scholarly journals Detection of Anti-Counterfeiting Markers through Permittivity Maps Using a Micrometer Scale near Field Scanning Microwave Microscope

Sensors ◽  
2021 ◽  
Vol 21 (16) ◽  
pp. 5463
Author(s):  
José D. Gutiérrez-Cano ◽  
José M. Catalá-Civera ◽  
Pedro J. Plaza-González ◽  
Felipe L. Peñaranda-Foix

This paper describes the use of microwave technology to identify anti-counterfeiting markers on banknotes. The proposed method is based on a robust near-field scanning microwave microscope specially developed to measure permittivity maps of heterogeneous paper specimens at the micrometer scale. The equipment has a built-in vector network analyzer to measure the reflection response of a near-field coaxial probe, which makes it a standalone and portable device. A new approach employing the information of a displacement laser and the cavity perturbation technique was used to determine the relationship between the dielectric properties of the specimens and the resonance response of the probe, avoiding the use of distance-following techniques. The accuracy of the dielectric measurements was evaluated through a comparative study with other well-established cavity methods, revealing uncertainties lower than 5%, very similar to the accuracy reported by other more sophisticated setups. The device was employed to determine the dielectric map of a watermark on a 20 EUR banknote. In addition, the penetration capabilities of microwave energy allowed for the detection of the watermark when concealed behind dielectric or metallic layers. This work demonstrates the benefits of this microwave technique as a novel method for identifying anti-counterfeiting features, which opens new perspectives with which to develop optically opaque markers only traceable through this microwave technique.

Author(s):  
Jeff Dunnihoo ◽  
Pasi Tamminen ◽  
Toni Viheriäkoski

Abstract In this study we present a novel method to use a field collapse method together with fully automated near field scanning equipment to construct E- and H-field information of a system during transient ESD events. This inexpensive method provides an alternative way for system designers to validate and analyze the EMC/ESD capability of electronic systems without TLP pulsers, ESD simulators, or precision inductive current probes.


AIP Advances ◽  
2014 ◽  
Vol 4 (4) ◽  
pp. 047114 ◽  
Author(s):  
Z. Wu ◽  
A. D. Souza ◽  
B. Peng ◽  
W. Q. Sun ◽  
S. Y. Xu ◽  
...  

Author(s):  
Lajmi Fatma ◽  
Jalel Ghabi ◽  
Hedi Dhouibi

In this article, the authors propose a new approach for modelling and failure analysis by combining the graphical representation provided by Petri nets and fuzzy logic. The graphical method is used for describing the relationship between conditions and events. The use of Petri nets in failure analysis enables replacing logic gate functions in fault trees. The Fuzzy logic technique allows natural language descriptions of process entities as well as an if-then rule-based definition of production. In addition, this study devises an alternative, a trapezoidal graph method in order to account for failure scenarios. Examples validating this novel method in dealing with failure analysis are also provided.


2009 ◽  
Vol 109 (8) ◽  
pp. 958-962 ◽  
Author(s):  
Jongchel Kim ◽  
Arsen Babajanyan ◽  
Tigran Sargsyan ◽  
Harutyun Melikyan ◽  
Seungwan Kim ◽  
...  

2006 ◽  
Vol 499 (1-2) ◽  
pp. 318-321 ◽  
Author(s):  
Miehwa Park ◽  
Hyunjun Yoo ◽  
Hyungun Yoo ◽  
Seungwook Na ◽  
Songhui Kim ◽  
...  

2006 ◽  
Vol 321-323 ◽  
pp. 1040-1043
Author(s):  
Kie Jin Lee ◽  
Arsen Babajayan ◽  
Song Hui Kim

A near-field scanning microwave microscope (NSMM) is used to study the physical properties of DNA strands with a specific sequence and image lamda-DNA bundles. After the hybridization process between target and capture sequences, specific DNA binding events leads to microwave reflection coefficient (S11) changes of the NSMM. These changes are caused by a modification of the physical dielectric constant due to sequence specific DNA binding. This study demonstrates significant potential of the NSMM as a nondestructive and noncontact tool to detect DNA strands without a target-probe amplification process and as a valuable technique to understand the physical property of DNA.


2003 ◽  
Vol 83 (5) ◽  
pp. 1026-1028 ◽  
Author(s):  
Jooyoung Kim ◽  
Myungsick Kim ◽  
Hyun Kim ◽  
Doohee Song ◽  
Kiejin Lee ◽  
...  

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