scholarly journals Heavy Ion Induced Single Event Effects Characterization on an RF-Agile Transceiver for Flexible Multi-Band Radio Systems in NewSpace Avionics

Aerospace ◽  
2020 ◽  
Vol 7 (2) ◽  
pp. 14
Author(s):  
Jan Budroweit ◽  
Mattis Jaksch ◽  
Rubén Garcia Alía ◽  
Andrea Coronetti ◽  
Alexander Kölpin
Keyword(s):  
Heavy Ion ◽  
Soft Error ◽  
Single Event ◽  
Test Procedures ◽  
Testing Procedures ◽  
Space Industry ◽  
Radiation Test ◽  
Radio Systems ◽  
Application Requirements

Nowadays, technologies have a massive impact on the design of avionic systems, even for the conservative space industry. In this paper, the single event effect (SEE) characterization of a highly integrated and radio frequency (RF) agile transceiver is being presented which is an outstanding candidate for future radio systems in NewSpace applications and space avionics. The device being investigated allows programmable re-configuration of RF specifications, where classical software-defined radios (SDR) only define an on-demand re-configuration of the signal processing. RF related configurations are untouched for common SDR and developed discretely by the specific application requirements. Due to the high integrity and complexity of the device under test (DUT), state-of-the-art radiation test procedures are not applicable and customized testing procedures need to be developed. The DUT shows a very robust response to linear energy transfer (LET) values up to 62.5 MeV.cm²/mg, without any destructives events and a moderate soft error rate.

INVESTIGATION OF NOISE CHARACTERIZATION OF COATED ROTORS

2020 ◽  
pp. 2050035
Author(s):  
ALİ ÖZ ◽  
ABDULLAH DEMİR
Keyword(s):  
The Other ◽  
Test Procedures ◽  
Testing Procedures ◽  
Light Commercial Vehicle ◽  
Brake Dynamometer ◽  
Brake Rotors ◽  
Noise Characterization ◽  
Brake Noise ◽  
Different Thickness

In this study, four excessive worn brake rotors of a light commercial vehicle are coated using different thickness, methods and powder coatings. Coated rotors ([Formula: see text], [Formula: see text], [Formula: see text] and [Formula: see text]) compared with OEM brake rotor ([Formula: see text]0) in terms of friction coefficient ([Formula: see text]) and braking noise. Three braking test procedures (bedding, hot judder I and II) are applied to five rotors using inertia brake dynamometer. Results in bedding testing procedures showed that [Formula: see text] rotor provided higher brake noise and higher [Formula: see text] compared with coated rotors. In hot judder I testing procedures, [Formula: see text] rotor provided higher [Formula: see text] and higher brake noi0se compared with the other coated rotors and [Formula: see text]. Also, in hot judder II testing procedures, [Formula: see text] rotor provided higher [Formula: see text] compared with the other rotors, [Formula: see text] provided higher brake noise compared with the other coated rotors. In addition, based on experimental data, noise levels are estimated by multiple regression method with dummy variables.

scholarly journals Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

2019 ◽  
Vol 16 (8) ◽  
pp. 20190141-20190141 ◽  
Author(s):  
Ruiqiang Song ◽  
Jinjin Shao ◽  
Bin Liang ◽  
Yaqing Chi ◽  
Jianjun Chen
Keyword(s):  
Heavy Ion ◽  
Single Event ◽  
Single Event Transient

Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam

2017 ◽  
Vol 64 (1) ◽  
pp. 119-124 ◽  
Author(s):  
Yaqing Chi ◽  
Ruiqiang Song ◽  
Shuting Shi ◽  
Biwei Liu ◽  
Li Cai ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Single Event ◽  
Single Event Transient ◽  
Pulse Broadening

Characterization of CMOS Structures (0.6 µm process) Submitted to HBM and COM ESD Stress Tests

1997 ◽  
Author(s):  
G. Meneghesso ◽  
E. Zanoni ◽  
P. Colombo ◽  
M. Brambilla ◽  
R. Annunziata ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Electrostatic Discharge ◽  
Stress Test ◽  
Complete Characterization ◽  
Stress Tests ◽  
Test Procedures ◽  
Emission Microscopy ◽  
Fast Rise ◽  
Scanning Electron

Abstract In this work, we present new results concerning electrostatic discharge (ESD) robustness of 0.6 μm CMOS structures. Devices have been tested according to both HBM and socketed CDM (sCDM) ESD test procedures. Test structures have been submitted to a complete characterization consisting in: 1) measurement of the tum-on time of the protection structures submitted to pulses with very fast rise times; 2) ESD stress test with the HBM and sCDM models; 3) failure analysis based on emission microscopy (EMMI) and Scanning Electron Microscopy (SEM).

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