lens (OL)Two types of OL polepieces (URP for ±10' specimen tilt and ARP for ±30' tilt) have been developed. The optical constants shown in the table on the next page are figures calculated by the finite element method. However, Cs was experimentally confirmed by two methods (namely, Beam Tilt method and Krivanek method) as 0.45 ∼ 0.50 mm for URP and as 0.9 ∼ 1.0 mm for ARP, respectively. Fig. 2 shows an optical diffractogram obtained from a micrograph of amorphous carbon with URP under the Scherzer defocus condition. It demonstrates a resolution of 0.19 nm and a Cs smaller than 0.5 mm.


Author(s):  
Keiichi Tanaka

With the development of scanning electron microscope (SEM) with ultrahigh resolution, SEM became to play an important role in not only cytology but also molecular biology. However, the preparation methods observing tiny specimens with such high resolution SEM are not yet established.Although SEM specimens are usually coated with metals for getting electrical conductivity, it is desirable to avoid the metal coating for high resolution SEM, because the coating seriously affects resolution at this level, unless special coating techniques are used. For avoiding charging effect without metal coating, we previously reported a method in which polished carbon plates were used as substrate. In the case almost all incident electrons penetrate through the specimens and do not accumulate in them, when the specimens are smaller than 10nm. By this technique some biological macromolecules including ribosomes, ferritin, immunoglobulin G were clearly observed.Unfortunately some other molecules such as apoferritin, thyroglobulin and immunoglobulin M were difficult to be observed only by the method, because they had very low contrast and were easily damaged by electron beam.


Author(s):  
K. Fukushima ◽  
T. Kaneyama ◽  
F. Hosokawa ◽  
H. Tsuno ◽  
T. Honda ◽  
...  

Recently, in the materials science field, the ultrahigh resolution analytical electron microscope (UHRAEM) has become a very important instrument to study extremely fine areas of the specimen. The requirements related to the performance of the UHRAEM are becoming gradually severer. Some basic characteristic features required of an objective lens are as follows, and the practical performance of the UHRAEM should be judged by totally evaluating them.1) Ultrahigh resolution to resolve ultrafine structure by atomic-level observation.2) Nanometer probe analysis to analyse the constituent elements in nm-areas of the specimen.3) Better performance of x-ray detection for EDS analysis, that is, higher take-off angle and larger detection solid angle.4) Higher specimen tilting angle to adjust the specimen orientation.To attain these requirements simultaneously, the objective lens polepiece must have smaller spherical and chromatic aberration coefficients and must keep enough open space around the specimen holder in it.


Author(s):  
K. Siangchaew ◽  
J. Bentley ◽  
M. Libera

Energy-filtered electron-spectroscopic TEM imaging provides a new way to study the microstructure of polymers without heavy-element stains. Since spectroscopic imaging exploits the signal generated directly by the electron-specimen interaction, it can produce richer and higher resolution data than possible with most staining methods. There are basically two ways to collect filtered images (fig. 1). Spectrum imaging uses a focused probe that is digitally rastered across a specimen with an entire energy-loss spectrum collected at each x-y pixel to produce a 3-D data set. Alternatively, filtering schemes such as the Zeiss Omega filter and the Gatan Imaging Filter (GIF) acquire individual 2-D images with electrons of a defined range of energy loss (δE) that typically is 5-20 eV.


Author(s):  
Fan Hai-fu ◽  
Hao Quan ◽  
M. M. Woolfson

AbstractConventional direct methods, which work so well for small structures, are less successful for macromolecules. Where it has been demonstrated that a solution might be found using direct methods it is then found that the usual figures of merit are unable to distinguish the few good sets of phases from the large number of sets generated. The reasons for the difficulties with very large structures are considered from a first-principles approach taking into account both the factors of having a large number of atoms and low resolution data. A proposal is made for trying to recognize good phase sets by taking a large structure as a sum of a number of smaller structures for each of which a conventional figure of merit can be applied.


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