Observation of Domain Wall Structures in Triglycine Sulfate byUsing Scanning Probe Microscopy

2009 ◽  
Vol 55 (2(1)) ◽  
pp. 746-748 ◽  
Author(s):  
Makoto Iwata ◽  
Fumihiko Itoh ◽  
Takuma Morishita ◽  
Rintaro Aoyagi ◽  
Masaki Maeda ◽  
...  
Keyword(s):  
Domain Wall ◽  
Scanning Probe Microscopy ◽  
Triglycine Sulfate ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Wall Structures

scholarly journals Domain wall magnetoresistance in BiFeO3thin films measured by scanning probe microscopy

2017 ◽  
Vol 29 (33) ◽  
pp. 334003 ◽  
Author(s):  
N Domingo ◽  
S Farokhipoor ◽  
J Santiso ◽  
B Noheda ◽  
G Catalan
Keyword(s):  
Domain Wall ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

scholarly journals Origin of piezoelectric response under a biased scanning probe microscopy tip across a 180∘ferroelectric domain wall

2012 ◽  
Vol 86 (13) ◽  
Author(s):  
Shiming Lei ◽  
Eugene A. Eliseev ◽  
Anna N. Morozovska ◽  
Ryan C. Haislmaier ◽  
Tom T. A. Lummen ◽  
...  
Keyword(s):  
Domain Wall ◽  
Scanning Probe Microscopy ◽  
Ferroelectric Domain ◽  
Scanning Probe ◽  
Piezoelectric Response ◽  
Probe Microscopy

The Role of Scanning Probe Microscopy in Drug Delivery Research

1996 ◽  
Vol 13 (3-4) ◽  
pp. 225-256 ◽  
Author(s):  
Kevin M. Shakesheff ◽  
Martyn C. Davies ◽  
Clive J. Roberts ◽  
Saul J. B. Tendler ◽  
Philip M. Williams
Keyword(s):  
Drug Delivery ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy

Extending Electrical Scanning Probe Microscopy Measurements of Semiconductor Devices Using Microwave Impedance Microscopy

2015 ◽  
Author(s):  
Benedict Drevniok ◽  
St. John Dixon-Warren ◽  
Oskar Amster ◽  
Stuart L Friedman ◽  
Yongliang Yang
Keyword(s):  
Scanning Probe Microscopy ◽  
Semiconductor Devices ◽  
Cmos Image Sensor ◽  
Image Sensor ◽  
Scanning Probe ◽  
Cross Sectional ◽  
Probe Microscopy ◽  
Dopant Profiling ◽  
Capacitance Voltage

Abstract Scanning microwave impedance microscopy was used to analyze a CMOS image sensor sample to reveal details of the dopant profiling in planar and cross-sectional samples. Sitespecific capacitance-voltage spectroscopy was performed on different regions of the samples.

Sign in / Sign up

Export Citation Format

Share Document