scholarly journals Experimental Determination of the Effect of CaO and Al2O3 in Slag Systems Related to the Conversion Process of High Copper Matte Grade

Minerals ◽  
2019 ◽  
Vol 9 (11) ◽  
pp. 716
Author(s):  
Héctor Henao ◽  
Erik Kohnenkamp ◽  
Lisa Rojas ◽  
Alex Moyano
Keyword(s):  
Experimental Data ◽  
Electron Microscope ◽  
Matte Grade ◽  
Primary Phase ◽  
Conversion Process ◽  
Tubular Furnace ◽  
Primary Phase Field ◽  
X Ray ◽  
Scanning Electron

The slags generated in the conventional copper conversion process are mainly composed of Cu2O–Fe2O3–SiO2 with CaO, Al2O3, and MgO compounds—in concentrations up to 10 wt %. The present work contributes to the knowledge of the conversion process, generating experimental data for the phase diagrams of the Cu2O–Fe2O3–SiO2–Al2O3 and Cu2O–Fe2O3–SiO2–CaO systems. The experiments were carried out in a tubular furnace at temperatures of 1150 °C and 1200 °C, under a condition of saturation with tridymite and spinel. Once the equilibrium was reached, the samples were immediately quenched in water. The phases in the samples were observed through a scanning electron microscope (SEM) and the elemental composition of the phases were analyzed by means of energy-dispersive X-ray spectroscopy (EDS) detectors. The addition of Al2O3 and CaO into the Cu2O–Fe2O3–SiO2 system resulted in an appreciable displacement of the liquidus lines, corresponding to an expansion of the liquid in the tridymite primary phase field. The addition of CaO and Al2O3 combined was evaluated on industrial slags and from samples obtained in a Peirce–Smith furnace, with increasing amounts of CaO in the flux.

scholarly journals The use of scanning electron microscopy to the study of the painting from the Church in Radcze

2013 ◽  
Vol 12 (4) ◽  
pp. 095-105
Author(s):  
Beata Klimek
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Electron Microscope ◽  
Historic Buildings ◽  
X Ray ◽  
Composition And Structure ◽  
The Church ◽  
Diagnosis Technique ◽  
Scanning Electron

One of the main tasks in the study of historic buildings is the need to identify the original materials and extensions, which often have historic character. The next task concerns the determination of the composition and structure of the historical, diagnosis technique to develop original paint. The article presents the preliminary results of paintings. Methods were used with the scanning electron microscope was equipped with an energy dispersive X-ray spectrometer (SEM-EDS).

scholarly journals Analysis of electromigration phenomenon in thick-film and LTCC structures at elevated temperature

2014 ◽  
Vol 32 (2) ◽  
pp. 247-251
Author(s):  
Damian Nowak ◽  
Andrzej Stafiniak ◽  
Andrzej Dziedzic
Keyword(s):  
Electron Microscope ◽  
Thick Film ◽  
Conductive Material ◽  
X Ray ◽  
Ions Transport ◽  
Ag Electrode ◽  
Dc Bias ◽  
Leakage Characteristics ◽  
Scanning Electron

AbstractStudies on electromigration phenomenon in thick-film structures on alumina and LTCC substrates are presented in this paper. The effects of storage of Au and Ag electrode patterns in temperature range up to 300 °C under voltage bias were examined. The leakage characteristics of electrodes with 100 μm spacing at 50 V dc bias as a function of time and temperature are presented and analyzed. Scanning electron microscope (SEM) equipped with the energy-dispersive X-ray spectroscopy (EDX) detector was applied for determination of metal ions transport. Test structures with Au-based conductive material are much more resistant to electromigration than Ag-based layers.

Sem and X-Ray Analysis of Renal and Biliary Calculi

1976 ◽  
Vol 34 ◽  
pp. 306-307
Author(s):  
R. J. Narconis ◽  
G. L. Johnson
Keyword(s):  
Chemical Constituents ◽  
Natural State ◽  
X Ray Diffraction ◽  
Chemical Methods ◽  
X Ray ◽  
Additional Dimension ◽  
Biliary Calculi ◽  
Calculus Formation ◽  
Scanning Electron

Analysis of the constituents of renal and biliary calculi may be of help in the management of patients with calculous disease. Several methods of analysis are available for identifying these constituents. Most common are chemical methods, optical crystallography, x-ray diffraction, and infrared spectroscopy. The application of a SEM with x-ray analysis capabilities should be considered as an additional alternative.A scanning electron microscope equipped with an x-ray “mapping” attachment offers an additional dimension in its ability to locate elemental constituents geographically, and thus, provide a clue in determination of possible metabolic etiology in calculus formation. The ability of this method to give an undisturbed view of adjacent layers of elements in their natural state is of advantage in determining the sequence of formation of subsequent layers of chemical constituents.

X-ray micro tomography in the scanning electron microscope

1978 ◽  
Vol 36 (1) ◽  
pp. 106-107 ◽  
Author(s):  
W. Brünger
Keyword(s):  
Electron Beam ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Target Surface ◽  
The Body ◽  
X Rays ◽  
Cross Sectional ◽  
X Ray ◽  
Micro Tomography ◽  
Scanning Electron

Reconstructive tomography is a new technique in diagnostic radiology for imaging cross-sectional planes of the human body /1/. A collimated beam of X-rays is scanned through a thin slice of the body and the transmitted intensity is recorded by a detector giving a linear shadow graph or projection (see fig. 1). Many of these projections at different angles are used to reconstruct the body-layer, usually with the aid of a computer. The picture element size of present tomographic scanners is approximately 1.1 mm2.Micro tomography can be realized using the very fine X-ray source generated by the focused electron beam of a scanning electron microscope (see fig. 2). The translation of the X-ray source is done by a line scan of the electron beam on a polished target surface /2/. Projections at different angles are produced by rotating the object.During the registration of a single scan the electron beam is deflected in one direction only, while both deflections are operating in the display tube.

PHAX-SCAN: Functional integration of a Scanning Electron Microscope and an energy-dispersive x-ray analyser

1989 ◽  
Vol 47 ◽  
pp. 56-57
Author(s):  
Marc H. Peeters ◽  
Max T. Otten
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
High Speed ◽  
High Performance ◽  
Functional Integration ◽  
Energy Dispersive ◽  
X Rays ◽  
X Ray ◽  
High Speed Analysis ◽  
Scanning Electron

Over the past decades, the combination of energy-dispersive analysis of X-rays and scanning electron microscopy has proved to be a powerful tool for fast and reliable elemental characterization of a large variety of specimens. The technique has evolved rapidly from a purely qualitative characterization method to a reliable quantitative way of analysis. In the last 5 years, an increasing need for automation is observed, whereby energy-dispersive analysers control the beam and stage movement of the scanning electron microscope in order to collect digital X-ray images and perform unattended point analysis over multiple locations.The Philips High-speed Analysis of X-rays system (PHAX-Scan) makes use of the high performance dual-processor structure of the EDAX PV9900 analyser and the databus structure of the Philips series 500 scanning electron microscope to provide a highly automated, user-friendly and extremely fast microanalysis system. The software that runs on the hardware described above was specifically designed to provide the ultimate attainable speed on the system.

PENGGUNAAN TiO2 PARTIKEL NANO HASIL SINTESIS BERBASIS AIR MENGGUNAKAN METODA SOL-GEL PADA BAHAN KAPAS SEBAGAI APLIKASI UNTUK TEKSTIL ANTI UV

Arena Tekstil ◽  
2013 ◽  
Vol 28 (1) ◽  
Author(s):  
Maya Komalasari ◽  
Bambang Sunendar
Keyword(s):  
Fourier Transform ◽  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Sol Gel ◽  
Crosslinking Agent ◽  
X Ray Diffraction ◽  
Nano Tio2 ◽  
X Ray ◽  
Infra Red ◽  
Scanning Electron

Partikel nano TiO2 berbasis air dengan pH basa telah berhasil disintesis dengan menggunakan metode sol-gel dan diimobilisasi pada kain kapas dengan menggunakan kitosan sebagai zat pengikat silang. Sintesis dilakukan  dengan prekursor TiCl4 pada konsentrasi 0,3 M, 0,5 M dan 1 M, dan menggunakan templat kanji dengan proses kalsinasi pada suhu 500˚C selama 2 jam. Partikel nano TiO2 diaplikasikan ke kain kapas dengan metoda pad-dry-cure dan menggunakan kitosan sebagai crosslinking agent. Berdasarkan hasil Scanning Electron Microscope (SEM),diketahui bahwa morfologi partikel TiO2 berbentuk spherical dengan ukuran nano (kurang dari 100 nm). Karakterisasi X-Ray Diffraction (XRD) menunjukkan adanya tiga tipe struktur kristal utama, yaitu (100), (101) dan (102) dengan fasa kristal yang terbentuk adalah anatase dan rutile. Pada karakterisasi menggunakan SEM terhadap serbuk dari TiO2 yang telah diaplikasikan ke permukaan kain kapas, terlihat adanya imobilisasi partikel nano TiO2 melalui ikatan hidrogen silang dengan kitosan pada kain kapas. Hasil analisa tersebut kemudian dikonfirmasi dengan FTIR (Fourier Transform Infra Red) yang hasilnya memperlihatkan puncak serapan pada bilangan gelombang 3495 cm-1, 2546 cm-1, dan 511 cm-1,  yang masing-masing diasumsikan sebagai adanya vibrasi gugus fungsi O-H, N-H dan Ti-O-Ti. Hasil SEM menunjukkan pula bahwa kristal nano yang terbentuk diantaranya adalah fasa rutile , yang berdasarkan literatur terbukti dapatberfungsi sebagai anti UV.

Failure Analysis of Killer Defects and Yield Enhancement of Flat ROM Devices in Wafer Fabrication

2000 ◽  
Author(s):  
Y. N. Hua ◽  
Z. R. Guo ◽  
L. H. An ◽  
Shailesh Redkar
Keyword(s):  
Electron Microscope ◽  
Failure Analysis ◽  
Fault Isolation ◽  
Yield Enhancement ◽  
Wafer Fabrication ◽  
X Ray ◽  
Particle Contamination ◽  
Emission Microscopy ◽  
Microscopy Techniques ◽  
Scanning Electron

Abstract In this paper, some low yield cases in Flat ROM device (0.45 and 0.6 µm) were investigated. To find killer defects and particle contamination, KLA, bitmap and emission microscopy techniques were used in fault isolation. Reactive ion etching (RIE) and chemical delayering, 155 Wright Etch, BN+ Etch and scanning electron microscope (SEM) were used for identification and inspection of defects. In addition, energy-dispersive X-ray microanalysis (EDX) was used to determine the composition of the particle or contamination. During failure analysis, seven kinds of killer defects and three killer particles were found in Flat ROM devices. The possible root causes, mechanisms and elimination solutions of these killer defects/particles were also discussed.

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