Ferroelectric and Leakage Current Properties of a BiFeO$_{3}$-BaTiO$_{3}$ Solid Solution Prepared by Using Pulsed Laser Deposition

2015 ◽  
Vol 65 (6) ◽  
pp. 550-554
Author(s):  
M. H. LEE ◽  
D. J. KIM ◽  
J. S. PARK ◽  
M.-H. KIM ◽  
T. K. SONG* ◽  
...  
Keyword(s):  
Solid Solution ◽  
Pulsed Laser Deposition ◽  
Leakage Current ◽  
Pulsed Laser ◽  
Laser Deposition

Epitaxial Stabilization of Complete Solid-solution β-(AlxGa1–x)2O3 (100) Films by Pulsed-laser Deposition

2021 ◽  
Author(s):  
Ryo Wakabayashi ◽  
Kohei Yoshimatsu ◽  
Mai Hattori ◽  
Jung-Soo Lee ◽  
Osami Sakata ◽  
...  
Keyword(s):  
Solid Solution ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Complete Solid Solution

Pulsed laser deposition of novel nitride solid solution films NixTi1−xNy on MgO(0 0 1)

2002 ◽  
Vol 199 (1-4) ◽  
pp. 303-306 ◽  
Author(s):  
Koyo Sakamoto ◽  
Kei Inumaru ◽  
Shoji Yamanaka
Keyword(s):  
Solid Solution ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition

Pulsed Laser Deposition of Bi4Ti3O12 Thin Films on Indium Tin Oxide Coated Glass

1994 ◽  
Vol 343 ◽  
Author(s):  
H-J. Cho ◽  
William Jo ◽  
T. W. Noh
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Leakage Current ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Chemical Compositions ◽  
Coated Glass

ABSTRACTBi4Ti3O12 thin films have been grown on indium tin oxide coated glass by pulsed laser deposition. The films are rapidly thermal annealed at 650 °C in various kinds of ambients. X-ray diffraction and scanning electron microscopy are used to investigate crystallization and microstructures, respectively. Using Auger electron microscopy, chemical compositions and depth profiles are examined. Optical and current-voltage characteristics measurements of the films show that their transmittance and leakage current behaviors are strongly dependent upon the microstructures. O2 partial pressure in the rapid thermal annealing process is found to be an important parameter which determines crystallization, microstructures, and leakage current behaviors of the Bi4Ti3O12 thin films.

Hard x-ray photoemission spectroscopy in wurtzite-type zinc magnesium oxide solid-solution films grown by pulsed-laser deposition

2008 ◽  
Vol 92 (23) ◽  
pp. 232108 ◽  
Author(s):  
Takeo Ohsawa ◽  
Naoki Ohashi ◽  
Yutaka Adachi ◽  
Isao Sakaguchi ◽  
Haruki Ryoken ◽  
...  
Keyword(s):  
Solid Solution ◽  
Pulsed Laser Deposition ◽  
Magnesium Oxide ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Photoemission Spectroscopy ◽  
X Ray ◽  
Oxide Solid Solution ◽  
Zinc Magnesium Oxide

Ferroelectric, piezoelectric, and leakage current properties of (K0.48Na0.48Li0.04)(Nb0.775Ta0.225)O3 thin films grown by pulsed laser deposition

2011 ◽  
Vol 98 (2) ◽  
pp. 022902 ◽  
Author(s):  
D. Y. Wang ◽  
D. M. Lin ◽  
K. W. Kwok ◽  
N. Y. Chan ◽  
J. Y. Dai ◽  
...  
Keyword(s):  
Thin Films ◽  
Pulsed Laser Deposition ◽  
Leakage Current ◽  
Pulsed Laser ◽  
Laser Deposition

scholarly journals The influence of plasma dynamics on the growth of Sm0.55Nd0.45NiO3 solid solution during pulsed laser deposition

2011 ◽  
Vol 72 (11) ◽  
pp. 1218-1224 ◽  
Author(s):  
B.D. Ngom ◽  
S. Lafane ◽  
A. Dioum ◽  
N. Manyala ◽  
S. Abdelli-Messaci ◽  
...  
Keyword(s):  
Solid Solution ◽  
Pulsed Laser Deposition ◽  
Pulsed Laser ◽  
Laser Deposition ◽  
Plasma Dynamics
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