scholarly journals The Effects of MnO2 Addition on the Physical Properties of Pb(Ni1/3Nb2/3)O3-Pb(Zr,Ti)O3-Pb(Mg1/2W1/2)O3-BiFeO3 Ceramics

Crystals ◽  
2021 ◽  
Vol 11 (3) ◽  
pp. 269
Author(s):  
Juhyun Yoo ◽  
Jonghyun Lee
Keyword(s):  
Dielectric Constant ◽  
Low Temperature ◽  
Physical Properties ◽  
Piezoelectric Properties ◽  
Piezoelectric Actuators ◽  
Low Dielectric Constant ◽  
Low Temperature Sintering ◽  
Device Application ◽  
Low Dielectric ◽  
Piezoelectric Devices

In this paper, for the application to multi-layer piezoelectric devices capable of being used in piezoelectric speakers, Pb(Ni1/3Nb2/3)O3-Pb(Zr,Ti)O3-BiFeO3 ceramics substituted with Pb(Mg1/2W1/2)O3 were manufactured according to MnO2 addition, and their physical properties were studied. At non-doped MnO2 added specimen, the maximum values of piezoelectric properties were shown, respectively: the εr of 2182, d33 of 513 pC/N, and kp of 0.634. When taking into consideration the low dielectric constant and high d33 in case of increasing the numbers of multilayer in ceramics, the x = 0.2 composition ceramics was suitable for the device application such as speaker using low-temperature sintering multilayer piezoelectric actuators.

Low-Temperature Sintering and Microwave Dielectric Properties of (Ca0.9Mg0.1)SiO3 Ceramic with Li2CO3 Addition

2014 ◽  
Vol 602-603 ◽  
pp. 748-751 ◽  
Author(s):  
Xin Hui Zhao ◽  
Min Jia Wang ◽  
Qi Long Zhang ◽  
Hui Yang
Keyword(s):  
Dielectric Constant ◽  
Dielectric Properties ◽  
Low Temperature ◽  
Sintering Temperature ◽  
Microwave Dielectric Properties ◽  
Low Dielectric Constant ◽  
Low Temperature Sintering ◽  
Low Dielectric ◽  
Densification Temperature ◽  
Microwave Dielectric

(Ca0.9Mg0.1)SiO3ceramics possess a low dielectric constant and a highQfvalue, however, the densification temperature of (Ca0.9Mg0.1)SiO3ceramics is higher than 1280°C. In this paper, the effect of Li2CO3addition on sinterability and dielectric properties of (Ca0.9Mg0.1)SiO3ceramics were studied. The phase presence and surface morphology were determined by XRD and SEM techniques, respectively. CaSiO3and Ca2MgSi2O7phases were observed. With the addition of >2.0 wt% Li2CO3, the sintering temperature of (Ca0.9Mg0.1)SiO3ceramic was significantly lowered, reaching to 1070°C. (Ca0.9Mg0.1)SiO3ceramics with 4wt% Li2CO3sintered at 1070°C for 3 h shows excellent dielectric properties:εr=5.91,Qf= 15300GHz (at 10GHz).

Comparison of Three Low Dielectric Constant Organic Polymers

1996 ◽  
Vol 443 ◽  
Author(s):  
C. B. Case ◽  
C. J. Case ◽  
A. Kornblit ◽  
M. E. Mills ◽  
D. Castillo ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Low Temperature ◽  
Physical Properties ◽  
Material Properties ◽  
Low Dielectric Constant ◽  
Organic Polymers ◽  
Low Dielectric ◽  
Multi Level

AbstractThree low dielectric constant organic polymers are being investigated for possible use in a conventional, subtractive etch, multi-level metal process with PVD Al plugs. Material properties, physical properties, planarization ability and etch chemistries are compared, as well as the possibility of using these materials in a low temperature PVD A1 plug process.

Photo-induced Large Area Growth Of Dielectrics With Excimer Lamps

2000 ◽  
Vol 617 ◽  
Author(s):  
Ian W. Boyd ◽  
Jun-Ying Zhang
Keyword(s):  
Thin Films ◽  
Dielectric Constant ◽  
Low Temperature ◽  
Leakage Current ◽  
Sol Gel ◽  
Low Dielectric Constant ◽  
Large Area ◽  
Excimer Lamp ◽  
Low Dielectric ◽  
Current Densities

AbstractIn this paper, UV-induced large area growth of high dielectric constant (Ta2O5, TiO2and PZT) and low dielectric constant (polyimide and porous silica) thin films by photo-CVD and sol-gel processing using excimer lamps, as well as the effect of low temperature LW annealing, are discussed. Ellipsometry, Fourier transform infrared spectroscopy (FTIR), X-ray photoelectron spectroscopy (XPS), UV spectrophotometry, atomic force microscope (AFM), capacitance-voltage (C-V) and current-voltage (I-V) measurements have been employed to characterize oxide films grown and indicate them to be high quality layers. Leakage current densities as low as 9.0×10−8 Acm−2 and 1.95×10−7 Acm−2 at 0.5 MV/cm have been obtained for the as-grown Ta2O5 films formed by photo-induced sol-gel processing and photo-CVD. respectively - several orders of magnitude lower than for any other as-grown films prepared by any other technique. A subsequent low temperature (400°C) UV annealing step improves these to 2.0×10−9 Acm−2 and 6.4× 10−9 Acm−2, respectively. These values are essentially identical to those only previously formed for films annealed at temperatures between 600 and 1000°C. PZT thin films have also been deposited at low temperatures by photo-assisted decomposition of a PZT metal-organic sol-gel polymer using the 172 nm excimer lamp. Very low leakage current densities (10−7 A/cm2) can be achieved, which compared with layers grown by conventional thermal processing. Photo-induced deposition of low dielectric constant organic polymers for interlayer dielectrics has highlighted a significant role of photo effects on the curing of polyamic acid films. I-V measurements showed the leakage current density of the irradiated polymer films was over an order of magnitude smaller than has been obtained in the films prepared by thermal processing. Compared with conventional furnace processing, the photo-induced curing of the polyimide provided both reduced processing time and temperature, A new technique of low temperature photo-induced sol-gel process for the growth of low dielectric constant porous silicon dioxide thin films from TEOS sol-gel solutions with a 172 nm excimer lamp has also been successfully demonstrated. The dielectric constant values as low as 1.7 can be achieved at room temperature. The applications investigated so far clearly demonstrate that low cost high power excimer lamp systems can provide an interesting alternative to conventional UV lamps and excimer lasers for industrial large-scale low temperature materials processing.

Camber development during cofiring Ag-based low-dielectric-constant ceramic package

1997 ◽  
Vol 12 (10) ◽  
pp. 2743-2750 ◽  
Author(s):  
Jau-Ho Jean ◽  
Chia-Ruey Chang
Keyword(s):  
Dielectric Constant ◽  
Low Temperature ◽  
Layered Structure ◽  
Mathematical Analysis ◽  
Low Dielectric Constant ◽  
Green Tape ◽  
Root Cause ◽  
Low Dielectric ◽  
Ag Film ◽  
Good Agreement

Camber (curvature) development during cofiring a two-layered structure of Ag film/low-dielectric-constant, low-temperature cofired ceramic (LTCC) green tape has been investigated. At a given thickness of Ag film, both the camber and camber rate decrease linearly with increasing the square thickness of LTCC. Densification mismatch between Ag and LTCC is attributed to be the root cause for the camber generation during cofiring. Mathematical analysis is made to theoretically describe the camber development, and the results show a fairly good agreement with experimental observations.

Low‐Dielectric Constant and Low‐Temperature Curable Polyimide/POSS Nanocomposites

2019 ◽  
Vol 304 (12) ◽  
pp. 1900505 ◽  
Author(s):  
Chao Huang ◽  
Jinhui Li ◽  
Guangxia Xie ◽  
Fei Han ◽  
Dongxu Huang ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Low Temperature ◽  
Low Dielectric Constant ◽  
Low Dielectric

scholarly journals Fabrication and performance of PNN-PZT piezoelectric ceramics obtained by low-temperature sintering

2020 ◽  
Vol 27 (1) ◽  
pp. 359-365
Author(s):  
Jing Zhang ◽  
Yuansong Zhang ◽  
Zhoumin Yan ◽  
Anjiu Wang ◽  
Ping Jiang ◽  
...  
Keyword(s):  
Phase Transition ◽  
Low Temperature ◽  
Piezoelectric Actuators ◽  
Piezoelectric Ceramics ◽  
Low Temperature Sintering ◽  
Pure Perovskite Structure ◽  
Pzt Ceramics ◽  
Low Dielectric ◽  
Diffusion Phase ◽  
And Performance

AbstractThe Pb(Ni1/3Nb2/3)O3-Pb(ZrxTi1−x)O3 (PNN-PZT) piezoelectric ceramics with CuO and LiBiO2 doping were successfully fabricated by the low-temperature solid-state reaction to effectively restrain the PbO volatilization. The microstructure and electrical properties of the PNN-PZT ceramics were characterized. The experimental results reveal that the PNN-PZT ceramics are composed of a pure perovskite structure in which the rhombohedral and tetragonal phases coexist. Meanwhile, the good electric properties, including low dielectric loss, outstanding diffusion phase transition and palpable dielectric relaxation, are exhibited in PNN-PZT ceramics with 0.2 wt.% CuO and 1 wt.% LiBiO2 addition. This piezoceramic composition possibly provides a reference for the application of multi-layer piezoelectric actuators.

Introducing DuPont™ GreenTape™ 9K5 Low Dielectric Constant, Low Temperature Co-Fired Ceramic (LTCC) Tape System

2011 ◽  
Vol 2011 (1) ◽  
pp. 000544-000552
Author(s):  
Deepukumar M. Nair ◽  
James Parisi ◽  
K.M. Nair ◽  
Mark McCombs ◽  
Michael Smith ◽  
...  
Keyword(s):  
Dielectric Constant ◽  
Low Temperature ◽  
Millimeter Wave ◽  
High Speed ◽  
High Reliability ◽  
Signal Propagation ◽  
Dielectric Constants ◽  
Low Dielectric Constant ◽  
Material System ◽  
Low Dielectric

Low Temperature Co-fired Ceramic (LTCC) material systems have been successfully used in microwave and millimeter wave systems for several years. LTCC has very low dielectric loss, high reliability due to inherent hermeticity; high interconnect density, multilayer processing capability leading to true 3D packaging, and better cost-performance balance. While the medium range dielectric constants (7.00 – 8.00) offered by current tape systems have advantages, it is generally difficult to realize high speed systems and efficient antennas on LTCC, especially at millimeter wave frequencies. The difficulty arises from the reduced signal propagation velocity in high-speed applications, and lower radiation efficiency for antennas, both due to higher dielectric constant. To enable and extend applications of LTCC technology to these subsystems, DuPont has developed a new low dielectric constant LTCC system – DuPont™ GreenTape™ 9K5 - which has a dielectric constant of 5.80 (at 10 GHz) that is compatible with the commercial DuPont™ GreenTape™ 9K7 LTCC System. This is achieved without compromising excellent microwave loss properties of the 9KX GreenTape™ platform. These materials systems enable high-speed, high reliability applications while also realizing efficient antennas on LTCC. This paper presents initial characterization of the new DuPont™ GreenTape™ 9K5 LTCC system consisting of low K dielectric tape, gold and silver conductors to evaluate the effects of chemistry, processing conditions, processing latitude, microstructure, and microwave performance. Test coupons with various transmission and resonating structures are designed, fabricated, and tested for the evaluation of transmission losses and dielectric properties. Stability of the material system over multiple re-fire steps is also examined

Microstructure and Piezoelectric Properties of 0.97(Na, K, Li)(Nb, Sb, Ta)O3-0.03(Bi, Na, Sr)ZrO3 Ceramics Doped with Boron Oxide for Piezoelectric Actuator

2021 ◽  
Vol 21 (3) ◽  
pp. 2059-2062
Author(s):  
Ju-Hyun Yoo ◽  
Yeong-Ho Jeong
Keyword(s):  
Low Temperature ◽  
Physical Properties ◽  
Piezoelectric Actuator ◽  
Boron Oxide ◽  
Perovskite Structure ◽  
Piezoelectric Properties ◽  
Piezoelectric Actuators ◽  
Pure Perovskite Structure

In this study, with the motivation of developing low temperature sintered Pb-free ceramics for use in piezoelectric actuators, 0.97(Na0.52K0.443Li0.037)(Nb0.923Sb0.04Ta0.037)O3 − 0.03 (Bi0.5Na0.5)0.9 (Sr)0.1ZrO3 ceramics were manufactured and their piezoelectric properties analyzed. All specimens doped with boron oxide showed a typical pure perovskite structure. The ceramics with x = 0.1 composition showed a co-existence of R-T phases. When boron oxide is doped at 0.1 wt%, excellent physical properties of d33 = 270 pC/N εr = 1386, kp = 0.416, and Qm = 130 were obtained making the ceramic ideal for use in piezoelectric actuators.

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