scholarly journals Electronic and Crystallographic Examinations of the Homoepitaxially Grown Rubrene Single Crystals

Materials ◽  
2020 ◽  
Vol 13 (8) ◽  
pp. 1978 ◽  
Author(s):  
Yasuo Nakayama ◽  
Masaki Iwashita ◽  
Mitsuru Kikuchi ◽  
Ryohei Tsuruta ◽  
Koki Yoshida ◽  
...  
Keyword(s):  
Single Crystals ◽  
Valence Band ◽  
Lattice Distortion ◽  
Grazing Incidence ◽  
Valence Band Maximum ◽  
X Ray Diffraction ◽  
X Ray ◽  
Homoepitaxial Growth ◽  
Highly Sensitive ◽  
Doping Ratio

Homoepitaxial growth of organic semiconductor single crystals is a promising methodology toward the establishment of doping technology for organic opto-electronic applications. In this study, both electronic and crystallographic properties of homoepitaxially grown single crystals of rubrene were accurately examined. Undistorted lattice structures of homoepitaxial rubrene were confirmed by high-resolution analyses of grazing-incidence X-ray diffraction (GIXD) using synchrotron radiation. Upon bulk doping of acceptor molecules into the homoepitaxial single crystals of rubrene, highly sensitive photoelectron yield spectroscopy (PYS) measurements unveiled a transition of the electronic states, from induction of hole states at the valence band maximum at an adequate doping ratio (10 ppm), to disturbance of the valence band itself for excessive ratios (≥ 1000 ppm), probably due to the lattice distortion.

The importance of cation–cation repulsion in the zircon–reidite phase transition and radiation-damaged zircon

2019 ◽  
Vol 83 (4) ◽  
pp. 561-567
Author(s):  
Makoto Tokuda ◽  
Akira Yoshiasa ◽  
Hiroshi Kojitani ◽  
Saki Hashimoto ◽  
Seiichiro Uehara ◽  
...  
Keyword(s):  
Phase Transition ◽  
Single Crystals ◽  
Lattice Distortion ◽  
Thermal Recovery ◽  
Radioactive Elements ◽  
X Ray Diffraction ◽  
Natural Radiation ◽  
X Ray

AbstractSingle crystals of synthetic reidite and natural radiation-damaged zircon from Okueyama, Japan were investigated using X-ray diffraction. The pressure-induced zircon–reidite transition is described by the twisting and translations of SiO4 tetrahedra with disappearance of the SiO4–ZrO8 shared edges. The lattice of radiation-damaged zircons expands mainly from α-decays of radioactive elements such as U and Th. Although old radiation-damaged zircons show anomolous lattice distortion, young radiation-damaged zircons do not show such distortions. These distortions are caused by thermal recovery that suppresses the Si4+–Zr4+ repulsion between the SiO4 tetrahedron and ZrO8 dodecahedron. These changes in structure can be understood by considering the cation–cation repulsion between the SiO4–ZrO8 shared edges.

Orthorhombic lattice deformation of CuAlBe shape-memory single crystals under cyclic strain

2001 ◽  
Vol 34 (6) ◽  
pp. 722-729 ◽  
Author(s):  
A. Tidu ◽  
A. Eberhardt ◽  
B. Bolle ◽  
F. Moreau ◽  
J.-J. Heizmann
Keyword(s):  
Shape Memory ◽  
Single Crystals ◽  
Fatigue Test ◽  
Lattice Distortion ◽  
Cyclic Strain ◽  
Fatigue Behaviour ◽  
X Ray Diffraction ◽  
Strong Decrease ◽  
X Ray ◽  
Ray Methods

X-ray diffraction experiments were carried out to prove that X-ray methods can be used to assess strain-induced fatigue in CuAlBe shape-memory alloys. The pseudoelastic fatigue behaviour of CuAlBe single crystals presents a strong decrease of the critical stress of the martensitic transformation. During the fatigue test, the austenitic lattice exhibits a lattice distortion. This lattice distortion evolves during the fatigue test: the austenitic cubic lattice (β1) tends to transform gradually towards an orthorhombic one. Various hypotheses concerning this lattice distortion are proposed.

Lattice distortion analysis of nonpolar a-plane $$(11\bar 20)$$ GaN films by using a grazing-incidence X-ray diffraction technique

2015 ◽  
Vol 66 (4) ◽  
pp. 607-611 ◽  
Author(s):  
Yong Gon Seo ◽  
Jihoon Kim ◽  
Sung-Min Hwang ◽  
Jihyun Kim ◽  
Soohwan Jang ◽  
...  
Keyword(s):  
Lattice Distortion ◽  
Grazing Incidence ◽  
X Ray Diffraction ◽  
X Ray ◽  
Distortion Analysis

New Structure of CTAB Templated Silica Films as revealed by GISAXS coupled to HRTEM

2000 ◽  
Vol 628 ◽  
Author(s):  
Sophie Besson ◽  
Catherine Jacquiod ◽  
Thierry Gacoin ◽  
André Naudon ◽  
Christian Ricolleau ◽  
...  
Keyword(s):  
Cetyltrimethylammonium Bromide ◽  
Grazing Incidence ◽  
Hexagonal Structure ◽  
X Ray Diffraction ◽  
Electronic Microscopy ◽  
Silica Films ◽  
X Ray ◽  
X Ray Scattering ◽  
Hexagonal Arrangement ◽  
Spherical Micelles

ABSTRACTA microstructural study on surfactant templated silica films is performed by coupling traditional X-Ray Diffraction (XRD) and Transmission Electronic Microscopy (TEM) to Grazing Incidence Small Angle X-Ray Scattering (GISAXS). By this method it is shown that spin-coating of silicate solutions with cationic surfactant cetyltrimethylammonium bromide (CTAB) as a templating agent provides 3D hexagonal structure (space group P63/mmc) that is no longer compatible with the often described hexagonal arrangement of tubular micelles but rather with an hexagonal arrangement of spherical micelles. The extent of the hexagonal ordering and the texture can be optimized in films by varying the composition of the solution.

Effect of trytophan as dopant on potassium acid phthalate single crystals

2019 ◽  
Author(s):  
Chem Int
Keyword(s):  
Single Crystals ◽  
Room Temperature ◽  
Visible Region ◽  
X Ray Diffraction ◽  
X Ray ◽  
Slow Evaporation Technique ◽  
Absorption Studies ◽  
Evaporation Technique ◽  
Potassium Acid Phthalate ◽  
Acid Phthalate

Optically transparent single crystals of potassium acid phthalate (KAP, 0.5 g) 0.05 g and 0.1 g (1 and 2 mol %) trytophan were grown in aqueous solution by slow evaporation technique at room temperature. Single crystal X- ray diffraction analysis confirmed the changes in the lattice parameters of the doped crystals. The presence of functional groups in the crystal lattice has been determined qualitatively by FTIR analysis. Optical absorption studies revealed that the doped crystals possess very low absorption in the entire visible region. The dielectric constant has been studied as a function of frequency for the doped crystals. The thermal stability was evaluated by TG-DSC analysis.

scholarly journals Some Novel Cobalt Diphenylphosphine Complexes: Synthesis, Characterization, and Behavior in the Polymerization of 1,3-Butadiene

Molecules ◽  
2021 ◽  
Vol 26 (13) ◽  
pp. 4067
Author(s):  
Giovanni Ricci ◽  
Giuseppe Leone ◽  
Giorgia Zanchin ◽  
Benedetta Palucci ◽  
Alessandra Forni ◽  
...  
Keyword(s):  
Crystal Structure ◽  
Single Crystals ◽  
The Novel ◽  
X Ray Diffraction ◽  
X Ray ◽  
And Behavior

Some novel cobalt diphenylphosphine complexes were synthesized by reacting cobalt(II) chloride with (2-methoxyethyl)diphenylphosphine, (2-methoxyphenyl)diphenylphosphine, and 2-(1,1-dimethylpropyl)-6-(diphenylphosphino)pyridine. Single crystals suitable for X-ray diffraction studies were obtained for the first two complexes, and their crystal structure was determined. The novel compounds were then used in association with methylaluminoxane (MAO) for the polymerization of 1,3-butadiene, and their behavior was compared with that exhibited in the polymerization of the same monomer by the systems CoCl2(PnPrPh2)2/MAO and CoCl2(PPh3)2/MAO. Some significant differences were observed depending on the MAO/Co ratio used, and a plausible interpretation for such a different behavior is proposed.

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