scholarly journals Influence of Lateral Movement on Level Behavior of Adhesion Force Measured Repeatedly by an Atomic Force Microscope (AFM) Colloid Probe in Dry Conditions

Materials ◽  
2021 ◽  
Vol 14 (2) ◽  
pp. 370
Author(s):  
Ping Li ◽  
Tianmao Lai
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Force ◽  
Lateral Movement ◽  
Adhesion Forces ◽  
Lateral Velocity ◽  
Atomic Force ◽  
Dry Conditions ◽  
Data Points ◽  
Scanning Path ◽  
Material Wear

An atomic force microscope (AFM) was operated to repeatedly measure the adhesion forces between a polystyrene colloid probe and a gold film, with and without lateral movement in dry conditions. Experimental results show that the adhesion force shows a level behavior without lateral movement and with a small scan distance: the data points are grouped into several levels, and the adhesion force jumps between different levels frequently. This was attributed to the fact that when the cantilever pulls off the sample, the contact area of the sample is not exactly the same between successive contacts and jumps randomly from one to another. Both lateral velocity and material wear have little influence on level behavior. However, with a medium scan distance, level behavior is observed only for some measurements, and adhesion forces are randomly distributed for the other measurements. With a large scan distance, adhesion forces are randomly distributed for all measurements. This was attributed to the fact that the cantilever pulls off the sample in many different contact areas on the scanning path for large distances. These results may help understand the influence of lateral movement and imply the contribution of asperities to adhesion force.

scholarly journals Evaluation of Cell Adhesion Force with Atomic Force Microscope

2000 ◽  
Vol 40 (supplement) ◽  
pp. S80
Author(s):  
H. Kim ◽  
T. Osada ◽  
A. Ikai
Keyword(s):  
Cell Adhesion ◽  
Atomic Force Microscope ◽  
Adhesion Force ◽  
Atomic Force

Electric Control of Friction on Silicon Studied by Atomic Force Microscope

NANO ◽  
2015 ◽  
Vol 10 (03) ◽  
pp. 1550038 ◽  
Author(s):  
Yan Jiang ◽  
Lili Yue ◽  
Boshen Yan ◽  
Xi Liu ◽  
Xiaofei Yang ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Bias Voltage ◽  
Electrostatic Force ◽  
Adhesion Forces ◽  
Friction Forces ◽  
Type Silicon ◽  
Atomic Force ◽  
Electric Control ◽  
Before And After ◽  
Track Line

We investigated friction on an n-type silicon surface using an atomic force microscope when a bias voltage was applied to the sample. Friction forces on the same track line were measured before and after the bias voltages were applied and it was found that the friction forces in n-type silicon can be tuned reversibly with the bias voltage. The dependence of adhesion forces between the silicon nitride tip and Si sample on the bias voltages approximately follows a parabolic law due to electrostatic force, which results in a significant increase in the friction force at an applied electric field.

scholarly journals Adhesion force mapping on wood by atomic force microscopy: influence of surface roughness and tip geometry

2016 ◽  
Vol 3 (10) ◽  
pp. 160248 ◽  
Author(s):  
X. Jin ◽  
B. Kasal
Keyword(s):  
Surface Roughness ◽  
Atomic Force Microscopy ◽  
Wood Surface ◽  
Adhesion Force ◽  
Data Interpretation ◽  
Natural Fibre ◽  
Force Distribution ◽  
Adhesion Forces ◽  
Force Microscopy ◽  
Atomic Force

This study attempts to address the interpretation of atomic force microscopy (AFM) adhesion force measurements conducted on the heterogeneous rough surface of wood and natural fibre materials. The influences of wood surface roughness, tip geometry and wear on the adhesion force distribution are examined by cyclic measurements conducted on wood surface under dry inert conditions. It was found that both the variation of tip and surface roughness of wood can widen the distribution of adhesion forces, which are essential for data interpretation. When a common Si AFM tip with nanometre size is used, the influence of tip wear can be significant. Therefore, control experiments should take the sequence of measurements into consideration, e.g. repeated experiments with used tip. In comparison, colloidal tips provide highly reproducible results. Similar average values but different distributions are shown for the adhesion measured on two major components of wood surface (cell wall and lumen). Evidence supports the hypothesis that the difference of the adhesion force distribution on these two locations was mainly induced by their surface roughness.

Imaging adhesion forces on proteins with the atomic force microscope

1995 ◽  
Author(s):  
Manfred Radmacher ◽  
Monika Fritz ◽  
Miriam W. Allersma ◽  
Christoph F. Schmidt ◽  
Paul K. Hansma
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Forces ◽  
Atomic Force

Imaging adhesion forces and elasticity of lysozyme adsorbed on mica with the atomic force microscope

Langmuir ◽  
1994 ◽  
Vol 10 (10) ◽  
pp. 3809-3814 ◽  
Author(s):  
M. Radmacher ◽  
M. Fritz ◽  
J. P. Cleveland ◽  
D. A. Walters ◽  
P. K. Hansma
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Forces ◽  
Atomic Force

Quantifying bacterial adhesion on antifouling polymer brushes via single-cell force spectroscopy

2015 ◽  
Vol 6 (31) ◽  
pp. 5740-5751 ◽  
Author(s):  
Cesar Rodriguez-Emmenegger ◽  
Sébastien Janel ◽  
Andres de los Santos Pereira ◽  
Michael Bruns ◽  
Frank Lafont
Keyword(s):  
Atomic Force Microscope ◽  
Single Cell ◽  
Bacterial Adhesion ◽  
Bacterial Cell ◽  
Polymer Brushes ◽  
Force Spectroscopy ◽  
Adhesion Forces ◽  
Atomic Force ◽  
Cell Force

The adhesion forces between a single bacterial cell and different polymer brushes were measured directly with an atomic force microscope and correlated with their resistance to fouling.

scholarly journals Nanoscale mapping of dielectric properties based on surface adhesion force measurements

2018 ◽  
Vol 9 ◽  
pp. 900-906 ◽  
Author(s):  
Ying Wang ◽  
Yue Shen ◽  
Xingya Wang ◽  
Zhiwei Shen ◽  
Bin Li ◽  
...  
Keyword(s):  
Graphene Oxide ◽  
Dielectric Properties ◽  
Adhesion Force ◽  
Model Systems ◽  
Adhesion Forces ◽  
Surface Adhesion ◽  
Storage Devices ◽  
Force Microscopy ◽  
Atomic Force

The detection of local dielectric properties is of great importance in a wide variety of scientific studies and applications. Here, we report a novel method for the characterization of local dielectric distributions based on surface adhesion mapping by atomic force microscopy (AFM). The two-dimensional (2D) materials graphene oxide (GO), and partially reduced graphene oxide (RGO), which have similar thicknesses but large differences in their dielectric properties, were studied as model systems. Through direct imaging of the samples with a biased AFM tip in PeakForce Quantitative Nano-Mechanics (PF-QNM) mode, the local dielectric properties of GO and RGO were revealed by mapping their surface adhesion forces. Thus, GO and RGO could be conveniently differentiated. This method provides a simple and general approach for the fast characterization of the local dielectric properties of graphene-based materials and will further facilitate their applications in energy generation and storage devices.

scholarly journals Cellular Shear Adhesion Force Measurement and Simultaneous Imaging by Atomic Force Microscope

2017 ◽  
Vol 37 (1) ◽  
pp. 102-111 ◽  
Author(s):  
Yu Hou ◽  
Zuobin Wang ◽  
Dayou Li ◽  
Renxi Qiu ◽  
Yan Li ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Adhesion Force ◽  
Force Measurement ◽  
Simultaneous Imaging ◽  
Atomic Force

scholarly journals Adhesion forces measured between a calcium blocker drug and its receptor in living cells using atomic force microscope

FEBS Letters ◽  
2003 ◽  
Vol 552 (2-3) ◽  
pp. 155-159 ◽  
Author(s):  
Ricardo de Souza Pereira ◽  
Maria Ivonete Nogueira da Silva ◽  
Mônica Alonso Cotta
Keyword(s):  
Atomic Force Microscope ◽  
Living Cells ◽  
Adhesion Forces ◽  
Atomic Force ◽  
Calcium Blocker
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