Broadband high-energy resolution hard x-ray spectroscopy using transition edge sensors at SPring-8

2021 ◽  
Vol 92 (1) ◽  
pp. 013103
Author(s):  
Shinya Yamada ◽  
Yuto Ichinohe ◽  
Hideyuki Tatsuno ◽  
Ryota Hayakawa ◽  
Hirotaka Suda ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
Transition Edge Sensors ◽  
High Energy Resolution ◽  
X Ray ◽  
Transition Edge

Position-sensing transition-edge sensors for large-field high-energy-resolution x-ray imaging spectroscopy

2000 ◽  
Author(s):  
Enectali Figueroa-Feliciano ◽  
Caroline K. Stahle ◽  
Fred M. Finkbeiner ◽  
Mary J. Li ◽  
Mark A. Lindeman ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Imaging Spectroscopy ◽  
High Energy ◽  
Transition Edge Sensors ◽  
Large Field ◽  
High Energy Resolution ◽  
X Ray ◽  
Position Sensing ◽  
Transition Edge ◽  
X Ray Imaging

CORRELATION OF CRITICAL TEMPERATURES AND ELECTRICAL PROPERTIES IN TITANIUM FILMS

2003 ◽  
Vol 17 (04n06) ◽  
pp. 948-952 ◽  
Author(s):  
C. GANDINI ◽  
V. LACQUANITI ◽  
E. MONTICONE ◽  
C. PORTESI ◽  
M. RAJTERI ◽  
...  
Keyword(s):  
High Energy ◽  
Transition Edge Sensors ◽  
High Energy Resolution ◽  
Critical Temperatures ◽  
X Ray ◽  
Silicon Nitride Films ◽  
Transition Edge ◽  
Electrical Resistivities ◽  
Different Thickness ◽  
Deposition Substrate

Recently transition-edge sensors (TES) have obtained an increasing interest as light detectors due to their high energy resolution and broadband response. Titanium (Ti), with transition temperature up to 0.5 K, is among the suitable materials for TES application. In this work we investigate Ti films obtained from two materials of different purity deposited by e-gun on silicon nitride. Films with different thickness and deposition substrate temperature have been measured. Critical temperatures, electrical resistivities and structural properties obtained from x-ray are related to each other.

Transition Edge Sensor (TES) X-Ray Detecting System with Sensitivity Correction to Stabilize the Spectrum Peak Center

2014 ◽  
Vol 617 ◽  
pp. 233-236
Author(s):  
Keiichi Tanaka ◽  
Masataka Ohgaki ◽  
Hidekazu Suzuki ◽  
Masakatsu Hasuda ◽  
Masato Yano ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Transition Edge Sensor ◽  
High Energy ◽  
Transition Curve ◽  
High Energy Resolution ◽  
Time Interval ◽  
Heater Power ◽  
X Ray ◽  
Transition Edge ◽  
Superconducting Current

Transition Edge Sensor (TES) is an energy dispersive X-ray detecting system with high energy resolution. The energy resolution of this system depends on the steepness of superconducting transition curve from normal to superconducting state, heat capacitance and the operating temperature. The TES is based on the dilution refrigerator cooled by about 100 mK. The energy resolution is calculated about 1-2 eV for the detector with maximum detecting energy as 10 eV. The energy resolution also depends on the superconducting current flowing through the TES device because the superconducting current is affected by the temperature stability of the refrigerator. The fluctuation of the superconducting current means the fluctuation of the X-ray spectrum peak center. We have developed the sensitivity correction system to stabilize the peak center of the X-ray spectrum. The peak center of X-ray spectrum correlates with heater power to keep the base temperature of TES device at a constant temperature. The peak center of X-ray spectrum is calibrated by monitoring the heater power at constant time interval using the correlation curve between the peak center of X-ray spectrum and heater power.

scholarly journals High-Energy-Resolution Fluorescence-Detected X-ray Absorption of the Q Intermediate of Soluble Methane Monooxygenase

2017 ◽  
Vol 139 (49) ◽  
pp. 18024-18033 ◽  
Author(s):  
Rebeca G. Castillo ◽  
Rahul Banerjee ◽  
Caleb J. Allpress ◽  
Gregory T. Rohde ◽  
Eckhard Bill ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Methane Monooxygenase ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray ◽  
Soluble Methane Monooxygenase ◽  
X Ray Absorption

scholarly journals High-energy resolution X-ray absorption and emission spectroscopy reveals insight into unique selectivity of La-based nanoparticles for CO2

2015 ◽  
Vol 112 (52) ◽  
pp. 15803-15808 ◽  
Author(s):  
Ofer Hirsch ◽  
Kristina O. Kvashnina ◽  
Li Luo ◽  
Martin J. Süess ◽  
Pieter Glatzel ◽  
...  
Keyword(s):  
Energy Resolution ◽  
Emission Spectroscopy ◽  
High Energy ◽  
Unit Cell ◽  
High Energy Resolution ◽  
Electron Configuration ◽  
Edge Structure ◽  
X Ray ◽  
X Ray Absorption

The lanthanum-based materials, due to their layered structure and f-electron configuration, are relevant for electrochemical application. Particularly, La2O2CO3 shows a prominent chemoresistive response to CO2. However, surprisingly less is known about its atomic and electronic structure and electrochemically significant sites and therefore, its structure–functions relationships have yet to be established. Here we determine the position of the different constituents within the unit cell of monoclinic La2O2CO3 and use this information to interpret in situ high-energy resolution fluorescence-detected (HERFD) X-ray absorption near-edge structure (XANES) and valence-to-core X-ray emission spectroscopy (vtc XES). Compared with La(OH)3 or previously known hexagonal La2O2CO3 structures, La in the monoclinic unit cell has a much lower number of neighboring oxygen atoms, which is manifested in the whiteline broadening in XANES spectra. Such a superior sensitivity to subtle changes is given by HERFD method, which is essential for in situ studying of the interaction with CO2. Here, we study La2O2CO3-based sensors in real operando conditions at 250 °C in the presence of oxygen and water vapors. We identify that the distribution of unoccupied La d-states and occupied O p- and La d-states changes during CO2 chemoresistive sensing of La2O2CO3. The correlation between these spectroscopic findings with electrical resistance measurements leads to a more comprehensive understanding of the selective adsorption at La site and may enable the design of new materials for CO2 electrochemical applications.

scholarly journals Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution

2013 ◽  
Vol 19 (S2) ◽  
pp. 1258-1259 ◽  
Author(s):  
H. Takahashi ◽  
N. Handa ◽  
T. Murano ◽  
M. Terauchi ◽  
M. Koike ◽  
...  
Keyword(s):  
Energy Resolution ◽  
High Energy ◽  
Chemical State ◽  
High Energy Resolution ◽  
X Rays ◽  
X Ray

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

X‐ray fluorescence analysis with high energy resolution

1996 ◽  
Vol 67 (9) ◽  
pp. 3359-3359 ◽  
Author(s):  
Wolfgang A. Caliebe ◽  
Sas̆a Bajt ◽  
Chi‐Chang Kao
Keyword(s):  
Energy Resolution ◽  
Fluorescence Analysis ◽  
High Energy ◽  
High Energy Resolution ◽  
X Ray

High energy resolution PIXE spectroscopy at the J. Stefan Institute, Ljubljana

2014 ◽  
Vol 24 (03n04) ◽  
pp. 205-215
Author(s):  
M. Kavčič
Keyword(s):  
Trace Element ◽  
Energy Resolution ◽  
Trace Element Analysis ◽  
High Energy ◽  
Energy Dispersive ◽  
High Energy Resolution ◽  
Pixe Analysis ◽  
X Ray ◽  
Analytical Technique ◽  
Stefan Institute

While traditional proton induced X-ray emission (PIXE) analytical technique is based on the energy dispersive solid state detectors used to collect the X-ray fluorescence from the sample, wavelength dispersive X-ray (WDX) spectrometers are applied in high energy resolution PIXE (HR-PIXE) analysis. The main drawback of the WDX spectroscopy is the relatively low efficiency making it less applicable for trace element PIXE analysis. However, the efficiency was enhanced significantly in modern spectrometers employing cylindrically or even spherically curved crystals combined with position sensitive X-ray detectors. The energy resolution of such a spectrometer may exceed the resolution of the energy dispersive detector by two orders of magnitude while keeping the efficiency at a high enough level to perform trace element analysis. In this paper, the recent history and the development of HR-PIXE spectroscopy at the J. Stefan Institute in Ljubljana is presented. Our current setup based on in-vacuum Johansson-type crystal spectrometer is presented in more details followed by some most recent applications.

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