THE ULTRA STRUCTURE OF INSECT SURFACES BY SCANNING ELECTRON MICROSCOPY
Keyword(s):
A recent development in microscopy certain to be of great interest to entomologists is the Scanning Electron Microscope. This machine overcomes the difficulties of studying solid surfaces with a standard light microscope and the problems of the extremely small limits of penetration of the electron microscope. This new microscope focuses a stream of electrons into a beam as small as 1 μ in diameter which moves over the surface of the specimen in a regular pattern, causing secondary radiations to emerge from the surface of the specimen. These are collected by a very sensitive detector and converted to an image similar to that produced by a television tube.
1986 ◽
Vol 25
(4)
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pp. 690-696
1991 ◽
Vol 49
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pp. 478-479
2020 ◽
pp. 176-182
1972 ◽
Vol 3
(3)
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pp. 181-188
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