scholarly journals A Review of X-ray Microcalorimeters Based on Superconducting Transition Edge Sensors for Astrophysics and Particle Physics

2021 ◽  
Vol 11 (9) ◽  
pp. 3793
Author(s):  
Luciano Gottardi ◽  
Kenichiro Nagayashi
Keyword(s):  
Low Temperature ◽  
Energy Resolution ◽  
Particle Physics ◽  
State Of The Art ◽  
Transition Edge Sensors ◽  
The State ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
The Way

The state-of-the-art technology of X-ray microcalorimeters based on superconducting transition-edge sensors (TESs), for applications in astrophysics and particle physics, is reviewed. We will show the advance in understanding the detector physics and describe the recent breakthroughs in the TES design that are opening the way towards the fabrication and the read-out of very large arrays of pixels with unprecedented energy resolution. The most challenging low temperature instruments for space- and ground-base experiments will be described.

scholarly journals X-ray Microcalorimeter Based on Superconducting Transition Edge Sensors

2008 ◽  
Vol 24 (1) ◽  
pp. 11-14 ◽  
Author(s):  
Masashi OHNO ◽  
Hiroyuki TAKAHASHI ◽  
R. M. Thushara DAMAYANTHI ◽  
Yasuhiro MINAMIKAWA ◽  
Fumiakira MORI
Keyword(s):  
Transition Edge Sensors ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge

High-resolution X-ray emission spectroscopy with transition-edge sensors: present performance and future potential

2015 ◽  
Vol 22 (3) ◽  
pp. 766-775 ◽  
Author(s):  
J. Uhlig ◽  
W. B. Doriese ◽  
J. W. Fowler ◽  
D. S. Swetz ◽  
C. Jaye ◽  
...  
Keyword(s):  
High Resolution ◽  
Emission Spectroscopy ◽  
Electronic Configuration ◽  
Transition Edge Sensors ◽  
Complex Compounds ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
Wide Range ◽  
Low Efficiency

X-ray emission spectroscopy (XES) is a powerful element-selective tool to analyze the oxidation states of atoms in complex compounds, determine their electronic configuration, and identify unknown compounds in challenging environments. Until now the low efficiency of wavelength-dispersive X-ray spectrometer technology has limited the use of XES, especially in combination with weaker laboratory X-ray sources. More efficient energy-dispersive detectors have either insufficient energy resolution because of the statistical limits described by Fano or too low counting rates to be of practical use. This paper updates an approach to high-resolution X-ray emission spectroscopy that uses a microcalorimeter detector array of superconducting transition-edge sensors (TESs). TES arrays are discussed and compared with conventional methods, and shown under which circumstances they are superior. It is also shown that a TES array can be integrated into a table-top time-resolved X-ray source and a soft X-ray synchrotron beamline to perform emission spectroscopy with good chemical sensitivity over a very wide range of energies.

EDS x-ray microcalorimeters with 13 eV energy resolution

1996 ◽  
Vol 54 ◽  
pp. 488-489
Author(s):  
D. A. Wollman ◽  
G. C. Hilton ◽  
K. D. Irwin ◽  
J. M. Martinis
Keyword(s):  
Energy Resolution ◽  
Temperature Rise ◽  
Energy Dispersive Spectroscopy ◽  
Transition Edge Sensor ◽  
Electrical Contact ◽  
Low Energy ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
Eds Microanalysis

Although Si- and Ge-based Energy Dispersive Spectroscopy (EDS) detectors are by far the most commonly used x-ray spectrometers for microanalysis, they are limited by energy resolutions on the order of 100 eV. This low energy resolution is insufficient to clearly resolve many peak overlaps between Kα x-ray lines of different elements. In addition, many L and M lines of heavier elements fall in the 100 eV to 2 keV energy range, making it difficult in complicated spectra to identify and quantify the presence of technologically important lighter elements. Higher energy resolution and good count rates are necessary to provide improved limits of detectability.We are developing a cryogenic x-ray microcalorimeter with significantly improved energy resolution and a count rate and detector area suitable for EDS microanalysis. In a calorimeter, the energy of an x-ray is converted to heat, and a measurement of the temperature rise of the detector gives the deposited photon energy. Our microcalorimeter detector consists of a normal-metal x-ray absorber which is in thermal and electrical contact with a superconducting transition-edge sensor (TES).

Energy calibration of superconducting transition edge sensors for x-ray detection using pulse analysis

2006 ◽  
Vol 77 (5) ◽  
pp. 053105 ◽  
Author(s):  
C. Hollerith ◽  
B. Simmnacher ◽  
R. Weiland ◽  
F. v. Feilitzsch ◽  
C. Isaila ◽  
...  
Keyword(s):  
Transition Edge Sensors ◽  
Energy Calibration ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
Pulse Analysis

The Next Generation of EDS: Microcalorimeter Eds With 3 eV Energy Resolution

1998 ◽  
Vol 4 (S2) ◽  
pp. 172-173
Author(s):  
John M. Martinis ◽  
K. D. Irwin ◽  
D. A. Wollman ◽  
G. C. Hilton ◽  
L. L. Dulcie ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Quantum Interference ◽  
Pulse Shaping ◽  
Superconducting Transition ◽  
X Ray ◽  
Transition Edge ◽  
Adiabatic Demagnetization ◽  
Pile Up ◽  
Channel Analyzer ◽  
Shaping Amplifier

Semiconductor energy dispersive spectrometers (EDS), the most commonly used detectors for x-ray microanalysis, have matured to the point that significant improvement in energy resolution is not expected in the future. We believe a revolutionary advance in x-ray microanalysis will occur in the next few years due to the development of new x-ray spectrometers based on microcalorimeters. Energy resolution comparable with wavelength dispersive spectrometers, 3 eV to 10 eV, has already been achieved; future detectors may reach a fundamental limit as low as 0.5 eV to 1 eV.In a microcalorimeter, the energy of an x-ray is converted into heat, and a measurement of the temperature rise of the detector gives the deposited photon energy. Our microcalorimeter detector consists of a superconducting transition edge thermometer cooled to an operating temperature of 100 mK by a compact adiabatic demagnetization refrigerator, a read-out SQUID (Superconducting Quantum Interference Device) preamplifier followed by pulse-shaping amplifier and pile-up rejection circuitry, and a multi-channel analyzer with real-time computer interface.

Broadband high-energy resolution hard x-ray spectroscopy using transition edge sensors at SPring-8

2021 ◽  
Vol 92 (1) ◽  
pp. 013103
Author(s):  
Shinya Yamada ◽  
Yuto Ichinohe ◽  
Hideyuki Tatsuno ◽  
Ryota Hayakawa ◽  
Hirotaka Suda ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
Transition Edge Sensors ◽  
High Energy Resolution ◽  
X Ray ◽  
Transition Edge

scholarly journals Electroplating Deposition of Bismuth Absorbers for X-ray Superconducting Transition Edge Sensors

Materials ◽  
2021 ◽  
Vol 14 (23) ◽  
pp. 7169
Author(s):  
Jian Chen ◽  
Jinjin Li ◽  
Xiaolong Xu ◽  
Zhenyu Wang ◽  
Siming Guo ◽  
...  
Keyword(s):  
Transition Edge Sensors ◽  
Rhombohedral Structure ◽  
Superconducting Transition ◽  
X Ray Diffraction ◽  
High Quantum Efficiency ◽  
X Ray ◽  
Transition Edge ◽  
Average Grain Size ◽  
Xrd Patterns ◽  
Electroplating Process

An absorber with a high absorbing efficiency is crucial for X-ray transition edge sensors (TESs) to realize high quantum efficiency and the best energy resolution. Semimetal Bismuth (Bi) has shown greater superiority than gold (Au) as the absorber due to the low specific heat capacity, which is two orders of magnitude smaller. The electroplating process of Bi films is investigated. The Bi grains show a polycrystalline rhombohedral structure, and the X-ray diffraction (XRD) patterns show a typical crystal orientation of (012). The average grain size becomes larger as the electroplating current density and the thickness increase, and the orientation of Bi grains changes as the temperature increases. The residual resistance ratio (RRR) (R300 K/R4.2 K) is 1.37 for the Bi film (862 nm) deposited with 9 mA/cm2 at 40 °C for 2 min. The absorptivity of the 5 μm thick Bi films is 40.3% and 30.7% for 10 keV and 15.6 keV X-ray radiation respectively, which shows that Bi films are a good candidate as the absorber of X-ray TESs.

Sign in / Sign up

Export Citation Format

Share Document