Time-dependent effect on electron beam irradiation of Cu-In-Se precursors by using the DC co-sputtering method

2012 ◽  
Vol 61 (1) ◽  
pp. 22-26 ◽  
Author(s):  
Chaehwan Jeong ◽  
Jin Hyeok Kim
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Time Dependent ◽  
Beam Irradiation ◽  
Dependent Effect ◽  
Time Dependent Effect

Time-dependent charge distributions in polymer films under electron beam irradiation

2008 ◽  
Vol 104 (12) ◽  
pp. 124904 ◽  
Author(s):  
Masaaki Yasuda ◽  
Yasuaki Kainuma ◽  
Hiroaki Kawata ◽  
Yoshihiko Hirai ◽  
Yasuhiro Tanaka ◽  
...  
Keyword(s):  
Electron Beam ◽  
Polymer Films ◽  
Electron Beam Irradiation ◽  
Time Dependent ◽  
Beam Irradiation ◽  
Charge Distributions

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

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