scholarly journals Origin of Mangetotransport Properties in APCVD Deposited Tin Oxide Thin Films

Materials ◽  
2020 ◽  
Vol 13 (22) ◽  
pp. 5182
Author(s):  
Krunoslav Juraić ◽  
Davor Gracin ◽  
Matija Čulo ◽  
Željko Rapljenović ◽  
Jasper Rikkert Plaisier ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Tin Oxide ◽  
Texture Coefficient ◽  
Chemical Vapour ◽  
Visible Spectrum ◽  
Soda Lime ◽  
Fine Tuning ◽  
Soda Lime Glass ◽  
Charge Carrier Density

Transparent conducting oxides (TCO) with high electrical conductivity and at the same time high transparency in the visible spectrum are an important class of materials widely used in many devices requiring a transparent contact such as light-emitting diodes, solar cells and display screens. Since the improvement of electrical conductivity usually leads to degradation of optical transparency, a fine-tuning sample preparation process and a better understanding of the correlation between structural and transport properties is necessary for optimizing the properties of TCO for use in such devices. Here we report a structural and magnetotransport study of tin oxide (SnO2), a well-known and commonly used TCO, prepared by a simple and relatively cheap Atmospheric Pressure Chemical Vapour Deposition (APCVD) method in the form of thin films deposited on soda-lime glass substrates. The thin films were deposited at two different temperatures (which were previously found to be close to optimum for our setup), 590 °C and 610 °C, and with (doped) or without (undoped) the addition of fluorine dopants. Scanning Electron Microscopy (SEM) and Grazing Incidence X-ray Diffraction (GIXRD) revealed the presence of inhomogeneity in the samples, on a bigger scale in form of grains (80–200 nm), and on a smaller scale in form of crystallites (10–25 nm). Charge carrier density and mobility extracted from DC resistivity and Hall effect measurements were in the ranges 1–3 × 1020 cm−3 and 10–20 cm2/Vs, which are typical values for SnO2 films, and show a negligible temperature dependence from room temperature down to −269 °C. Such behaviour is ascribed to grain boundary scattering, with the interior of the grains degenerately doped (i.e., the Fermi level is situated well above the conduction band minimum) and with negligible electrostatic barriers at the grain boundaries (due to high dopant concentration). The observed difference for factor 2 in mobility among the thin-film SnO2 samples most likely arises due to the difference in the preferred orientation of crystallites (texture coefficient).

scholarly journals Structural Origin of Magnetotransport Properties in APCVD Deposited Single and Bi-Layer Tin Oxide Thin Films

2021 ◽  
Author(s):  
Krunoslav Juraić ◽  
Matija Čulo ◽  
Željko Rapljenović ◽  
Jasper Rikkert Plaisier ◽  
Zdravko Siketić ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Tin Oxide ◽  
Texture Coefficient ◽  
Chemical Vapour ◽  
Visible Spectrum ◽  
Soda Lime ◽  
Fine Tuning ◽  
Soda Lime Glass ◽  
Charge Carrier Density

Transparent conducting oxides (TCO) with high electrical conductivity and at the same time high transparency in the visible spectrum are an important class of materials widely used in many devices requiring a transparent contact such as light-emitting diodes, solar cells and display screens. Since the improvement of electrical conductivity usually leads to degradation of optical transparency, a fine-tuning sample preparation process and a better understanding of the correlation between structural and transport properties is necessary for optimizing the properties of TCO for use in such devices. Here we report a structural and magnetotransport study of tin oxide (SnO2), a well-known and commonly used TCO, prepared by a simple and relatively cheap Atmospheric Pressure Chemical Vapour Deposition (APCVD) method in the form of thin films deposited on soda-lime glass substrates. The thin films were deposited at two different temperatures (which were previously found to be close to optimum for our setup), 590 °C and 610 °C, and with (doped) or without (undoped) the addition of fluorine dopants. Scanning Electron Microscopy (SEM) and Grazing Incidence X-ray Diffraction (GIXRD) revealed the presence of inhomogeneity in the samples, on a bigger scale in form of grains (80–200 nm), and on a smaller scale in form of crystallites (10–25 nm). Charge carrier density and mobility extracted from DC resistivity and Hall effect measurements were in the ranges 1–3 × 1020 cm−3 and 10–20 cm2/Vs, which are typical values for SnO2 films, and show a negligible temperature dependence from room temperature down to -269 °C. Such behaviour is ascribed to grain boundary scattering, with the interior of the grains degenerately doped (i.e., the Fermi level is situated well above the conduction band minimum) and with negligible electrostatic barriers at the grain boundaries (due to high dopant concentration). The observed difference for factor 2 in mobility among the thin-film SnO2 samples most likely arises due to the difference in the preferred orientation of crystallites (texture coefficient).

scholarly journals Structural Origin of Magnetotransport Properties in APCVD Deposited Single and Bi-Layer Tin Oxide Thin Films

2020 ◽  
Author(s):  
Krunoslav Juraić ◽  
Matija Čulo ◽  
Željko Rapljenović ◽  
Jasper Rikkert Plaisier ◽  
Zdravko Siketić ◽  
...  
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Texture Coefficient ◽  
Chemical Vapour ◽  
Single Layer ◽  
Soda Lime ◽  
Grazing Incidence ◽  
Soda Lime Glass ◽  
Elastic Recoil ◽  
Soda Lime Glass Substrate

Tin oxide (SnO2) thin films, undoped single-layer and fluorine doped / undoped bilayer were deposited by Atmospheric Pressure Chemical Vapour Deposition (APCVD) at soda-lime glass substrate at two different temperatures (590°C and 610°C). Transport properties examined by impedance spectroscopy, DC resistivity, Hall effect and magnetoresistance measurements are correlated with structural properties examined by Scanning Electron Microscopy, Grazing Incidence X-ray Diffraction (GIXRD) and Time-of-flight Elastic Recoil Detection Analysis (TOF-ERDA). Results suggest that charge transport in the obtained samples is dominated by scattering at neutral impurities and can be correlated with preferred orientation (texture coefficient) presented in prepared samples.

Microscratch Analysis of The Adhesion Failure on Oxide Thin Films With Different Thickness

1996 ◽  
Vol 436 ◽  
Author(s):  
C. R. Ottermann ◽  
K. Bange ◽  
A. Braband ◽  
H. Haefke ◽  
W. Gutmannsbauer
Keyword(s):  
Thin Films ◽  
Chemical Vapour ◽  
Soda Lime ◽  
Fused Silica ◽  
Soda Lime Glass ◽  
Test Results ◽  
Glass Substrates ◽  
Adhesion Failure ◽  
Different Thickness ◽  
Deposition Techniques

AbstractAdhesion failures of Ti2 and Ta2O5 thin films deposited by reactive evaporation (RE), reactive ion plating (IP) and plasma impulse chemical vapour deposition (PICVD) on fused silica, AF 45, TEMPAX and soda-lime glass substrates are investigated by means of a micro-scratch tester. The oxide films possess thickness between 60 and 500 nm and show different mass densities depending on the deposition conditions. Scratch testing exhibits well pronounced detachment for thicker films on hard substrates. The clearance of the scratch signal is reduced with decreasing layer thickness or for softer substrate materials. The test results are also influenced by the various substrates and different chemical and mechanical properties of the films due to the alternate deposition techniques.

scholarly journals Preparation and Characterization ofSb2Te3Thin Films by Coevaporation

2010 ◽  
Vol 2010 ◽  
pp. 1-4 ◽  
Author(s):  
Bin Lv ◽  
Songbai Hu ◽  
Wei Li ◽  
Xia Di ◽  
Lianghuan Feng ◽  
...  
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Photoelectron Spectroscopy ◽  
Electrical Transport ◽  
Film Surface ◽  
Soda Lime ◽  
Soda Lime Glass ◽  
Conductivity Measurements ◽  
X Ray ◽  
Thin Film Surface

Deposition ofSb2Te3thin films on soda-lime glass substrates by coevaporation of Sb and Te is described in this paper.Sb2Te3thin films were characterized by x-ray diffraction (XRD), x-ray fluorescence (XRF), atomic force microscopy (AFM), x-ray photoelectron spectroscopy (XPS), electrical conductivity measurements, and Hall measurements. The abnormal electrical transport behavior occurred fromin situelectrical conductivity measurements. The results indicate that as-grownSb2Te3thin films are amorphous and undergo an amorphous-crystalline transition after annealing, and the posttreatment can effectively promote the formation of Sb-Te bond and prevent oxidation of thin film surface.

scholarly journals Substrate Temperature Influence on Optical Properties of C60 Thin Films Within the Visible Range

2019 ◽  
Vol 60 (5) ◽  
pp. 1006-1012
Author(s):  
Ali H A Jalaukhan ◽  
Mustafa M A Hussein
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Substrate Temperature ◽  
Visible Spectrum ◽  
Normal Incidence ◽  
Soda Lime ◽  
Band Gap Energy ◽  
Visible Range ◽  
Soda Lime Glass ◽  
Thermal Evaporation Method

Fullerene thin films of about 200 nm thicknesses have been deposited by thermal evaporation method on soda lime glass at substrate temperature 303 and 403K under pressure about 10-5 mbar. This study concentrated on the influence of substrate temperature on the optical properties of C60 thin films within the visible range. Optical characterization has been carried out at room temperature using the absorption spectra, at normal incidence, in range (200-900) nm. The absorption and extinction coefficients of the samples have been evaluated according to the variation in the UV- Visible spectrum. Increasing substrate temperature causes decreasing in optical band gap energy, for direct allowed transitions, and slightly changing in refractive index. This incident was due to the reducing of interatomic intervals, which may be correlating a decrease in the amplitude of atomic vibrations around their equilibrium sites.

Effect of barrier layers on the properties of indium tin oxide thin films on soda lime glass substrates

2009 ◽  
Vol 517 (14) ◽  
pp. 4074-4077 ◽  
Author(s):  
Jung-Min Lee ◽  
Byung-Hyun Choi ◽  
Mi-Jung Ji ◽  
Yong-Tae An ◽  
Jung-Ho Park ◽  
...  
Keyword(s):  
Thin Films ◽  
Tin Oxide ◽  
Indium Tin Oxide ◽  
Soda Lime ◽  
Soda Lime Glass ◽  
Oxide Thin Films ◽  
Barrier Layers ◽  
Glass Substrates

Structural, morphological, and optoelectrical characterization of Bi2S3 thin films grown by co-evaporation

2016 ◽  
Vol 30 (06) ◽  
pp. 1650066 ◽  
Author(s):  
F. Mesa ◽  
C. A. Arredondo ◽  
W. Vallejo
Keyword(s):  
Thin Films ◽  
Electrical Conductivity ◽  
Soda Lime ◽  
Soda Lime Glass ◽  
Experimental Conditions ◽  
Soda Lime Glass Substrate ◽  
Text Type ◽  
Force Microscopy ◽  
Atomic Force

This work presents the results of synthesis and characterization of polycrystalline [Formula: see text]-type Bi2S3 thin films. The films were grown through a chemical reaction from co-evaporation of their precursor elements in a soda-lime glass substrate. The effect of the experimental conditions on the optical, morphological structural properties, the growth rate, and the electrical conductivity [Formula: see text] was studied through spectral transmittance, X-ray diffraction (XRD), atomic force microscopy (AFM) and [Formula: see text] versus [Formula: see text] measurements, respectively. The results showed that the films grow only in the orthorhombic Bi2S3 bismuthinite phase. It was also found that the Bi2S3 films present an energy band gap [Formula: see text] of about 1.38 eV. In addition to these results, the electrical conductivity of the Bi2S3 films was affected by both the transport of free carriers in extended states of the conduction band and for variable range hopping transport mechanisms, each one predominating in a different temperature range.

scholarly journals Microfabrication and Surface Functionalization of Soda Lime Glass through Direct Laser Interference Patterning

Nanomaterials ◽  
2021 ◽  
Vol 11 (1) ◽  
pp. 129
Author(s):  
Marcos Soldera ◽  
Sabri Alamri ◽  
Paul Alexander Sürmann ◽  
Tim Kunze ◽  
Andrés Fabián Lasagni
Keyword(s):  
Laser Radiation ◽  
Surface Functionalization ◽  
Incident Light ◽  
Chemical Properties ◽  
Visible Spectrum ◽  
Soda Lime ◽  
Soda Lime Glass ◽  
Textured Surfaces ◽  
Aspect Ratios ◽  
Direct Laser

All-purpose glasses are common in many established and emerging industries, such as microelectronics, photovoltaics, optical components, and biomedical devices due to their outstanding combination of mechanical, optical, thermal, and chemical properties. Surface functionalization through nano/micropatterning can further enhance glasses’ surface properties, expanding their applicability into new fields. Although laser structuring methods have been successfully employed on many absorbing materials, the processability of transparent materials with visible laser radiation has not been intensively studied, especially for producing structures smaller than 10 µm. Here, interference-based optical setups are used to directly pattern soda lime substrates through non-lineal absorption with ps-pulsed laser radiation in the visible spectrum. Line- and dot-like patterns are fabricated with spatial periods between 2.3 and 9.0 µm and aspect ratios up to 0.29. Furthermore, laser-induced periodic surface structures (LIPSS) with a feature size of approximately 300 nm are visible within these microstructures. The textured surfaces show significantly modified properties. Namely, the treated surfaces have an increased hydrophilic behavior, even reaching a super-hydrophilic state for some cases. In addition, the micropatterns act as relief diffraction gratings, which split incident light into diffraction modes. The process parameters were optimized to produce high-quality textures with super-hydrophilic properties and diffraction efficiencies above 30%.

AFM Study of Surface Morphology of Aluminum Nitride Thin Films

1995 ◽  
Vol 388 ◽  
Author(s):  
Yoshihisa Watanabe ◽  
Yoshikazu Nakamura ◽  
Shigekazu Hirayama ◽  
Yuusaku Naota
Keyword(s):  
Thin Films ◽  
Surface Morphology ◽  
Substrate Temperature ◽  
Single Crystal ◽  
Room Temperature ◽  
Ion Beam ◽  
Soda Lime ◽  
Silicon Single Crystal ◽  
Soda Lime Glass ◽  
Average Roughness

AbstractAluminum nitride (AlN) thin films have been synthesized by ion-beam assisted deposition method. Film deposition has been performed on the substrates of silicon single crystal, soda-lime glass and alumin A. the influence of the substrate roughness on the film roughness is studied. the substrate temperature has been kept at room temperature and 473K and the kinetic energy of the incident nitrogen ion beam and the deposition rate have been fixed to 0.5 keV and 0.07 nm/s, respectively. the microstructure of the synthesized films has been examined by X-ray diffraction (XRD) and the surface morphology has been observed by atomic force microscopy(AFM). IN the XRD patterns of films synthesized at both room temperature and 473K, the diffraction line indicating the alN (10*0) can be discerned and the broad peak composed of two lines indicating the a1N (00*2) and a1N (10*1) planes is also observed. aFM observations for 100 nm films reveal that (1) the surface of the films synthesized on the silicon single crystal and soda-lime glass substrates is uniform and smooth on the nanometer scale, (2) the average roughness of the films synthesized on the alumina substrate is similar to that of the substrate, suggesting the evaluation of the average roughness of the film itself is difficult in the case of the rough substrate, and (3) the average roughness increases with increasing the substrate temperature.

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