scholarly journals The Influence of Ball Burnishing on Friction in Lubricated Sliding

Materials ◽  
2020 ◽  
Vol 13 (21) ◽  
pp. 5027
Author(s):  
Slawomir Swirad ◽  
Pawel Pawlus
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
White Light ◽  
Frictional Resistance ◽  
Friction Reduction ◽  
Ball Burnishing ◽  
Surface Topographies ◽  
Disc Configuration ◽  
Scanning Electron ◽  
Ball On Disc

Ball burnishing treatment, using the Ecoroll system, of steel samples was conducted. In the experiment, the burnishing pressure was changed. After the treatments, measurements of the surface topographies of disc samples were conducted using a white light interferometer Talysurf CCI Lite. Tribological tests were carried out in a ball-on-disc configuration. After these tests, measurements of surface topographies of disc samples were repeated. Worn surfaces were also analyzed with a scanning electron microscope. It was found that as the result of burnishing, surface topography height of tested samples decreased. Ball burnishing led to a reduction in the frictional resistance. The highest friction reduction of more than 40% was achieved with a burnishing pressure of 20 MPa.

Photoelectrochemical Properties of Anatase TiO2 Films Prepared by Improved Liquid Phase Deposition

2015 ◽  
Vol 1120-1121 ◽  
pp. 419-423
Author(s):  
Cai Xia Lei ◽  
X.L. Jiang ◽  
Y. Liu ◽  
X. Liu ◽  
Y.T. Ma ◽  
...  
Keyword(s):  
Electron Microscope ◽  
Liquid Phase ◽  
Scanning Electron Microscope ◽  
Reaction Temperature ◽  
White Light ◽  
Photoelectrochemical Properties ◽  
Liquid Phase Deposition ◽  
X Ray ◽  
Good Crystallinity ◽  
Scanning Electron

In this paper, the hydrothermal-assisted liquid phase deposition (HT-LPD) method has been developed to prepare TiO2 films. The crystalline structures and morphologies of as-prepared TiO2 films were analyzed using an X-ray diffractometer (XRD) and scanning electron microscope (SEM). It was found that the HT-LPD TiO2 film showed good crystallinity with preferrred orientation along c-axis. Moreover, the as-prepared TiO2 films consisted of two layers, with the tiny nanoparticles as the underlying layer and the flower-like clusters as the upper layer. The photoelectrochemical measurements revealed that, when illuminated by the white light, the HT-LPD TiO2 films exhibited a more negative photopotential value and an increased photocurrent value with elevated reaction temperature, excepting for the sample prerared at 150 °C. In summary, the TiO2 films prepared by the improved LPD method could be served as the promising photoanode for the photoelectrochemical applications.

The Alteration of the Pore Spaces in Sandstones

1973 ◽  
Vol 31 ◽  
pp. 210-211
Author(s):  
R. E. Ferrell ◽  
G. G. Paulson
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
The Other ◽  
Coarse Grained ◽  
Depositional Fabric ◽  
Soluble Components ◽  
Scanning Electron ◽  
Shape And Size

The pore spaces in sandstones are the result of the original depositional fabric and the degree of post-depositional alteration that the rock has experienced. The largest pore volumes are present in coarse-grained, well-sorted materials with high sphericity. The chief mechanisms which alter the shape and size of the pores are precipitation of cementing agents and the dissolution of soluble components. Each process may operate alone or in combination with the other, or there may be several generations of cementation and solution.The scanning electron microscope has ‘been used in this study to reveal the morphology of the pore spaces in a variety of moderate porosity, orthoquartzites.

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Observability of Very Thick Specimen by Using Transmission Scanning Electron Microscope

1971 ◽  
Vol 29 ◽  
pp. 26-27
Author(s):  
K. Shibatomi ◽  
T. Yamanoto ◽  
H. Koike
Keyword(s):  
Electron Microscope ◽  
Image Quality ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Image Contrast ◽  
Objective Lens ◽  
Thick Specimen ◽  
Transmission Electron ◽  
Scanning Electron

In the observation of a thick specimen by means of a transmission electron microscope, the intensity of electrons passing through the objective lens aperture is greatly reduced. So that the image is almost invisible. In addition to this fact, it have been reported that a chromatic aberration causes the deterioration of the image contrast rather than that of the resolution. The scanning electron microscope is, however, capable of electrically amplifying the signal of the decreasing intensity, and also free from a chromatic aberration so that the deterioration of the image contrast due to the aberration can be prevented. The electrical improvement of the image quality can be carried out by using the fascionating features of the SEM, that is, the amplification of a weak in-put signal forming the image and the descriminating action of the heigh level signal of the background. This paper reports some of the experimental results about the thickness dependence of the observability and quality of the image in the case of the transmission SEM.

Resolution of a Transmitted Electron Image Formed by A Scanning Electron Microscope

1970 ◽  
Vol 28 ◽  
pp. 386-387
Author(s):  
S. Takashima ◽  
H. Hashimoto ◽  
S. Kimoto
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Chromatic Aberration ◽  
Objective Lens ◽  
Specimen Thickness ◽  
Probe Diameter ◽  
Transmission Electron ◽  
Electron Image ◽  
Conventional Transmission Electron Microscope ◽  
Scanning Electron

The resolution of a conventional transmission electron microscope (TEM) deteriorates as the specimen thickness increases, because chromatic aberration of the objective lens is caused by the energy loss of electrons). In the case of a scanning electron microscope (SEM), chromatic aberration does not exist as the restrictive factor for the resolution of the transmitted electron image, for the SEM has no imageforming lens. It is not sure, however, that the equal resolution to the probe diameter can be obtained in the case of a thick specimen. To study the relation between the specimen thickness and the resolution of the trans-mitted electron image obtained by the SEM, the following experiment was carried out.

Characterization of Sputtered Films using the Scanning Electron Microscope

1973 ◽  
Vol 31 ◽  
pp. 44-45
Author(s):  
R. F. Schneidmiller ◽  
W. F. Thrower ◽  
C. Ang
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Thin Film Deposition ◽  
Film Deposition ◽  
Sputtered Films ◽  
Plasma Sputtering ◽  
Microelectronic Devices ◽  
Control Film ◽  
Scanning Electron

Solid state materials in the form of thin films have found increasing structural and electronic applications. Among the multitude of thin film deposition techniques, the radio frequency induced plasma sputtering has gained considerable utilization in recent years through advances in equipment design and process improvement, as well as the discovery of the versatility of the process to control film properties. In our laboratory we have used the scanning electron microscope extensively in the direct and indirect characterization of sputtered films for correlation with their physical and electrical properties.Scanning electron microscopy is a powerful tool for the examination of surfaces of solids and for the failure analysis of structural components and microelectronic devices.

Field Emission SEM Equipped With Noise Compensator

1973 ◽  
Vol 31 ◽  
pp. 302-303
Author(s):  
S. Saito ◽  
H. Todokoro ◽  
S. Nomura ◽  
T. Komoda
Keyword(s):  
Electron Microscope ◽  
High Resolution ◽  
Scanning Electron Microscope ◽  
Field Emission ◽  
Low Contrast ◽  
Probe Current ◽  
High Resolution Images ◽  
Scanning Electron

Field emission scanning electron microscope (FESEM) features extremely high resolution images, and offers many valuable information. But, for a specimen which gives low contrast images, lateral stripes appear in images. These stripes are resulted from signal fluctuations caused by probe current noises. In order to obtain good images without stripes, the fluctuations should be less than 1%, especially for low contrast images. For this purpose, the authors realized a noise compensator, and applied this to the FESEM.Fig. 1 shows an outline of FESEM equipped with a noise compensator. Two apertures are provided gust under the field emission gun.

Visualization of Internal Skin Structures with the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 46-47
Author(s):  
Emil Bernstein
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Great Depth ◽  
Hair Follicles ◽  
Depth Of Field ◽  
Pig Skin ◽  
Realistic Picture ◽  
Main Components ◽  
Scanning Electron

An interesting method for examining structures in g. pig skin has been developed. By modifying an existing technique for splitting skin into its two main components—epidermis and dermis—we can in effect create new surfaces which can be examined with the scanning electron microscope (SEM). Although this method is not offered as a complete substitute for sectioning, it provides the investigator with a means for examining certain structures such as hair follicles and glands intact. The great depth of field of the SEM complements the technique so that a very “realistic” picture of the organ is obtained.

Fine structure of the retina of the giant scallop, Placopecten magellanicus

1984 ◽  
Vol 42 ◽  
pp. 312-313
Author(s):  
C.V.L. Powell
Keyword(s):  
Fine Structure ◽  
Electron Microscope ◽  
Light Intensity ◽  
Scanning Electron Microscope ◽  
Eye Development ◽  
Preliminary Observation ◽  
Columnar Epithelium ◽  
Placopecten Magellanicus ◽  
Environmental Light ◽  
Scanning Electron

The overall fine structure of the eye in Placopecten is similar to that of other scallops. The optic tentacle consists of an outer columnar epithelium which is modified into a pigmented iris and a cornea (Fig. 1). This capsule encloses the cellular lens, retina, reflecting argentea and the pigmented tapetum. The retina is divided into two parts (Fig. 2). The distal retina functions in the detection of movement and the proximal retina monitors environmental light intensity. The purpose of the present study is to describe the ultrastructure of the retina as a preliminary observation on eye development. This is also the first known presentation of scanning electron microscope studies of the eye of the scallop.

High-Resolution, Low-Voltage SEM of Cell Wall Regeneration of Yeast Shizosaccharomyces Pombe Protoplasts

1988 ◽  
Vol 46 ◽  
pp. 208-211
Author(s):  
M. Osumi ◽  
N. Yamada ◽  
T. Nagatani
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Low Voltage ◽  
Cell Wall Regeneration ◽  
The Past ◽  
The Poor ◽  
Probe Size ◽  
Beam Damage ◽  
Biological Field ◽  
Scanning Electron

Even though many early workers had suggested the use of lower voltages to increase topographic contrast and to reduce specimen charging and beam damage, we did not usually operate in the conventional scanning electron microscope at low voltage because of the poor resolution, especially of bioligical specimens. However, the development of the “in-lens” field emission scanning electron microscope (FESEM) has led to marked inprovement in resolution, especially in the range of 1-5 kV, within the past year. The probe size has been cumulated to be 0.7nm in diameter at 30kV and about 3nm at 1kV. We have been trying to develop techniques to use this in-lens FESEM at low voltage (LVSEM) for direct observation of totally uncoated biological specimens and have developed the LVSEM method for the biological field.

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