Determination of retained austenite in multiphase steels by magnetic force microscopy

Aloisia Saiz Zens; Tamara Appel; Jose A. C. Broekaert; Frank Friedel

doi:10.3139/146.101353

Determination of retained austenite in multiphase steels by magnetic force microscopy

International Journal of Materials Research (formerly Zeitschrift fuer Metallkunde) ◽

10.3139/146.101353 ◽

2006 ◽

Vol 97 (8) ◽

pp. 1158-1162 ◽

Cited By ~ 1

Author(s):

Aloisia Saiz Zens ◽

Tamara Appel ◽

Jose A. C. Broekaert ◽

Frank Friedel

Keyword(s):

Retained Austenite ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Force Microscopy ◽

Multiphase Steels

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Quantitative determination of effective dipole and monopole moments of magnetic force microscopy tips

Journal of Applied Physics ◽

10.1063/1.371222 ◽

1999 ◽

Vol 86 (6) ◽

pp. 3410-3417 ◽

Cited By ~ 106

Author(s):

J. Lohau ◽

S. Kirsch ◽

A. Carl ◽

G. Dumpich ◽

E. F. Wassermann

Keyword(s):

Quantitative Determination ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Force Microscopy

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Determination of T[sub c], vortex creation and vortex imaging of a superconducting Nb film using low-temperature magnetic force microscopy

Journal of Applied Physics ◽

10.1063/1.1456055 ◽

2002 ◽

Vol 91 (10) ◽

pp. 8840 ◽

Cited By ~ 6

Author(s):

M. Roseman ◽

P. Grütter

Keyword(s):

Low Temperature ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Force Microscopy ◽

Vortex Imaging

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On the determination of the stray field structure by magnetic force microscopy (MFM)

10.1117/12.555374 ◽

2004 ◽

Author(s):

Teodor M. Breczko ◽

Miroslaw Bramowicz

Keyword(s):

Magnetic Force Microscopy ◽

Magnetic Force ◽

Field Structure ◽

Stray Field ◽

Force Microscopy

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On the determination of the internal magnetic structure by magnetic force microscopy

Journal of Magnetism and Magnetic Materials ◽

10.1016/s0304-8853(98)00280-7 ◽

1998 ◽

Vol 190 (1-2) ◽

pp. 148-151 ◽

Cited By ~ 25

Author(s):

Bas Vellekoop ◽

Leon Abelmann ◽

Steffen Porthun ◽

Cock Lodder

Keyword(s):

Magnetic Structure ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Force Microscopy

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Determination of radiation exposure history of common materials and computer hardware by using atomic (and magnetic force) microscopy

Applied Physics Letters ◽

10.1063/1.1565184 ◽

2003 ◽

Vol 82 (14) ◽

pp. 2236-2238 ◽

Cited By ~ 3

Author(s):

J. Sharma ◽

J. P. Teter ◽

R. J. Abbundi ◽

N. A. Guardala

Keyword(s):

Radiation Exposure ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Computer Hardware ◽

Force Microscopy ◽

History Of ◽

Exposure History

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Determination of the easy axes of small ferromagnetic precipitates in a bulk material by combined magnetic force microscopy and electron backscatter diffraction techniques

Ultramicroscopy ◽

10.1016/j.ultramic.2014.05.003 ◽

2014 ◽

Vol 146 ◽

pp. 17-26 ◽

Cited By ~ 7

Author(s):

L. Batista ◽

U. Rabe ◽

S. Hirsekorn

Keyword(s):

Magnetic Force Microscopy ◽

Magnetic Force ◽

Electron Backscatter Diffraction ◽

Bulk Material ◽

Force Microscopy ◽

Electron Backscatter ◽

Backscatter Diffraction

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Quantitative determination of the magnetization and stray field of a single domain Co/Pt dot with magnetic force microscopy

Applied Physics Letters ◽

10.1063/1.126534 ◽

2000 ◽

Vol 76 (21) ◽

pp. 3094-3096 ◽

Cited By ~ 31

Author(s):

J. Lohau ◽

S. Kirsch ◽

A. Carl ◽

E. F. Wassermann

Keyword(s):

Quantitative Determination ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Single Domain ◽

Stray Field ◽

Force Microscopy

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Determination of closure domain penetration in electrodeposited microtubes by combined magnetic force microscopy and giant magneto-impedance techniques

Journal of Applied Physics ◽

10.1063/1.1346998 ◽

2001 ◽

Vol 89 (7) ◽

pp. 3888-3891 ◽

Cited By ~ 14

Author(s):

J. M. Garcia ◽

A. Asenjo ◽

M. Vázquez ◽

A. M. Yakunin ◽

A. S. Antonov ◽

...

Keyword(s):

Magnetic Force Microscopy ◽

Magnetic Force ◽

Force Microscopy ◽

Closure Domain ◽

Giant Magneto Impedance

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Quantitative determination of the magnetization of proton irradiated spots in graphite with magnetic force microscopy

Journal of Applied Physics ◽

10.1063/1.1759396 ◽

2004 ◽

Vol 96 (3) ◽

pp. 1581-1584 ◽

Cited By ~ 9

Author(s):

K.-H. Han ◽

P. Esquinazi

Keyword(s):

Quantitative Determination ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Force Microscopy

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Study of MFM Application in Semiconductor Failure Analysis

ISTFA 2004: Conference Proceedings from the 30th International Symposium for Testing and Failure Analysis ◽

10.31399/asm.cp.istfa2004p0353 ◽

2004 ◽

Author(s):

Way-Jam Chen ◽

Lily Shiau ◽

Ming-Ching Huang ◽

Chia-Hsing Chao

Keyword(s):

Magnetic Field ◽

Failure Analysis ◽

Magnetic Force Microscopy ◽

Magnetic Force ◽

Current Flow ◽

Force Microscopy ◽

The Magnetic Field ◽

A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

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