scholarly journals Megavoltage Topographic Imaging

2020 ◽  
Author(s):  
Keyword(s):  
Topographic Imaging

High-Spatial-Resolution Topographic Imaging and Dimer Distance Analysis of Si(100)-(2×1) Using Noncontact Atomic Force Microscopy

2008 ◽  
Vol 47 (7) ◽  
pp. 6085-6087 ◽  
Author(s):  
Daisuke Sawada ◽  
Takashi Namikawa ◽  
Masuhiro Hiragaki ◽  
Yoshiaki Sugimoto ◽  
Masayuki Abe ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Spatial Resolution ◽  
High Spatial Resolution ◽  
Force Microscopy ◽  
Distance Analysis ◽  
Atomic Force ◽  
Topographic Imaging

High-Resolution Topographic Imaging of Environmentally Responsive, Elastin-Mimetic Hydrogels

1999 ◽  
Vol 32 (26) ◽  
pp. 9067-9070 ◽  
Author(s):  
R. Andrew McMillan ◽  
Kevin L. Caran ◽  
Robert P. Apkarian ◽  
Vincent P. Conticello
Keyword(s):  
High Resolution ◽  
Environmentally Responsive ◽  
Topographic Imaging

scholarly journals Combined optical and topographic imaging reveals different arrangements of human RAD54 with presynaptic and postsynaptic RAD51-DNA filaments

2013 ◽  
Vol 110 (28) ◽  
pp. 11385-11390 ◽  
Author(s):  
H. Sanchez ◽  
A. Kertokalio ◽  
S. van Rossum-Fikkert ◽  
R. Kanaar ◽  
C. Wyman
Keyword(s):  
Topographic Imaging

Design of a portable near infrared system for topographic imaging of the brain in babies

2004 ◽  
Vol 75 (10) ◽  
pp. 3276-3283 ◽  
Author(s):  
Tharshan Vaithianathan ◽  
Iain D. C. Tullis ◽  
Nicholas Everdell ◽  
Terence Leung ◽  
Adam Gibson ◽  
...  
Keyword(s):  
Near Infrared ◽  
Topographic Imaging ◽  
The Brain

Topographic imaging of mineral and collagen in the calcifying turkey tendon

1991 ◽  
Vol 25 (3-4) ◽  
pp. 181-196 ◽  
Author(s):  
William J. Landis ◽  
Janet Moradian-oldak ◽  
Stephen Weiner
Keyword(s):  
Topographic Imaging ◽  
Turkey Tendon

Investigation of Semiconductor Heterostructures by White Beam Synchrotron X-Ray Topography in Grazing Bragg-Laue and Conventional Bragg Geometries

1991 ◽  
Vol 35 (A) ◽  
pp. 247-253
Author(s):  
G.-D. Yao ◽  
J. Wu ◽  
T. Fanning ◽  
M. Dudley
Keyword(s):  
Penetration Depth ◽  
Grazing Incidence ◽  
Semiconductor Heterostructures ◽  
Misfit Dislocations ◽  
Strained Layers ◽  
X Ray ◽  
Main Reflection ◽  
White Beam ◽  
Topographic Imaging

AbstractWhite beam synchrotron X-ray topography has been applied both to the characterization of two semiconductor heterostructures, GaAs/Si and InxGa1-xAs/GaAs strained layers, and a substrate to be used for growing semiconductor epilayers, Cd1-xZnxTe. In the case of the heterostructures, misfit dislocations were observed using depth sensitive X-ray topographic imaging in grazing incidence Bragg-Laue geometries. The X-ray penetration depth, which can be varied from several hundreds of angstroms to hundreds of micrometers by rotating about the main reflection vector, which in this specific case was (355), is governed by kinernatical theory. This is justified by comparing dislocation contrast and visibility with the extent of the calculated effective misorientalion field in comparison to the effective X-ray penetration depth. For the case of Cd1-xZnxTe, twin configurations are observed, and their analysis is presented.

Synchrotron White Beam Topographic Imaging in Grazing Bragg-Laue Geometries

1990 ◽  
Vol 2 (3) ◽  
pp. 195-213 ◽  
Author(s):  
G.-D. Yao ◽  
M. Dudley ◽  
J. Wu
Keyword(s):  
White Beam ◽  
Topographic Imaging

scholarly journals Contrast Enhancement for Topographic Imaging in Confocal Laser Scanning Microscopy

2019 ◽  
Vol 9 (15) ◽  
pp. 3086
Author(s):  
Lena Schnitzler ◽  
Markus Finkeldey ◽  
Martin R. Hofmann ◽  
Nils C. Gerhardt
Keyword(s):  
Integrated Circuits ◽  
Contrast Enhancement ◽  
Laser Scanning ◽  
Simulated Data ◽  
Laser Scanning Microscopy ◽  
Confocal Laser ◽  
Low Contrast ◽  
Semiconductor Test ◽  
Contrast Structures ◽  
Topographic Imaging

The influence of the axial pinhole position in a confocal microscope in terms of the contrast of the image is analyzed. The pinhole displacement method is introduced which allows to increase the contrast for topographic imaging. To demonstrate this approach, the simulated data of a confocal setup as well as experimental data is shown. The simulated data is verified experimentally by a custom stage scanning reflective microscopy setup using a semiconductor test target with low contrast structures of sizes between 200 nm and 500 nm. With the introduced technique, we are able to achieve a contrast enhancement of up to 80% without loosing diffraction limited resolution. We do not add additional components to the setup, thus our concept is applicable for all types of confocal microscopes. Furthermore, we show the application of the contrast enhancement in imaging integrated circuits.

A circuit model for SECCM and topographic imaging method in AC mode

Micron ◽  
2019 ◽  
Vol 126 ◽  
pp. 102738 ◽  
Author(s):  
Jian Zhuang ◽  
Xiaobo Liao ◽  
Yalou Deng ◽  
Lei Cheng ◽  
Ali Akmal Zia ◽  
...  
Keyword(s):  
Circuit Model ◽  
Imaging Method ◽  
Topographic Imaging
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