scholarly journals Reliability of X7R Multilayer Ceramic Capacitors During High Accelerated Life Testing (HALT)

Materials ◽  
2018 ◽  
Vol 11 (10) ◽  
pp. 1900 ◽  
Author(s):  
Ana Hernández-López ◽  
Juan Aguilar-Garib ◽  
Sophie Guillemet-Fritsch ◽  
Roman Nava-Quintero ◽  
Pascal Dufour ◽  
...  
Keyword(s):  
Operating Conditions ◽  
Time To Failure ◽  
Multilayer Ceramic Capacitors ◽  
Thermal Failure ◽  
Accelerated Life Tests ◽  
Accelerated Life ◽  
Essential Components ◽  
Ceramic Capacitors ◽  
Life Tests ◽  
Multilayer Ceramic

Multilayer ceramic capacitors (MLCC) are essential components for determining the reliability of electronic components in terms of time to failure. It is known that the reliability of MLCCs depends on their composition, processing, and operating conditions. In this present work, we analyzed the lifetime of three similar X7R type MLCCs based on BaTiO3 by conducting High Accelerated Life Tests (HALT) at temperatures up to 200 °C at 400 V and 600 V. The results were adjusted to an Arrhenius equation, which is a function of the activation energy (Ea) and a voltage stress exponent (n), in order to predict their time to failure. The values of Ea are in the range of 1–1.45 eV, which has been reported for the thermal failure and dielectric wear out of BaTiO3-based dielectric capacitors. The stress voltage exponent value was in the range of 4–5. Although the Ea can be associated with a failure mechanism, n only gives an indication of the effect of voltage in the tests. It was possible to associate those values with each type of tested MLCC so that their expected life could be estimated in the range of 400–600 V.

Dielectric properties and energy storage capability of antiferroelectric Pb0.92La0.08Zr0.95Ti0.05O3 film-on-foil capacitors

2009 ◽  
Vol 24 (9) ◽  
pp. 2993-2996 ◽  
Author(s):  
Beihai Ma ◽  
Do-Kyun Kwon ◽  
Manoj Narayanan ◽  
U. (Balu) Balachandran
Keyword(s):  
Phase Transition ◽  
Room Temperature ◽  
Bias Field ◽  
Time To Failure ◽  
Loop Analysis ◽  
Solution Deposition ◽  
Lanthanum Nickel Oxide ◽  
Accelerated Life Tests ◽  
Accelerated Life ◽  
Life Tests

Antiferroelectric (AFE) Pb0.92La0.08Zr0.95Ti0.05O3 (PLZT) films were grown on nickel foils with lanthanum nickel oxide buffer by chemical solution deposition. We observed field-induced AFE-to-ferroelectric (FE) phase transition. The electric field for the AFE-to-FE phase transition (EAF ≈ 270 kV/cm) and that for the reverse phase transition (EFA ≈ 230 kV/cm) were measured at room temperature on samples with PLZT films of ≈1-µm thickness. Relative permittivity of ≈560 and dielectric loss of <0.05 were measured near zero DC bias field. Hysteresis loop analysis showed that energy densities of ≈53 and 37 J/cm3 can be stored and recovered from the film-on-foil capacitors at 25 and 150 °C, respectively. Highly accelerated life tests were conducted. The projected mean time to failure is >5000 h when the capacitors are operated at room temperature with an applied field of ≈300 kV/cm.

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