Combined scanning probe microscopy and electron microscopy study of microstructure evolution in copper processed by equal channel angular pressing

2003 ◽  
Vol 94 (8) ◽  
pp. 938-942 ◽  
Author(s):  
Eugen Rabkin ◽  
David Gorni ◽  
Itamar Gutman ◽  
Eli Buchman ◽  
Michael Kazakevich
Keyword(s):  
Electron Microscopy ◽  
Equal Channel Angular Pressing ◽  
Microstructure Evolution ◽  
Scanning Probe Microscopy ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Angular Pressing

A Transmission Electron Microscopy Study of the Role of Sc+Zr Addition to a 6082-T8 Alloy Subjected to Equal Channel Angular Pressing

2006 ◽  
Vol 503-504 ◽  
pp. 841-846 ◽  
Author(s):  
Marcello Cabibbo ◽  
E. Evangelista ◽  
C. Scalabroni ◽  
Ennio Bonetti
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Equal Channel Angular Pressing ◽  
True Strain ◽  
Microscopy Study ◽  
Electron Microscopy Study ◽  
Angular Pressing ◽  
Transmission Electron ◽  
Parent Alloy

The microstructural evolution with strain was investigated either in a Zr-modified 6082 Al-Mg-Si alloy and in the same alloy added with 0.117wt.% Sc, subjected to severe plastic deformations. Materials were deformed by equal-channel angular pressing using route BC, up to a true strain of ∼12. A strain of ~4 produced a sub-micrometer scale microstructure with very fine cells (nanometer scale) in the grain interior. The role of fine dispersoids (Al3(Sc1-x,Zrx)) was investigated by transmission electron microscopy techniques and discussed. Dispersoids were responsible for a more complex dislocation substructure with strain. Compared to the commercial parent alloy, block wall formation and propagation were favored by the presence of Sc-Zr containing dispersoids, while cell boundary evolution was less affected, compared to the commercial parent alloy. Mean misorientation across block walls increased with strain much more in the Sc-Zr containing alloy, reaching a plateau, starting from a true strain of ∼8. Misorientation across cell boundaries continuously increased to ∼8° and ∼5° for the Sc-Zr and Zr containing alloy, respectively.

Conductive paths through polycrystalline BaTiO3: Scanning probe microscopy study

2016 ◽  
Vol 109 (7) ◽  
pp. 072904 ◽  
Author(s):  
Talin Ayvazian ◽  
Gennadi Bersuker ◽  
Zachary R. Lingley ◽  
Miles J. Brodie ◽  
Brendan J. Foran
Keyword(s):  
Scanning Probe Microscopy ◽  
Microscopy Study ◽  
Scanning Probe ◽  
Probe Microscopy

2013 Microscopy Today Innovation Awards

2013 ◽  
Vol 21 (5) ◽  
pp. 40-45
Keyword(s):  
Electron Microscopy ◽  
Light Microscopy ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Analysis Methods ◽  
Microscopy Analysis ◽  
Ion Microscopy ◽  
Microscopy Techniques

Microscopy Today congratulates the fourth annual group of Innovation Award winners. The ten innovations described below move several microscopy techniques forward: light microscopy, scanning probe microscopy, electron microscopy, ion microscopy, and hybrid microscopy-analysis methods. These innovations will make imaging and analysis more powerful, more flexible, more productive, and easier to accomplish.

A Scanning Probe Microscopy Study of Cd1−x Zn x Te

2009 ◽  
Vol 38 (8) ◽  
pp. 1528-1532 ◽  
Author(s):  
C. K. Egan ◽  
P. Dabrowski ◽  
Z. Klusek ◽  
A. W. Brinkman
Keyword(s):  
Scanning Probe Microscopy ◽  
Microscopy Study ◽  
Scanning Probe ◽  
Probe Microscopy
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