Determination of radiation exposure history of common materials and computer hardware by using atomic (and magnetic force) microscopy

2003 ◽  
Vol 82 (14) ◽  
pp. 2236-2238 ◽  
Author(s):  
J. Sharma ◽  
J. P. Teter ◽  
R. J. Abbundi ◽  
N. A. Guardala
Keyword(s):  
Radiation Exposure ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Computer Hardware ◽  
Force Microscopy ◽  
History Of ◽  
Exposure History

Quantitative determination of effective dipole and monopole moments of magnetic force microscopy tips

1999 ◽  
Vol 86 (6) ◽  
pp. 3410-3417 ◽  
Author(s):  
J. Lohau ◽  
S. Kirsch ◽  
A. Carl ◽  
G. Dumpich ◽  
E. F. Wassermann
Keyword(s):  
Quantitative Determination ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

On the determination of the internal magnetic structure by magnetic force microscopy

1998 ◽  
Vol 190 (1-2) ◽  
pp. 148-151 ◽  
Author(s):  
Bas Vellekoop ◽  
Leon Abelmann ◽  
Steffen Porthun ◽  
Cock Lodder
Keyword(s):  
Magnetic Structure ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy

scholarly journals Determination of closure domain penetration in electrodeposited microtubes by combined magnetic force microscopy and giant magneto-impedance techniques

2001 ◽  
Vol 89 (7) ◽  
pp. 3888-3891 ◽  
Author(s):  
J. M. Garcia ◽  
A. Asenjo ◽  
M. Vázquez ◽  
A. M. Yakunin ◽  
A. S. Antonov ◽  
...  
Keyword(s):  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Force Microscopy ◽  
Closure Domain ◽  
Giant Magneto Impedance

Study of MFM Application in Semiconductor Failure Analysis

2004 ◽  
Author(s):  
Way-Jam Chen ◽  
Lily Shiau ◽  
Ming-Ching Huang ◽  
Chia-Hsing Chao
Keyword(s):  
Magnetic Field ◽  
Failure Analysis ◽  
Magnetic Force Microscopy ◽  
Magnetic Force ◽  
Current Flow ◽  
Force Microscopy ◽  
The Magnetic Field ◽  
A Current

Abstract In this study we have investigated the magnetic field associated with a current flowing in a circuit using Magnetic Force Microscopy (MFM). The technique is able to identify the magnetic field associated with a current flow and has potential for failure analysis.

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