scholarly journals Plasma Supported Deposition of Amorphous Hydrogenated Carbon (a-C:H) on Polyamide 6: Determining Interlayer Completion and Dehydrogenation Effects during Layer Growth

Polymers ◽  
2021 ◽  
Vol 13 (11) ◽  
pp. 1886
Author(s):  
Torben Schlebrowski ◽  
Henriette Lüber ◽  
Lucas Beucher ◽  
Melanie Fritz ◽  
Youssef Benjillali ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Vapor ◽  
Polyamide 6 ◽  
Carbon Layer ◽  
Layer Growth ◽  
Ex Situ ◽  
X Ray ◽  
Force Microscopy ◽  
Angle Measurements ◽  
Diffuse Reflectance Infrared

Polyamide 6 (PA6) is a commonly used material in many different sectors of modern industry. Herein, PA6 samples were coated with amorphous carbon layers (a-C:H) with increasing thickness up to 2 µm using radio frequency plasma enhanced chemical vapor deposition for surface adjustment. The morphology of the carbon coatings was inspected by ex situ atomic force microscopy and scanning electron microscopy. Surface wettability was checked by contact angle measurements. The chemical composition was analyzed using the surface sensitive synchrotron X-ray-based techniques near-edge X-ray absorption fine structure and X-ray photoelectron spectroscopy, supported by diffuse reflectance infrared Fourier transform spectroscopy. Particular attention was paid to the coating interval from 0 to 100 nm, to specify the interlayer thickness between the PA6 polymer and a-C:H coating, and the region between 1000 and 2000 nm, where dehydrogenation of the a-C:H layer occurs. The interlayer is decisive for the linkage of the deposited carbon layer on the polymer: the more pronounced it is, the better the adhesion. The thickness of the interlayer could be narrowed down to 40 nm in all used methods, and the dehydrogenation process takes place at a layer thickness of 1500 nm.

scholarly journals Refinement of Sustainable Polybutylene Adipate Terephthalate (PBAT) with Amorphous Hydrogenated Carbon Films (a-C:H) Revealing Film Instabilities Influenced by a Thickness-Dependent Change of sp2/sp3 Ratio

Materials ◽  
2020 ◽  
Vol 13 (5) ◽  
pp. 1077 ◽  
Author(s):  
Torben Schlebrowski ◽  
Halima Acharchi ◽  
Barbara Hahn ◽  
Stefan Wehner ◽  
Christian B. Fischer
Keyword(s):  
Photoelectron Spectroscopy ◽  
Chemical Vapor ◽  
Carbon Films ◽  
Organic Polymer ◽  
X Ray ◽  
Angle Measurements ◽  
Dependent Change ◽  
Contact Angle Measurements ◽  
Diffuse Reflectance Infrared ◽  
Amorphous Hydrogenated Carbon

The increasing use of polymers is related to a growing disposal problem. Switching to biodegradable polymers such as polybutylene adipate terephthalate (PBAT) is a feasible possibility, but after industrial production of commercially available material PBAT is not suitable for every application. Therefore, surface refinements with amorphous hydrogenated carbon films (a-C:H) produced by plasma-assisted chemical vapor deposition (PE-CVD) changing the top layer characteristics are used. Here, 50 µm-thick PBAT films are coated with a-C:H layers up to 500 nm in 50 nm steps. The top surface sp2/sp3 bonding ratios are analyzed by X-ray photoelectron spectroscopy (XPS) and near-edge X-ray absorption fine structure (NEXAFS) both synchrotron-based. In addition, measurements using diffuse reflectance infrared Fourier transform spectroscopy (DRIFT) were performed for detailed chemical composition. Surface topography was analyzed by scanning electron microscopy (SEM) and the surface wettability by contact angle measurements. With increasing a-C:H layer thickness not only does the topography change but also the sp2 to sp3 ratio, which in combination indicates internal stress-induced phenomena. The results obtained provide a more detailed understanding of the mostly inorganic a-C:H coatings on the biodegradable organic polymer PBAT via in situ growth and stepwise height-dependent analysis.

Nitrogen (N2) Implantation to Suppress Growth of Interfacial Oxide in Mocvd Bst and Sputtered Bst Films

1999 ◽  
Vol 567 ◽  
Author(s):  
Renee Nieh ◽  
Wen-Jie Qi ◽  
Yongjoo Jeon ◽  
Byoung Hun Lee ◽  
Aaron Lucas ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Interfacial Layer ◽  
Gate Dielectric ◽  
Nitrogen Concentration ◽  
Chemical Vapor ◽  
Future Generation ◽  
Oxide Thickness ◽  
Layer Growth ◽  
X Ray ◽  
Bst Films

ABSTRACTBa0.5Sr0.5TiO3 (BST) is one of the high-k candidates for replacing SiO2 as the gate dielectric in future generation devices. The biggest obstacle to scaling the equivalent oxide thickness (EOT) of BST is an interfacial layer, SixOy, which forms between BST and Si. Nitrogen (N2) implantation into the Si substrate has been proposed to reduce the growth of this interfacial layer. In this study, capacitors (Pt/BST/Si) were fabricated by depositing thin BST films (50Å) onto N2 implanted Si in order to evaluate the effects of implant dose and annealing conditions on EOT. It was found that N2 implantation reduced the EOT of RF magnetron sputtered and Metal Oxide Chemical Vapor Deposition (MOCVD) BST films by ∼20% and ∼33%, respectively. For sputtered BST, an implant dose of 1×1014cm−;2 provided sufficient nitrogen concentration without residual implant damage after annealing. X-ray photoelectron spectroscopy data confirmed that the reduction in EOT is due to a reduction in the interfacial layer growth. X-ray diffraction spectra revealed typical polycrystalline structure with (111) and (200) preferential orientations for both films. Leakage for these 50Å BST films is on the order of 10−8 to 10−5 A/cm2—lower than oxynitrides with comparable EOTs.

Atomic Hydrogen Effects on the Optical and Electrical Properties of Transparent Conducting Oxides For a-Si:H TFT-LCDs

1996 ◽  
Vol 424 ◽  
Author(s):  
Je-Hsiung Lan ◽  
Jerzy Kanicki
Keyword(s):  
Indium Tin Oxide ◽  
Photoelectron Spectroscopy ◽  
Atomic Hydrogen ◽  
Chemical Vapor ◽  
Optical Transmittance ◽  
Ex Situ ◽  
Hydrogen Treatment ◽  
X Ray ◽  
Conducting Oxides ◽  
Before And After

AbstractThe effects of the atomic hydrogen treatment (H-treatment) of indium-tin oxide (ITO) and aluminum-doped zinc oxide (AZO) films have been investigated. The atomic hydrogen was generated by hot-wire chemical vapor deposition (HW-CVD) technique. Experimental results have shown that AZO films are chemically very stable under the H-treatment; almost no variation in the optical transmittance and electrical resistivity was observed. On the contrary, ITO films, either prepared by sputtering with ex-situ or in-situ thermal-annealing, have shown severe optical and electrical degradation and surface whitening after the H-treatment. SEM studies of the H-treated ITO surfaces have revealed that the surface whitening was due to the increase in surface roughness and the formation of granule-like metallic balls. Auger electron spectroscopy has indicated that the balls were mainly composed of indium atoms and the areas between balls were rich in oxygen atoms. These results were confirmed by X-ray diffraction and X-ray photoelectron spectroscopy measurements done on ITO before and after the H-treatment. Finally, we have demonstrated that a-SiO, deposited by PECVD will completely suppress the chemical reaction between ITO surfaces and atomic hydrogen generated by HW-CVD technique.

scholarly journals Зависимость топологии эпитаксиальных слоев PbSnTe:In от концентрации In

2021 ◽  
Vol 91 (6) ◽  
pp. 1038
Author(s):  
Д.В. Ищенко ◽  
А.Н. Акимов ◽  
И.О. Ахундов ◽  
В.А. Голяшов ◽  
А.Э. Климов ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Film Growth ◽  
Epitaxial Films ◽  
Ex Situ ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tin Telluride ◽  
Lead Tin Telluride ◽  
Statistical Indicators

The topology of the surface of epitaxial films of lead tin telluride solid solution, including those with the addition of indium (Pb1-xSnxTe:In), grown on single-crystal BaF2 (111) substrates and a CaF2/BaF2 buffer layer on Si (111) was studied by atomic force microscopy. It is shown that the characteristic statistical indicators of the relief are due to the peculiarities of film growth and the mechanism of incorporation of Indians, the excess content of which was registered on the surface ex situ by X-ray photoelectron spectroscopy.

scholarly journals Changing Contents of Carbon Hybridizations in Amorphous Hydrogenated Carbon Layers (a-C:H) on Sustainable Polyhydroxybutyrate (PHB) Exhibit a Significant Deterioration in Stability, Depending on Thickness

2019 ◽  
Vol 5 (3) ◽  
pp. 52 ◽  
Author(s):  
Torben Schlebrowski ◽  
Lucas Beucher ◽  
Hadi Bazzi ◽  
Barbara Hahn ◽  
Stefan Wehner ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Raw Materials ◽  
Chemical Vapor ◽  
Drift Spectroscopy ◽  
Significant Deterioration ◽  
X Ray ◽  
Diffuse Reflectance Infrared ◽  
X Ray Absorption ◽  
Amorphous Hydrogenated Carbon

PHB is a biodegradable polymer based on renewable raw materials that could replace synthetic polymers in many applications. A big advantage is the resulting reduction of the waste problem, as well as the conservation of fossil resources. To arrange it for various applications, the surface is arranged by plasma-enhanced chemical vapor deposition (PECVD) with amorphous hydrogenated carbon layers (a-C:H). Here, on a 50 µm thick PHB-foil, a-C:H layers of different thicknesses (0–500 nm) were deposited in 50 nm steps. Surface topography was investigated by scanning electron microscopy (SEM), chemical composition by diffuse reflectance infrared Fourier transform (DRIFT) spectroscopy and wettability checked by contact angle. In addition, layers were examined by synchrotron supported X-ray photoelectron spectroscopy (XPS) and near edge X-ray absorption fine structure (NEXAFS), which revealed thickness dependent changes of the sp2/sp3 ratio. With increasing thickness, even the topography changes show internal, stress-induced phenomena. The results obtained provide a more detailed understanding of the predominantly inorganic a-C:H coatings on (bio)polymers via in situ growth.

Blue/White Emission from Hydrogenated Amorphous Silicon Carbide Films Prepared by PECVD

2009 ◽  
Vol 1153 ◽  
Author(s):  
Volodymyr Ivashchenko ◽  
Andrey Vasin ◽  
L. A. Ivashchenko ◽  
P. L. Skrynskyy
Keyword(s):  
Silicon Carbide ◽  
Photoelectron Spectroscopy ◽  
Chemical Vapor ◽  
Substrate Bias ◽  
Double Peak ◽  
Hydrogenated Silicon ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
The One

AbstractPhotoluminescence (PL) from hydrogenated silicon carbide (SiC:H) films is studied at room temperature. The films were deposited by plasma-enhanced chemical vapor (PECVD) technique with and without substrate bias using methyltrichlorosilane as a main precursor. After the deposition the samples were annealed at various temperatures in vacuum. The films were characterized by atomic force microscopy (AFM), Fourier transform infrared spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS) and X-ray diffraction (XRD). The samples deposited without substrate bias (series A) were amorphous, whereas the samples deposited with negative substrate bias -100V (series B) were nanocrystalline. The one-peak (470 nm) and double-peak (415 and 437 nm) PL structures of the as-deposited samples A and B were observed, respectively. Annealing strongly enhanced intensity of PL of the samples B and trandformed PL spectrum from double-peak into broad featureless band with intensity at about 470 nm. The blue PL in as-deposited films B is supposed to be assigned to the radiative recombination in the sites located at the nanocrystallite surface, whereas the photo excitation of carries mostly occurs in nanocrystallite cores. A further increase in annealing temperature causes hydrogen effusion, which leads to an increase of the concentration of non-raidative recombination centers associated with dangling-bonds and as a result, to the quenching of PL.

scholarly journals Ice-Templated Cellulose Nanofiber Filaments as a Reinforcement Material in Epoxy Composites

Nanomaterials ◽  
2021 ◽  
Vol 11 (2) ◽  
pp. 490
Author(s):  
Tuukka Nissilä ◽  
Jiayuan Wei ◽  
Shiyu Geng ◽  
Anita Teleman ◽  
Kristiina Oksman
Keyword(s):  
Photoelectron Spectroscopy ◽  
Cellulose Nanofibers ◽  
Chemical Vapor ◽  
Cellulose Nanofiber ◽  
X Ray ◽  
The Matrix ◽  
Wide Availability ◽  
Spectroscopy Studies ◽  
Diffuse Reflectance Infrared ◽  
Cellulose Nanocomposites

Finding renewable alternatives to the commonly used reinforcement materials in composites is attracting a significant amount of research interest. Nanocellulose is a promising candidate owing to its wide availability and favorable properties such as high Young’s modulus. This study addressed the major problems inherent to cellulose nanocomposites, namely, controlling the fiber structure and obtaining a sufficient interfacial adhesion between nanocellulose and a non-hydrophilic matrix. Unidirectionally aligned cellulose nanofiber filament mats were obtained via ice-templating, and chemical vapor deposition was used to cover the filament surfaces with an aminosilane before impregnating the mats with a bio-epoxy resin. The process resulted in cellulose nanocomposites with an oriented structure and a strong fiber–matrix interface. Diffuse reflectance infrared Fourier transform and X-ray photoelectron spectroscopy studies revealed the presence of silane on the filaments. The improved interface, resulting from the surface treatment, was observable in electron microscopy images and was further confirmed by the significant increase in the tan delta peak temperature. The storage modulus of the matrix could be improved up to 2.5-fold with 18 wt% filament content and was significantly higher in the filament direction. Wide-angle X-ray scattering was used to study the orientation of cellulose nanofibers in the filament mats and the composites, and the corresponding orientation indices were 0.6 and 0.53, respectively, indicating a significant level of alignment.

Low-temperature growth of HfO2 dielectric layers by Plasma-Enhanced CVD

2003 ◽  
Vol 786 ◽  
Author(s):  
M. Losurdo ◽  
M.M. Giangregorio ◽  
M. Luchena ◽  
P. Capezzuto ◽  
G. Bruno ◽  
...  
Keyword(s):  
Photoelectron Spectroscopy ◽  
Growth Dynamics ◽  
Chemical Vapor ◽  
Optical Emission ◽  
Interface Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Dielectric Layers

ABSTRACTHfO2 dielectric layers have been grown on p -type Si(100) by plasma enhanced chemical vapor deposition (PE-CVD), using Ar-O2 plasmas and hafnium(IV) tetra-t -butoxide as precursors. In-situ control of the plasma phase is carried out by optical emission spectroscopy (OES) and quadrupolar mass spectrometry (QMS).Structural and optical properties of the HfO2 layers and of the HfO2/Si interface are investigated by spectroscopic ellipsometry (SE) in the photon energy range 1.5–6.0 eV‥ SE data are corroborated by results obtained from glancing incidence X-ray diffraction (GIXRD), atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS).The effect of the substrate temperature (RT-250°C) and precursor flow on the thickness of interfacial SiO2 layer and on the HfO2 microstructure is investigated. The growth dynamics of HfO2 film and SiO2 interface layer is also discussed.

scholarly journals Comparing the Influence of Residual Stress on Composite Materials Made of Polyhydroxybutyrate (PHB) and Amorphous Hydrogenated Carbon (a-C:H) Layers: Differences Caused by Single Side and Full Substrate Film Attachment during Plasma Coating

Polymers ◽  
2021 ◽  
Vol 13 (2) ◽  
pp. 184
Author(s):  
Torben Schlebrowski ◽  
Rachida Ouali ◽  
Barbara Hahn ◽  
Stefan Wehner ◽  
Christian B. Fischer
Keyword(s):  
Polymer System ◽  
Chemical Vapor ◽  
Plasma Coating ◽  
Carbon Layer ◽  
Intrinsic Stress ◽  
Ex Situ ◽  
Native Form ◽  
Single Side ◽  
Diffuse Reflectance Infrared ◽  
Amorphous Hydrogenated Carbon

Polyhydroxybutyrate (PHB) is a bio-based, biodegradable and commercially used polymer, which in its native form is unfortunately not generally applicable. A widely used technique to adapt polymers to a wider range of applications is the surface modification with amorphous hydrogenated carbon (a-C:H) layers, realized by plasma-enhanced chemical vapor deposition (PE-CVD). However, this process creates intrinsic stress in the layer–polymer system which can even lead to full layer failure. The aim of this study was to investigate how the carbon layer is affected when the basic polymer film to be coated can follow the stress and bend (single side attachment) and when it cannot do so because it is firmly clamped (full attachment). For both attachment methods, the a-C:H layers were simultaneously deposited on PHB samples. Ex-situ characterization was performed using a scanning electron microscope (SEM) for surface morphology and contact angle (CA) measurements for wettability. In addition, the stress prevailing in the layer was calculated using the Stoney equation. Diffuse reflectance infrared Fourier transform spectroscopy (DRIFT) measurements were used to investigate the chemical composition of the coating surface.

Sign in / Sign up

Export Citation Format

Share Document