Standard for automatic test markup language (ATML) test configuration

Mapping Intimacies ◽

10.3403/30333154u ◽

2016 ◽

Keyword(s):

Markup Language ◽

Automatic Test ◽

Test Configuration

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IEEE Standard for Automatic Test Markup Language (ATML) Test Configuration

10.1109/ieeestd.2014.6808402 ◽

2014 ◽

Keyword(s):

Markup Language ◽

Automatic Test ◽

Test Configuration ◽

Ieee Standard

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Standard for automatic test markup language (ATML) test configuration

10.3403/30333154 ◽

2016 ◽

Keyword(s):

Markup Language ◽

Automatic Test ◽

Test Configuration

Download Full-text

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via eXtensible Markup Language (XML): Exchanging Test Configuration Information

10.1109/ieeestd.2008.4509494 ◽

2007 ◽

Keyword(s):

Extensible Markup Language ◽

Markup Language ◽

Automatic Test ◽

Test Configuration ◽

Test Information ◽

Extensible Markup ◽

Ieee Standard ◽

Configuration Information

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IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

10.1109/ieeestd.2016.7452515 ◽

2016 ◽

Keyword(s):

Markup Language ◽

Automatic Test ◽

Test Configuration ◽

International Standard

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IEEE standard for automatic test markup language (ATML) for exchanging automatic test equipment and test information via XML

10.3403/30257785 ◽

2012 ◽

Keyword(s):

Test Equipment ◽

Markup Language ◽

Automatic Test Equipment ◽

Automatic Test ◽

Test Information ◽

Ieee Standard

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Standard for automatic test markup language (ATML) test station description

10.3403/30333161u ◽

2016 ◽

Keyword(s):

Markup Language ◽

Automatic Test

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IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

10.1109/ieeestd.2013.6809830 ◽

2008 ◽

Keyword(s):

Markup Language ◽

Automatic Test ◽

Test Information ◽

Ieee Standard

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High-Speed Digital Bus Testing using Automatic Test- Markup Language (ATML)

2019 IEEE AUTOTESTCON ◽

10.1109/autotestcon43700.2019.8961055 ◽

2019 ◽

Author(s):

Daniel Coons ◽

Willice Doyle ◽

Mike Lee ◽

Jae-il Shin

Keyword(s):

High Speed ◽

Markup Language ◽

Automatic Test

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Experimental applications of Automatic Test Markup Language (ATML)

2012 IEEE AUTOTESTCON Proceedings ◽

10.1109/autest.2012.6334532 ◽

2012 ◽

Cited By ~ 1

Author(s):

Chatwin A. Lansdowne ◽

Chris Gorringe ◽

Patrick McCartney

Keyword(s):

Markup Language ◽

Automatic Test

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IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description

10.1109/ieeestd.2016.7454655 ◽

2016 ◽

Keyword(s):

Markup Language ◽

Automatic Test ◽

International Standard

Download Full-text