scholarly journals Quantitative Distribution of DNA, RNA, Histone and Proteins Other than Histone in Mammalian Cells, Nuclei and a Chromosome at High Resolution Observed by Scanning Transmission Soft X-Ray Microscopy (STXM)

Cells ◽  
2019 ◽  
Vol 8 (2) ◽  
pp. 164 ◽  
Author(s):  
Kunio Shinohara ◽  
Shigenobu Toné ◽  
Takeo Ejima ◽  
Takuji Ohigashi ◽  
Atsushi Ito

Soft X-ray microscopy was applied to study the quantitative distribution of DNA, RNA, histone, and proteins other than histone (represented by BSA) in mammalian cells, apoptotic nuclei, and a chromosome at spatial resolutions of 100 to 400 nm. The relative distribution of closely related molecules, such as DNA and RNA, was discriminated by the singular value decomposition (SVD) method using aXis2000 software. Quantities of nucleic acids and proteins were evaluated using characteristic absorption properties due to the 1s–π * transition of N=C in nucleic acids and amide in proteins, respectively, in the absorption spectra at the nitrogen K absorption edge. The results showed that DNA and histone were located in the nucleus. By contrast, RNA was clearly discriminated and found mainly in the cytoplasm. Interestingly, in a chromosome image, DNA and histone were found in the center, surrounded by RNA and proteins other than histone. The amount of DNA in the chromosome was estimated to be 0.73 pg, and the content of RNA, histone, and proteins other than histone, relative to DNA, was 0.48, 0.28, and 4.04, respectively. The method we present in this study could be a powerful approach for the quantitative molecular mapping of biological samples at high resolution.

2015 ◽  
Vol 44 (3) ◽  
pp. 163-168 ◽  
Author(s):  
G. Kourousias ◽  
L. Pascolo ◽  
P. Marmorato ◽  
J. Ponti ◽  
G. Ceccone ◽  
...  

1989 ◽  
Vol 169 ◽  
Author(s):  
D. H. Shin ◽  
J. Silcox ◽  
S. E. Russek ◽  
D. K. Lathrop ◽  
R. A. Buhrman

AbstractGrain boundaries in thin films of high Tc YBa2Cu3O7-x superconductors have been investigated with high resolution scanning transmission electron microscope (STEM) imaging and nanoprobe energy dispersive x-ray (EDX) analysis. Atomic resolution images indicate that the grain boundaries are mostly clean, i.e., free of a boundary layer of different phase or of segregation, and are often coherent. EDX microanalysis with a 10 Å spatial resolution also indicates no composition deviation at the grain boundaries.


2014 ◽  
Vol 70 (6) ◽  
pp. 521-523
Author(s):  
Sarah J. Haigh

The latest generation of scanning transmission electron microscopes equipped with high-efficiency energy-dispersive X-ray detectors are breaking new ground with respect to high-resolution elemental imaging of materials. In this issue, Paulauskaset al.[Acta Cryst.(2014), A70, 524–531] demonstrate impressive results when applying this technique to improve understanding of CdTe dislocation structures.


1997 ◽  
Vol 482 ◽  
Author(s):  
H. Lakner ◽  
Q. Liu ◽  
G. Brockt ◽  
A. Radefeld ◽  
F. Schulze-Kraasch ◽  
...  

AbstractWurtzite InGaN/GaN and AlGaN/GaN heterostructures grown on sapphire by metal organic vapor phase epitaxy were studied using scanning transmission electron microscopy (STEM), cathodoluminescence (CL) combined with secondary electron (SE) imaging, high resolution x-ray diffractometry (HRXRD), and atomic force microscopy (AFM).SE imaging and AFM were used to study the surface morphology. The results indicate the presence of the following structural defects on the surface of InGaN/GaN heterostructures: hexagonal mesa-like structures, hexagonal pyramids and micropipes, while the surface of the AlGaN/GaN heterostructures are mirror-like smooth. The local optical properties of defects and defect free regions were studied using spatially resolved CL at low temperature. In addition, the dependence of the optical properties of both sorts of heterostructures on the quantum well width or chemical composition of ternary materials was investigated. The structural properties of the heterostructures were studied by STEM and HRXRD. Convergent beam electron diffraction (CBED) and corresponding simulations, convergent beam imaging (CBIM), and high resolution x-ray diffraction (HRXRD) were used to study the strained layers. Dislocations and interface properties were characterized using bright-field imaging, while the chemical compositions fluctuations were analyzed by Z-contrast imaging and energy dispersive x-ray microanalysis (EDX).


2017 ◽  
Vol 849 ◽  
pp. 012003 ◽  
Author(s):  
K Shinohara ◽  
T Ohigashi ◽  
S Toné ◽  
M Kado ◽  
A Ito

1968 ◽  
Vol 46 (1) ◽  
pp. 51-56 ◽  
Author(s):  
Chong W. Chang

Observation was made of effects of X-irradiation on DNA and RNA metabolism by means of rates of 32P incorporation into the nucleic acids during barley embryogeny.Levels of disturbances in 32P incorporation rates into DNA caused by X-rays are correlated inversely with the periods of postirradiation and proportionally related to tissue heterogeneity at the time of X-irradiation with the exception of the oldest embryos. Changes in 32P labelling of RNA induced by X-rays during barley embryonic development, however, are independent of the postirradiation periods and differences in the tissue heterogeneity. The levels of differences due to X-rays in 32P incorporation rates into the DNA of the three different regions of a mature embryo reflect the degree of tissue heterogeneity within the embryos at the time of X-ray treatment. Disturbances in the rates of 32P incorporation into DNA are greatest in the root tissue and least in the scutellar region; the shoot part is rated between the levels of the two tissue regions. In contrast, responses of 32P labelling rates of RNA to X-rays in the three different parts of a mature embryo are found to be independent of the tissue heterogeneity at the time of X-ray treatment and the postirradiation period during embryogeny.


2003 ◽  
Vol 11 (6) ◽  
pp. 8-13 ◽  
Author(s):  
Nestor J. Zaluzec

Imaging of sub-micron , sub-surface features of thick optically dense materials at high resolution has always been a difficult and/or time consuming task in materials research. For the most part this role has been relegated to technologically complex and expensive instrumentation having highly penetrating radiation, such as the synchrotron- based Scanning Transmission X-ray Microscope (STXM) or involves the careful preparation of thin cross-section slices for study using the Transmission/Scanning Transmission Electron Microscope (TEM/STEM).


2018 ◽  
Vol 26 (6) ◽  
pp. 877-884 ◽  
Author(s):  
Kunio Shinohara ◽  
Atsushi Ito ◽  
Takuji Ohigashi ◽  
Masataka Kado ◽  
Shigenobu Toné

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